Optical Engineering
VOL. 32 · NO. 1 | January 1993
CONTENTS
IN THIS ISSUE

Articles (31)
Articles
Opt. Eng. 32(1), (1 January 1993) https://doi.org/10.1117/12.147349
TOPICS: Optical engineering, Roads, Physics, Image processing, Telecommunications, Optics, Lead, Optoelectronics, Electrochemical etching, Microscopy
Opt. Eng. 32(1), (1 January 1993) https://doi.org/10.1117/12.147351
TOPICS: Physics, Electrical engineering, Mechanics, Optical engineering, Optical signal processing, Image processing, Doppler effect, Optical character recognition, Nonlinear optics, Chemical species
Opt. Eng. 32(1), (1 January 1993) https://doi.org/10.1117/12.60069
TOPICS: Speckle pattern, Motion measurement, Speckle, Televisions, Phase modulation, Liquid crystals, Time metrology, Calibration, Photography, Photomultipliers
Opt. Eng. 32(1), (1 January 1993) https://doi.org/10.1117/12.60070
TOPICS: Doppler effect, Velocity measurements, Blood circulation, Prisms, Laser Doppler velocimetry, Blood, Glasses, Particles, Light scattering, Scattering
Opt. Eng. 32(1), (1 January 1993) https://doi.org/10.1117/12.60065
TOPICS: Laser Doppler velocimetry, Fourier transforms, Signal processing, Liquid crystals, Doppler effect, Spectrum analysis, Imaging systems, Video, Computing systems, Diffraction
Opt. Eng. 32(1), (1 January 1993) https://doi.org/10.1117/12.60071
TOPICS: Spatial filters, Multiplexing, Feature extraction, Electronic filtering, Optical filters, Optical character recognition, Pattern recognition, Filtering (signal processing), Detection and tracking algorithms, Computer simulations
Opt. Eng. 32(1), (1 January 1993) https://doi.org/10.1117/12.60072
TOPICS: Optical character recognition, Cameras, Image processing, Molybdenum, Neural networks, Information visualization, Optical filters, Visual process modeling, Visualization, Eye
Opt. Eng. 32(1), (1 January 1993) https://doi.org/10.1117/12.60859
TOPICS: Argon, Spectroscopy, Chemical species, Noble gases, Xenon, Protactinium, Particles, Electron beams, Polonium, Ions
Opt. Eng. 32(1), (1 January 1993) https://doi.org/10.1117/12.60073
TOPICS: Free electron lasers, Magnetism, Electron beams, Energy transfer, Erbium, 3D modeling, Motion models, Electroluminescence, Signal processing, Mathematical modeling
Opt. Eng. 32(1), (1 January 1993) https://doi.org/10.1117/12.60074
TOPICS: Plasmas, X-rays, Pulsed laser operation, Ions, Plasma, X-ray lasers, Copper, Spectroscopy, Picosecond phenomena, Diagnostics
Opt. Eng. 32(1), (1 January 1993) https://doi.org/10.1117/12.60973
TOPICS: Interference filters, Nonlinear filtering, Nonlinear optics, Bistability, Coating, Refractive index, Optical components, Thin films, Mathematical modeling, Optical design
Opt. Eng. 32(1), (1 January 1993) https://doi.org/10.1117/12.60076
TOPICS: Magnetism, Polarization, Chemical species, Zeeman effect, Uranium, Laser induced fluorescence, Luminescence, Absorption, Fluorescence spectroscopy, Mercury
Opt. Eng. 32(1), (1 January 1993) https://doi.org/10.1117/12.60077
TOPICS: Photons, Chemical species, Radon, Radiation effects, Absorption, Microwave radiation, Quantum physics, Physics, Optical engineering, Multiphoton processes
Opt. Eng. 32(1), (1 January 1993) https://doi.org/10.1117/12.60078
TOPICS: Matrix multiplication, Matrices, Holography, Computing systems, Optical computing, Optical matrix switches, Geometrical optics, Lenses, Active optics, Imaging systems
Opt. Eng. 32(1), (1 January 1993) https://doi.org/10.1117/12.60079
TOPICS: Spatial light modulators, Neural networks, Holography, Optical interconnects, Neurons, Matrices, Optical components, Frame grabbers, Binary data, Content addressable memory
Opt. Eng. 32(1), (1 January 1993) https://doi.org/10.1117/12.60080
TOPICS: Refractive index, Differential equations, Computer simulations, Interfaces, Reflection, Systems modeling, Human-machine interfaces, Multilayers, Fourier transforms, Refraction
Opt. Eng. 32(1), (1 January 1993) https://doi.org/10.1117/12.60081
TOPICS: Collimation, Fringe analysis, Moire patterns, Interferometry, Diffraction gratings, Shearing interferometers, Optical testing, Polishing, Physics, Laser interferometry
Opt. Eng. 32(1), (1 January 1993) https://doi.org/10.1117/12.60082
TOPICS: Waveguides, Annealing, Dispersion, Refractive index, Fabrication, Lithium niobate, Diffusion, Integrated optics, Photodetectors, Prisms
Opt. Eng. 32(1), (1 January 1993) https://doi.org/10.1117/12.60083
TOPICS: Moire patterns, LCDs, Fringe analysis, Phase shifting, Interferometry, Visualization, Projection systems, Binary data, Image enhancement, Vibrometry
Opt. Eng. 32(1), (1 January 1993) https://doi.org/10.1117/12.60084
TOPICS: Content addressable memory, Fourier transforms, Ferroelectric materials, Crystals, Laser crystals, Optical filters, Spatial filters, Computing systems, Phase conjugation, Beam splitters
Opt. Eng. 32(1), (1 January 1993) https://doi.org/10.1117/12.60085
TOPICS: Mirrors, Phase conjugation, Backscatter, Wave propagation, Laser beam propagation, Nickel, Optical amplifiers, Turbulence, Polonium, Molecules
Opt. Eng. 32(1), (1 January 1993) https://doi.org/10.1117/12.60086
TOPICS: Diodes, Switches, Circuit switching, Device simulation, Resistance, Instrument modeling, Performance modeling, Modeling and simulation, Resistors, CCD cameras
Opt. Eng. 32(1), (1 January 1993) https://doi.org/10.1117/12.60087
TOPICS: Calibration, Cameras, Distortion, Error analysis, 3D image processing, 3D metrology, Computer simulations, 3D modeling, 3D vision, Composites
Opt. Eng. 32(1), (1 January 1993) https://doi.org/10.1117/12.60088
TOPICS: Image encryption, Quantization, Linear filtering, Forward error correction, Image compression, Image processing, Signal processing, Computer security, Binary data, Interference (communication)
Opt. Eng. 32(1), (1 January 1993) https://doi.org/10.1117/12.60919
Opt. Eng. 32(1), (1 January 1993) https://doi.org/10.1117/12.60917
TOPICS: Matrices, Convolution, Digital imaging, Data modeling, Image processing, Point spread functions, Matrix multiplication, Signal processing, Error analysis, Numerical analysis
Opt. Eng. 32(1), (1 January 1993) https://doi.org/10.1117/12.60918
TOPICS: Charge-coupled devices, Fringe analysis, Sensors, Interferometers, Fabry–Perot interferometers, Interference (communication), Smoothing, Error analysis, CCD cameras, CCD image sensors
Opt. Eng. 32(1), (1 January 1993) https://doi.org/10.1117/12.60916
TOPICS: Mirrors, Reflectivity, Silicon, Optical filters, Tellurium, Image filtering, Magnetosphere, Multilayers, Absorption, Silicon carbide
Opt. Eng. 32(1), (1 January 1993) https://doi.org/10.1117/12.60920
TOPICS: Interferometers, Holographic interferometry, Phase shifts, Holographic interferometers, Phase interferometry, Interferometry, Mirrors, Stress analysis, Optical engineering, Wavefronts
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