optical engineering
VOL. 32 · NO. 3 | March 1993

Articles (33)
Brian Thompson
Opt. Eng. 32(3), (1 March 1993) https://doi.org/10.1117/12.147368
TOPICS: Optical engineering, Adaptive optics, Physics, Telecommunications, Optics, Roads, Infrared radiation, Photonics, Optoelectronics, Electrochemical etching
Vladimir Aksinin, Sergue Chetkin, Vadim Kijko, Sergue Muraviev
Opt. Eng. 32(3), (1 March 1993) https://doi.org/10.1117/12.61040
TOPICS: Actuators, Mirrors, Magnetism, Magnetostrictive materials, Control systems, Adaptive optics, Optical components, Light emitting diodes, Physics, Ferromagnetics
Hoi Cheong Sun, Edward Whittaker
Opt. Eng. 32(3), (1 March 1993) https://doi.org/10.1117/12.61034
TOPICS: Modulation, Absorption, Semiconductor lasers, Absorbance, Frequency modulation, Spectroscopy, Plasma etching, Plasma, Fermium, Optical amplifiers
Deborah Robinson, Chien-Chung Chen, Hamid Hemmati
Opt. Eng. 32(3), (1 March 1993) https://doi.org/10.1117/12.61044
TOPICS: Modulators, Phase shifts, Reflectivity, Crystals, Modulation, Electro optics, Phase shift keying, Mirrors, Chlorine, Phase modulation
Charles Eldering, Andrew Dienes, Stephen Kowel
Opt. Eng. 32(3), (1 March 1993) https://doi.org/10.1117/12.61057
TOPICS: Fabry–Perot interferometers, Mirrors, Electro optic polymers, Reflectivity, Ultrafast phenomena, Polymers, Electro optics, Picosecond phenomena, Reflection, Transmittance
Thomas Burns, Steven Rogers, George Vogel
Opt. Eng. 32(3), (1 March 1993) https://doi.org/10.1117/12.61204
TOPICS: Content addressable memory, Resonators, Crystals, Confocal microscopy, Chlorine, Laser crystals, Signal attenuation, Mirrors, Holography, Holograms
Paul Ruffin, Chi Sung
Opt. Eng. 32(3), (1 March 1993) https://doi.org/10.1117/12.61036
TOPICS: Optical fibers, Coating, Polarization maintaining fibers, Polarization, Phase modulation, Temperature metrology, Refraction, Sensors, Fiber optic gyroscopes, Magnetism
Inmaculada Sanz, Miguel Muriel
Opt. Eng. 32(3), (1 March 1993) https://doi.org/10.1117/12.60854
TOPICS: Phase shifts, Dispersion, Optical filters, Code division multiplexing, Computer programming, Ultrafast phenomena, Electronic filtering, Waveguides, Stereolithography, Receivers
Paolo Cielo, Jean-Claude Krapez, M. Lamontagne, J. Thomson, Michael Lamb
Opt. Eng. 32(3), (1 March 1993) https://doi.org/10.1117/12.60857
TOPICS: Sensors, Pyrometry, Temperature metrology, Reflectors, Fiber optics sensors, Metals, Infrared radiation, Reflectivity, Reflection, Black bodies
Henry Haslach, Kristina Whipple
Opt. Eng. 32(3), (1 March 1993) https://doi.org/10.1117/12.61039
TOPICS: Optical fibers, Coating, Sensors, Silicon carbide, Silicon, Interferometry, Aluminum, Fiber optics sensors, Interfaces, Glasses
Douglas Ferrell, Jeremy Lerner, Robert Lieberman, Toni Quintana, Edward Schmidlin, Steven Syracuse
Opt. Eng. 32(3), (1 March 1993) https://doi.org/10.1117/12.60858
TOPICS: Fiber optics sensors, Fiber optics, Chemical fiber sensors, Raman spectroscopy, Optical fibers, Nonimaging optics, Spectroscopy, Fiber couplers, Luminescence, Fiber coupled lasers
Nils Abramson
Opt. Eng. 32(3), (1 March 1993) https://doi.org/10.1117/12.60855
TOPICS: Holography, Holograms, Mirrors, Wavefronts, Moire patterns, Light, Diffraction, Spherical lenses, Holographic interferometry, Interferometry
Bing Zheng, Zheng Chen
Opt. Eng. 32(3), (1 March 1993) https://doi.org/10.1117/12.61048
TOPICS: Waveguides, Wavelength division multiplexing, Modulation, Wave propagation, Aluminum, Microscopes, Optical fibers, Glasses, Single mode fibers, Refractive index
Aris Tanone, Zheng Zhang, Chii-Maw Uang, Francis Yu, Don Gregory
Opt. Eng. 32(3), (1 March 1993) https://doi.org/10.1117/12.61038
TOPICS: Computer generated holography, Phase modulation, Liquid crystals, Phase shift keying, Modulation, Televisions, Quantization, Diffraction, Holograms, Wavefronts
Satoshi Kishimoto, Mitsuru Egashira, Norio Shinya
Opt. Eng. 32(3), (1 March 1993) https://doi.org/10.1117/12.61046
TOPICS: Moire patterns, Scanning electron microscopy, Electron beams, Copper, Fringe analysis, Electron beam lithography, Metals, Electron microscopes, Process modeling, Gold
Opt. Eng. 32(3), (1 March 1993) https://doi.org/10.1117/12.61215
TOPICS: Tolerancing, Optical imaging, Lithography, Photomasks, Optical lithography, Image resolution, Projection systems, Imaging systems, Vibration simulation, Chromium
Jong-Tae Kim, Hong-Jin Kong, Sang-Soo Lee
Opt. Eng. 32(3), (1 March 1993) https://doi.org/10.1117/12.61056
TOPICS: Monochromatic aberrations, Mirrors, Lithography, Distortion, Deep ultraviolet, Excimer lasers, Spherical lenses, Chlorine, Numerical analysis, Chromatic aberrations
Opt. Eng. 32(3), (1 March 1993) https://doi.org/10.1117/12.61221
TOPICS: Reflectivity, Modulation, Plasma, Transistors, Infrared radiation, Sensors, Semiconductors, Switches, Infrared detectors, Modulators
Karl Guenther, Iain Penny, Ronald Willey
Opt. Eng. 32(3), (1 March 1993) https://doi.org/10.1117/12.60845
TOPICS: Aluminum, Mirrors, Dielectrics, Ions, Silicon, Thin film coatings, Electron beams, Thin films, Plating, Plasma
Sohrab Zarrabian, Austin Grogan, X. Hu, C. Lee, Karl Guenther
Opt. Eng. 32(3), (1 March 1993) https://doi.org/10.1117/12.60847
TOPICS: Oxygen, Nitrogen, Absorption, Tantalum, Thin films, Oxides, Plasma, Ions, Metals, Oxidation
Opt. Eng. 32(3), (1 March 1993) https://doi.org/10.1117/12.61203
TOPICS: Image filtering, Signal to noise ratio, Distortion, Binary data, Optical filters, Chlorine, Phase only filters, Image processing, Spatial light modulators, Optimal filtering
Opt. Eng. 32(3), (1 March 1993) https://doi.org/10.1117/12.61045
TOPICS: Standards development, Calibration, Magnetism, Refractive index, Zeeman effect, Atomic clocks, Luminescence, Heterodyning, Absorption, Optical testing
Xuefeng Yue, Zongshu Shao, Jun Chen, Qiang Song, Daliang Sun, Quanzhong Jiang, Yongyuan Song, Huanchu Chen
Opt. Eng. 32(3), (1 March 1993) https://doi.org/10.1117/12.61055
TOPICS: Crystals, Phase conjugation, Laser crystals, Reflectivity, Barium, Strontium, Electro optics, Two wave mixing, Ferroelectric materials, Potassium
Yaoling Pan, Yun Wang
Opt. Eng. 32(3), (1 March 1993) https://doi.org/10.1117/12.61037
TOPICS: Absorption, Oxygen, Tantalum, Silicon, Annealing, Chemical species, Optical properties, Silicon films, Thin films, Low pressure chemical vapor deposition
Diana Tentori-Santa-Cruz, Carlos Famozo
Opt. Eng. 32(3), (1 March 1993) https://doi.org/10.1117/12.61047
TOPICS: Prisms, Refractive index, Transmittance, Tolerancing, Interfaces, Refractometry, Error analysis, Polishing, Liquids, Solids
Zhaoxian Zhang
Opt. Eng. 32(3), (1 March 1993) https://doi.org/10.1117/12.60846
TOPICS: Carbon dioxide, Satellites, Earth's atmosphere, Transmittance, Troposphere, Stratosphere, Atmospheric optics, Absorption, Meteorological satellites, Computer simulations
Henry Yuan, Fei Ming Tong, Dingyuan Tang
Opt. Eng. 32(3), (1 March 1993) https://doi.org/10.1117/12.61042
TOPICS: Interfaces, Zinc, Mercury cadmium telluride, Dielectrics, Photodiodes, Surface finishing, Metals, Semiconductors, Bromine, Crystals
Edward Toughlian, Henry Zmuda
Opt. Eng. 32(3), (1 March 1993) https://doi.org/10.1117/12.61059
TOPICS: Phased arrays, Digital filtering, Mirrors, Antennas, Filtering (signal processing), Signal processing, Phased array optics, Modulation, Optical filters, Adaptive optics
Ichirou Yamaguchi, Tamiki Takemori, Koichi Kobayashi
Opt. Eng. 32(3), (1 March 1993) https://doi.org/10.1117/12.61043
TOPICS: Speckle, Image sensors, Sensors, Optical correlators, Polymers, Polymer thin films, Correlation function, Speckle pattern, Polymeric sensors, Semiconductor lasers
Opt. Eng. 32(3), (1 March 1993) https://doi.org/10.1117/12.61033
TOPICS: Photons, Spatial resolution, Scattering, Streak cameras, Picosecond phenomena, Transmittance, Light scattering, Cameras, Diagnostics, Temporal resolution
Yukio Yamada, Yasuo Hasegawa, Hiroshi Maki
Opt. Eng. 32(3), (1 March 1993) https://doi.org/10.1117/12.61035
TOPICS: Scattering, Absorption, Computed tomography, Absorbance, Light scattering, Optical imaging, Monte Carlo methods, Picosecond phenomena, Sensors, Optical computing
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