Growth of bismuth silicon oxide and bismuth germanium oxide crystals by the Czochralski technique and their characterization

R. Gopalakrishnan; D. Krishnamurthy; Dakshanamoorthy Arivuoli; P. Ramasamy

doi:10.1117/12.61287

1 April 1993 Growth of bismuth silicon oxide and bismuth germanium oxide crystals by the Czochralski technique and their characterization

R. Gopalakrishnan, D. Krishnamurthy, Dakshanamoorthy Arivuoli, P. Ramasamy

Author Affiliations +

Optical Engineering, Vol. 32, Issue 4, (April 1993). https://doi.org/10.1117/12.61287

Abstract

Photorefractive single crystals of bismuth silicon oxide (Bii2SiO2o) and bismuth germanium oxide (Bi12GeO2o) have been grown using the Czochralski technique. The experimental results are explained with the existing theoretical models. The grown crystals are characterized by x-ray, differential thermal analysis, scanning electron microscopy, IR transmission spectrum, and electron-probe microanalysis.

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R. Gopalakrishnan, D. Krishnamurthy, Dakshanamoorthy Arivuoli, and P. Ramasamy "Growth of bismuth silicon oxide and bismuth germanium oxide crystals by the Czochralski technique and their characterization," Optical Engineering 32(4), (1 April 1993). https://doi.org/10.1117/12.61287

Published: 1 April 1993

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