optical engineering
VOL. 32 · NO. 8 | August 1993
CONTENTS
IN THIS ISSUE

Articles (46)
Articles (1)
Articles
Brian Thompson
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.158335
TOPICS: Lens design, Optical engineering, Roads, Physics, Computing systems, Optical design, Wavefronts, Large telescopes, Display technology, Optics
Arthur Cox
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.158336
TOPICS: Lens design, Optical engineering, Roads, Physics, Display technology, Optics, Software, Geometrical optics, Wavefronts, Zoom lenses
Robert Hopkins
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.145116
TOPICS: Optical design, Ray tracing, Optics manufacturing, Lens design, Optical engineering, Geometrical optics, Design for manufacturability, Optical fabrication, Computing systems, Electro-optical engineering
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.145078
TOPICS: Lens design, Ray tracing, Computing systems, Software, Optical design, Optical engineering, Image quality, Image analysis, Monochromatic aberrations, Active optics
Douglas Sinclair
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.145081
TOPICS: Lens design, Optical design, Tolerancing, Optical engineering, Image quality, Optics manufacturing, Optical design software, Computer programming, Laser applications, Roads
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.145115
TOPICS: Lens design, Optical design, Software, Ray tracing, Zoom lenses, Error analysis, Optical engineering, Etching, Microscopes, Objectives
Michael Kidger
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.145076
TOPICS: Lens design, Computing systems, Ray tracing, Modulation transfer functions, Visualization, Thin films, Monochromatic aberrations, Reflectivity, Optimization (mathematics), Aspheric lenses
Walter Woeltche
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.145082
TOPICS: Lens design, Zoom lenses, Optical design, Patents, Monochromatic aberrations, Image quality, Cameras, Chemical elements, Computing systems, Photographic lenses
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.145079
TOPICS: Lens design, Chemical elements, Genetic algorithms, Gaussian optics, Zoom lenses, Optical design, Modulation transfer functions, Glasses, Aspheric lenses, Optimization (mathematics)
Hua-Sou Tong
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.143971
TOPICS: CRTs, Electron beams, Televisions, Photomasks, Coating, Magnetism, LCDs, Etching, Glasses, Standards development
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.143973
TOPICS: LCDs, Liquid crystals, Polarizers, 3D displays, Molecules, Electrodes, Computer simulations, Chromium, Reflectivity, Display technology
Jia-Shyong Cheng, Tai-Kang Wu, Chia-Wei Hao, Ting-Chiang Hsieh, Yuh-Ga Gong, Hsiung-Kuang Chen
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.143978
TOPICS: LCDs, Transmittance, Liquid crystals, Computer simulations, Polarizers, Birefringence, Cell mechanics, Visible radiation, Display technology, Televisions
Shin-Tson Wu, ChiungSheng Wu, Marc Warenghem, M. Ismaili
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.143988
TOPICS: Chlorine, Refractive index, Liquid crystals, Electrons, Birefringence, Absorption, LCDs, Oscillators, Molecules, Anisotropy
Kuniharu Takizawa, Hiroshi Kikuchi, Hideo Fujikake, Y. Namikawa, K. Tada
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.143972
TOPICS: Liquid crystals, Polymers, Transmittance, Crystals, LCDs, Modulation, Glasses, Spatial light modulators, Absorption, Light scattering
Shin-Tson Wu, Chain-Shu Hsu, Yee-Nan Chen, Show-Ru Wang, Shu-Hua Lung
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.143977
TOPICS: Dielectrics, Liquid crystals, Anisotropy, Birefringence, LCDs, Refractive index, Thulium, Binary data, Polymers, Polarizability
Huang-Chung Cheng, Ya-Hsiang Tai, Ming Shiann Feng, Jau-Jey Wang
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.143982
TOPICS: Oxides, Silicon, Dielectrics, Interfaces, Transistors, Low pressure chemical vapor deposition, Silicon films, LCDs, Electrons, Arsenic
Chin-Tsar Hsu, Yan-Kuin Su, Meiso Yokoyama
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.143991
TOPICS: Interfaces, Dielectrics, Electroluminescence, Thin films, Sputter deposition, Thin film devices, Luminous efficiency, Ferroelectric materials, LCDs, Capacitors
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.145600
TOPICS: Microscopes, Skin, Tissues, Absorbance, Luminescence, Spectral resolution, Biomedical optics, Sensors, Transmittance, Optical fibers
Hua Zeng, Tao Zhang, Jingyi Li, Fengxiang Bai, Lurong Guo, Bing Peng
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.143339
TOPICS: Optimization (mathematics), Reflectivity, Computer programming, Physics, Detection and tracking algorithms, Lithium, Optical engineering, Lutetium, Algorithms, Absorption
Louis Brun, Patrick Bergeron, Michel Duguay, Francois Ouellette, Michel Tetu
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.145329
TOPICS: Optical fibers, Fusion splicing, Cladding, Optical alignment, Micropositioners, Optical testing, Image fusion, Fiber lasers, Helium neon lasers, Photomultipliers
Daoning Su, Denis Hall, Julian Jones
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.143710
TOPICS: Beam delivery, Cladding, Fiber optics, Fiber lasers, Optical fibers, Laser processing, Photodiodes, Sensing systems, Nd:YAG lasers, Laser optics
James Heaney, Scott Bradley, Vincent Bly, Audrey Ewin, Anh La
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.143302
TOPICS: Transmittance, Optical filters, Sensors, Detector arrays, Reflectivity, Linear filtering, Spectrophotometry, Spectroscopy, Antireflective coatings, Optical design
Jens Hossfeld, Dorit Columbus, Hartmut Sprave, Theo Tschudi, Wolfgang Dultz
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.143304
TOPICS: Polarization, Holograms, Computer generated holography, Refractive index, Holographic materials, Optical components, Binary data, Light scattering, Scattering, Diffraction
Uhsock Rhee, H. John Caulfield, Joseph Shamir, Chandra Vikram, Mir Mirsalehi
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.145348
TOPICS: Holograms, Holography, Diffraction, Modulation, Refractive index, Multiplexing, Fourier transforms, Diffraction gratings, Volume holography, Polymerization
Mostafa Bassiouni, Nicolaos Tzannes, Marcos Tzannes
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.145390
TOPICS: Image compression, Rhodium, Image quality standards, Computer programming, Reconstruction algorithms, Data modeling, Photography, Data storage, Quantization, Computer science
David Perry, Eustace Dereniak
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.145601
TOPICS: Sensors, Infrared sensors, Calibration, Infrared imaging, Platinum, Staring arrays, Quantum efficiency, Nonuniformity corrections, Infrared radiation, Photodiodes
Helmut Haidner, Peter Kipfer, John Sheridan, Johannes Schwider, Norbert Streibl, Juergen Lindolf, Martin Collischon, Anette Lang, Joachim Hutfless
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.143341
TOPICS: Diffraction, Diffraction gratings, Beam splitters, Polarization, Silicon, Reflection, Semiconducting wafers, Photoresist materials, Refractive index, Metals
JingJuan Zhang, Chao Xu, Shiping Gao
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.143723
TOPICS: Optical interconnects, Reactive ion etching, Etching, Photomasks, Detector arrays, Free space optics, Energy efficiency, Computer generated holography, Helium neon lasers, Transmittance
Jose Sasian, Frederick McCormick, Robert Webb, Randall Crisci, Keith Mersereau, Robert Stawicki
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.147150
TOPICS: Objectives, Monochromatic aberrations, Tolerancing, Manufacturing, Lens design, Switching, Distortion, Glasses, Wavefronts, Photonics systems
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.143338
TOPICS: Fiber optics, Interferometers, Signal detection, Modulators, Silicon, Michelson interferometers, Reflectivity, Calibration, Feedback loops, Heterodyning
Johannes Schwider, Oliver Falkenstoerfer, Horst Schreiber, Andreas Zoeller, Norbert Streibl
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.143340
TOPICS: Interferometry, Phase interferometry, Phase measurement, Interferometers, Information technology, Phase shifts, Error analysis, Glasses, Optical engineering, Algorithms
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.145602
TOPICS: Signal to noise ratio, Polarizers, Optical filters, Image filtering, Binary data, Phase only filters, Spatial light modulators, Optimal filtering, Polarization, Transmittance
Klaus Richter, Chang-ho Chen, Chang-Lin Tien
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.147152
TOPICS: Reflectivity, Thin films, Multilayers, Interfaces, Geometrical optics, Optical properties, Reflection, Coherence (optics), FT-IR spectroscopy, Transmittance
Philippe Lalanne, Jean-Claude Rodier, Pierre Chavel, Eric Belhaire, Patrick Garda
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.143305
TOPICS: Neurons, Algorithms, Speckle pattern, Photodiodes, Speckle, Stochastic processes, Cavitation, Binary data, Optical components, Diffusers
Satwinderpal Makkad, Joel Fox
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.143301
TOPICS: Cameras, Point spread functions, Mirrors, Raster graphics, Deconvolution, Fourier transforms, Imaging systems, Image processing, Camera shutters, Error analysis
Jonathan Whitlock, Paul Panayotatos, Genesh Sharma, Mary Cox, Ronald Sauers, George Bird
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.143713
TOPICS: Excitons, Absorption, Solar cells, Quantum efficiency, Heterojunctions, Molecules, Crystals, Capacitance, Interfaces, Doping
Kevin Donohue, Mohammad Rahmati, Laurence Hassebrook, P. Gopalakrishnan
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.143717
TOPICS: Speckle, Edge detection, Sensors, Tissues, Statistical analysis, Ultrasonics, Image processing, Breast, Error analysis, Binary data
Weiming Cheng, Mingyi Chen
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.143720
TOPICS: Wavefronts, Optical testing, Computer simulations, Mathematical modeling, Interferometers, Metrology, Error analysis, Optical engineering, Optical fabrication, 3D vision
Donald Vandenberg, William Humbel, Alan Wertheimer
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.145355
TOPICS: Interferometers, Sensors, Interferometry, Mirrors, Monochromatic aberrations, Optical testing, Spherical lenses, Chromatic aberrations, Optical spheres, Detector arrays
Robert Galloway, Charles Edwards, Judith Lewis, Robert Maciunas
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.143712
TOPICS: Surgery, Visualization, Tomography, Image visualization, Head, Ultrasonography, Image display, Computed tomography, Medical imaging, 3D image processing
Jianqiang Zhu, Shaohe Chen, Tao-Lue Chen, Youming Chen, Xiaodong Guo, Ximing Deng
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.143711
TOPICS: Gallium arsenide, Absorption, Q switching, Pulse shaping, Electrons, Chlorine, Pulsed laser operation, Numerical analysis, Semiconductor lasers, Semiconductors
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.145389
TOPICS: Particles, Ultrasonics, Image processing, Ultrasonography, Statistical analysis, Binary data, Acoustics, Scattering, Imaging systems, Image segmentation
Malcolm Howells, David Lunt
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.146391
TOPICS: Mirrors, X-rays, Synchrotron radiation, Distortion, Metals, Beam shaping, Polishing, Grazing incidence, Surface finishing, Tolerancing
Robert Austin, Brian Ramsey
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.147148
TOPICS: X-rays, Optical imaging, Polarization, Sensors, X-ray astronomy, CCD cameras, Argon, Ionization, Modulation, Particles
Alfred Margaryan, WaiMin Liu
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.145344
TOPICS: Glasses, Germanium, Metals, Refractive index, Quartz, Metalloids, Oxides, Absorption, Oxygen, Optical communications
Akhlesh Lakhtakia, Chandra Vikram
Opt. Eng. 32(8), (1 August 1993) doi:10.1117/12.146436
TOPICS: Refractive index, Composites, Glasses, Germanium, Magnesium, Electromyography, Absorption, Waveguides, Vitreous, Crystals
Stephen Chinn
Opt. Eng. 32(8), (1 August 1993) doi:
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