optical engineering
VOL. 33 · NO. 4 | April 1994

Articles (51)
Articles (1)
Brian Thompson
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.181720
TOPICS: Optical engineering, Physics, Optics, Roads, Data processing, Semiconductors, Infrared detectors, Optical interconnects, Packaging, Lanthanum
Wayland Marlow
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.163121
TOPICS: Actuators, Deformable mirrors, Chemical elements, Mirrors, Semiconducting wafers, Motion models, Wave propagation, Capacitance, Motion measurement, Maxwell's equations
Hsing-Yi Chen, Chin-Chyang Fang, Hou-Hwa Wang
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.163107
TOPICS: Atmospheric particles, Aerosols, Finite-difference time-domain method, Zinc, Atmospheric modeling, Chlorine, Refractive index, Infrared radiation, Information operations, Scattering
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.166932
TOPICS: Waveguides, Wave propagation, Waveguide modes, Single mode fibers, Ray tracing, Geometrical optics, Optical engineering, Integrated optics, Refractive index, Electrical engineering
Joseph Braat, Michel Laurijs
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.163187
TOPICS: Waveguides, Optical design, Ray tracing, Monochromatic aberrations, Wavefronts, Geometrical optics, Free space optics, Diffraction, Spatial frequencies, Tolerancing
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.163120
TOPICS: Optical filters, Bistability, Directional couplers, Sensors, Tunable filters, Photodetectors, Integrated optics, Optical circuits, Switching, Switches
Yu Hong Ja, Xianda Dai
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.163159
TOPICS: Fiber couplers, Resonators, Optical fibers, Polarization, Optical filters, Single mode fibers, Head, Laser resonators, Birefringence, Modulation
Colin Soutar, Stanley Monroe, Jerome Knopp
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.163142
TOPICS: Video, Modulators, Optical correlators, Liquid crystals, Polarizers, Modulation, Phase shifts, Transmittance, Televisions, Phase measurement
Yukitoshi Otani, Toru Yoshizawa, Atsushi Tanahashi
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.163194
TOPICS: Magnetism, Birefringence, Sensors, Magnetic sensors, Heterodyning, Optical testing, Fiber optics sensors, Optical isolators, Temperature metrology, Signal detection
Ahmed Bouzid, Mustafa Abushagur, Zhijian He, Susan Kosten
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.163104
TOPICS: Sensors, Fiber optics sensors, Polarimetry, Fiber optics, Optical fibers, Interferometers, Interferometry, Polarization, Lead, Rockets
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.163198
TOPICS: Mirrors, Holography, Diffraction, Diffraction gratings, Sensors, Holographic interferometry, Interferometry, Interferometers, Turbulence, Moire patterns
Stephen Wadle, Roderic Lakes
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.163161
TOPICS: Diffusers, Polarization, Optical isolators, Glasses, Diffusion, Holographic optical elements, Polarizers, Transmittance, Reflectivity, Holography
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.160948
TOPICS: Holography, Lenses, Spherical lenses, Wave plates, Optics manufacturing, Microlens array, Microlens, Cameras, Optical interconnects, Neural networks
Michael Magee, Richard Weniger, Ernest Franke
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.163139
TOPICS: Cameras, Imaging systems, 3D image processing, Refraction, Reflectivity, Laser systems engineering, Image processing, Mathematics, Calibration, Computing systems
Zella Kahn-Jetter, Nand Jha, Harmeet Bhatia
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.166931
TOPICS: Experimental mechanics, Cameras, Digital image correlation, Image processing, Speckle pattern, Digital imaging, Correlation function, Optimization (mathematics), Algorithm development, 3D image processing
Jacek Galas, Marek Daszkiewicz, Andrzej Sawicki, Krzysztof Godwod, Jacek Szawdyn
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.163160
TOPICS: Bone, Image processing, X-rays, X-ray imaging, Image analysis, Feature extraction, Diagnostics, Statistical analysis, Image classification, Digital imaging
Frank Kantrowitz, Wendell Watkins
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.163203
TOPICS: Sensors, Target detection, Imaging systems, Atmospheric sensing, Atmospheric propagation, Infrared imaging, Signal to noise ratio, Doping, Near field, Earth's atmosphere
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.165152
TOPICS: Stars, Cameras, Charge-coupled devices, CCD cameras, Calibration, Observatories, Telescopes, Detection and tracking algorithms, Algorithm development, Onboard cameras
F. Wang, Greg May, Albert Kobayashi
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.166937
TOPICS: Diffraction gratings, Deflectometry, Diffraction, Moire patterns, Wavefronts, Spatial frequencies, Fringe analysis, Far-field diffraction, Optical engineering, Coating
Qiang Huang, John Gilbert, H. John Caulfield
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.163188
TOPICS: Waveguides, Holograms, Holography, Wavefronts, Holographic interferometry, Fringe analysis, Silver, Image processing, Prisms, Interferometry
Zhenhua Li, Qikang Fan, Fuzheng Zhou, Jianwei Ma, Qiang Xue
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.163178
TOPICS: Semiconductor lasers, Q switched lasers, Crystals, Q switching, Q switches, Solids, Laser crystals, Acousto-optics, Continuous wave operation
Jianguo Xin, Er Jun Zang, Guang Hui Wei
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.163202
TOPICS: Waveguides, Channel waveguides, Waveguide lasers, Carbon dioxide lasers, Electrodes, Waveguide modes, Resonators, Mirrors, Planar waveguides, Near field
Frank Kowalski, Stefan Balle, Ian Littler, Klaas Bergmann
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.163197
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.158232
TOPICS: Gaussian beams, Laser systems engineering, Wavefronts, Lithium, Optical engineering, Optical design, Laser optics, Electromagnetism, Spherical lenses, Wave propagation
Atam Dhawan, Thomas Dufresne
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.166903
TOPICS: Image enhancement, Neurons, Image processing, Neural networks, Retina, Eye models, Model-based design, Receptors, Action potentials, Cones
Venugopal Srinivasan, Siang-Tiong Yeo, Pooja Chaturvedi
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.163201
TOPICS: Neural networks, Neurons, Fringe analysis, Interferometers, Spherical lenses, Optical spheres, Glass molding, Convolution, Optical testing, Interferometry
Sacharia Albin, Alvin Bryant, Claudio Egalon, Robert Rogowski
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.163119
TOPICS: Cladding, Refractive index, Glasses, Waveguides, Thin films, Optical fibers, Quartz, Sensors, Yttrium, Oxides
Qian Gong, Smiley Hsu
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.163190
TOPICS: Monochromatic aberrations, Wave plates, Optical testing, Point spread functions, Data modeling, Optical aberrations, Refractive index, Wavefronts, Interferometers, Hubble Space Telescope
Nobuo Sugimoto, Atsushi Minato
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.163191
TOPICS: Retroreflectors, Mirrors, Interferometers, Error analysis, Wavefronts, Spherical lenses, Satellites, Reflection, Environmental sensing, Optical testing
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.163111
TOPICS: Modulation, Ronchi rulings, Charge-coupled devices, Aspheric lenses, Video, Mirrors, Linear filtering, Wavefronts, Interferometry, Fringe analysis
Evangelos Liasi, Walter North
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.163206
TOPICS: Moire patterns, Deflectometry, Light sources, Retroreflectors, Glasses, Inspection, Cameras, Light, Calibration, Collimation
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.163199
TOPICS: Optoelectronics, Annealing, Nonlinear filtering, Optical filters, Frame grabbers, Convolution, Computer simulations, Image filtering, Linear filtering, Feature extraction
Xiaofan Feng, John Schott, Timothy Gallagher
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.166934
TOPICS: Mirrors, Image quality, Point spread functions, Solids, Scanners, Finite element methods, Sensors, Aluminum, Modulation transfer functions, Charge-coupled devices
Tina Valente, Ralph Richard
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.166936
TOPICS: Lens design, Epoxies, Glasses, Finite element methods, Chemical elements, Optical components, Optical mounts, Metals, Optical design, Adhesives
Margit Ferstl, Berndt Kuhlow, Edgar Pawlowski
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.163122
TOPICS: Lenses, Etching, Diffraction, Photomasks, Optical alignment, Chromium, Phase shifts, Glasses, Binary data, Photoresist materials
Valeri Chikovani
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.163108
TOPICS: Gyroscopes, Calibration, Error analysis, Fiber optic gyroscopes, Stochastic processes, Optical testing, Reliability, Measurement devices, Integrated optics, Fiber optics
Yang Wang, Nabil Mansour, Ali Salem, Kevin Brennan, P. Ruden
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.163192
TOPICS: Electrons, Ionization, Photomultipliers, Scattering, Phonons, Gallium nitride, Photodetectors, Quantum wells, Signal to noise ratio, Monte Carlo methods
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.163115
TOPICS: Phototransistors, Heterojunctions, Gallium arsenide, Instrument modeling, Physics, Field effect transistors, Transistors, Semiconductors, Metals, Resistance
Marcelo Algrain
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.166907
TOPICS: Control systems, Cameras, Gyroscopes, Roads, Sensors, Motion measurement, Servomechanisms, Line of sight stabilization, Particles, Imaging devices
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.163137
TOPICS: Particles, Polarization, Scattering, Backscatter, Light scattering, Electromagnetic scattering, Gold, Mie scattering, Radar, Electromagnetic radiation
Richard Preater, Robin Swain
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.163126
TOPICS: Fourier transforms, Fringe analysis, Speckle pattern, Interferometry, Modulation, Mirrors, Speckle, Reconstruction algorithms, Computer programming, Algorithm development
Jean-Robert Simard, Victor Aitken
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.163157
TOPICS: Speckle, Imaging systems, Laser scattering, Scattering, Signal detection, Image resolution, Laser beam diagnostics, Electronics, Systems modeling, Image processing
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.166933
TOPICS: Speckle, Synthetic aperture radar, Reflectivity, Imaging systems, Statistical analysis, Pattern recognition, Signal detection, Image resolution, Binary data, Communication theory
Niloufar Lamei, Keith Hutchison, Melba Crawford, Nahid Khazenie
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.166920
TOPICS: Clouds, Transform theory, Image classification, Image filtering, Gaussian filters, Digital imaging, Satellites, Library classification systems, Image segmentation, Statistical analysis
Bernt Schmiedeskamp, Andreas Kloidt, Hans-Juergen Stock, Ulf Kleineberg, Thorsten Doehring, Michael Proepper, Steffen Rahn, Kerstin Hilgers, Bernhard Heidemann, Thorsten Tappe, Ulrich Heinzmann, Michael Krumrey, Peter Mueller, Frank Scholze, Klaus Heidemann
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.163207
TOPICS: Reflectivity, X-rays, Silicon, Diffraction gratings, Molybdenum, Mirrors, X-ray optics, Interfaces, Diffraction, Multilayers
Pierre Barbier, Li Wang, Garret Moddel
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.166935
TOPICS: Optically addressed spatial light modulators, Liquid crystals, Switches, Photodiodes, Thin films, Photoresistors, Dielectrics, Cadmium sulfide, Electrodes, Spatial resolution
Guifeng Zhang, L. Guo, Zhengtang Liu, Xiulin Zheng
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.163158
TOPICS: Zinc, Carbon, Refractive index, Argon, Antireflective coatings, Diamond, Transmittance, Deposition processes, Plasma, Chemical elements
Michael Reichling, Eberhard Welsch, Angela Duparre, Eckart Matthias
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.160861
TOPICS: Absorption, Thin films, Magnesium fluoride, Modulation, Microscopy, Light scattering, Spatial resolution, Scattering, Laser beam diagnostics, Quartz
Markus Fischer, Markus Raffel, Andreas Vogt, Juergen Kompenhans
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.163141
TOPICS: Visualization, Acoustics, Scanning probe lithography, Particle image velocimetry, Particles, Cameras, Image visualization, Mirrors, Data acquisition, Turbulence
Paul Commean, Kirk Smith, Gulab Bhatia, Michael Vannier
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.163200
TOPICS: Cameras, Projection systems, Sensors, Head, Fourier transforms, 3D metrology, 3D displays, 3D modeling, Optical spheres, Structured light
Arjun Godhwani, Gulab Bhatia, Michael Vannier
Opt. Eng. 33(4), (1 April 1994) doi:10.1117/12.163176
TOPICS: Cameras, Calibration, Projection systems, Sensors, Scanners, 3D image processing, Imaging systems, Optical spheres, 3D scanning, Structured light
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