optical engineering
VOL. 33 · NO. 6 | June 1994
CONTENTS
IN THIS ISSUE

Articles (54)
Articles (2)
Articles
Brian Thompson
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.181752
TOPICS: Optical engineering, Optics, Roads, Laser applications, Image processing, Wavelet transforms, Warfare, Silver, Image restoration, Atomic, molecular, and optical physics
Joseph Horner, Bahram Javidi
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.181753
TOPICS: Optical pattern recognition, Nonlinear filtering, Filtering (signal processing), Optical signal processing, Binary data, Optical correlators, Optical engineering, Patents, Signal processing, Electrical engineering
Bahram Javidi, Joseph Horner
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.170736
TOPICS: Optical correlators, Computer simulations, Optical pattern recognition, Sensors, CCD cameras, Computer security, Spatial filters, Spatial light modulators, CCD image sensors, Holograms
David Casasent, Anqi Ye, John Smokelin, Roland Schaefer
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.171567
TOPICS: Detection and tracking algorithms, Databases, Target detection, Image filtering, Optical filters, Optical correlators, Binary data, Linear filtering, Particles, Image processing
Charles Hendrix, Bhagavatula Vijaya Kumar
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.170734
TOPICS: Image filtering, Composites, Distortion, Signal to noise ratio, Tolerancing, Phase only filters, Filtering (signal processing), Optical filters, Detection and tracking algorithms, Spatial light modulators
Joseph Horner, Bahram Javidi, Guanshen Zhang
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.170730
TOPICS: Phase only filters, Fourier transforms, Convolution, Computer programming, Optical correlators, Nonlinear filtering, Nonlinear optics, Computer simulations, Image filtering, Systems engineering
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.171600
TOPICS: Image filtering, Algorithms, Signal to noise ratio, Image processing, Composites, Optical filters, Algorithm development, Distortion, Correlation function, Computer simulations
David Flannery, Kueiming Lee, Dennis Goldstein
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.171616
TOPICS: Image filtering, Optical filters, Binary data, Signal to noise ratio, Distortion, Optical correlators, Detection and tracking algorithms, Composites, Modulation, Nonlinear filtering
Jun Wang, Bahram Javidi
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.171324
TOPICS: Binary data, Optical correlators, Fourier transforms, Joint transforms, Target detection, Charge-coupled devices, Digital imaging, Digital image correlation, Polarizers, Optoelectronics
Robert Kallman, Dennis Goldstein
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.171322
TOPICS: Image filtering, Filtering (signal processing), Optical filters, Optical pattern recognition, Phase only filters, Image processing, Computer programming, Electronic filtering, Fourier transforms, Digital signal processing
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.170729
TOPICS: Modulation, Demodulation, Signal detection, Spatial light modulators, Joint transforms, Cameras, Polarization, Optical correlators, Binary data, Amplitude modulation
Jean Figue, Philippe Refregier
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.171601
TOPICS: Signal to noise ratio, Image filtering, Tolerancing, Optical filters, Correlation function, Pattern recognition, Detection and tracking algorithms, Edge detection, Error analysis, Rhodium
P. Karivaratha Rajan, Embar Raghavan
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.171617
TOPICS: Image filtering, Detection and tracking algorithms, Optical filters, Signal to noise ratio, Distortion, Phase only filters, Composites, Computer simulations, Linear filtering, Error analysis
Samuel Kozaitis, Wesley Foor
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.174453
TOPICS: Image processing, Image filtering, Signal to noise ratio, Binary data, Optical correlators, Nonlinear filtering, Linear filtering, Image resolution, Optical filters, Spatial light modulators
Young Ham, Hong Kyu Chung, In Kim, Rae-Hong Park
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.171323
TOPICS: Visualization, Optical character recognition, Detection and tracking algorithms, Hough transforms, Binary data, Feature extraction, Head, Image segmentation, Computer simulations, Scanners
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.170732
TOPICS: Synthetic aperture radar, Electrodes, Modulators, Signal processing, Electro optics, Photodetectors, Image processing, Channel waveguides, Signal detection, Waveguides
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.181783
TOPICS: Optics, Optical engineering, Physics, Radio optics, Optical metrology, Crystal optics, Glasses, Holography, Laser applications, Nonlinear optics
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.167173
TOPICS: Absorption, Sensors, Fiber optics sensors, Fiber optics, Interfaces, Cladding, Wave sensors, Optical fibers, Physics, Attenuated total reflectance
K. Rajasree, V. Vidyalal, Periasamy Radhakrishnan, V. Nampoori, C. Vallabhan
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.168245
TOPICS: Sensors, Avalanche photodetectors, Potassium, Solids, Laser beam diagnostics, Thermography, Thermal optics, Physics, Imaging systems, Temperature metrology
Anil Khadakkar, Venkatesh Jyothi, Rajagopal Narayanan
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.167158
TOPICS: Fringe analysis, Holography, Image processing, Software, Holograms, Photoelasticity, Moire patterns, Structural engineering, Stress analysis, Speckle
M. Rao, R. Samuel, P. Nair
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.168851
TOPICS: Holographic interferometry, Holograms, Space operations, Holography, Nondestructive evaluation, Adhesives, Mercury, Solar cells, Optical simulations, Satellites
R. Shukla, Avijit Chowdhury, Parshotam Gupta
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.167177
TOPICS: Thin films, Refractive index, Interferometers, Interferometry, Extreme ultraviolet, Profilometers, Glasses, X-rays, Optical filters, Reflection
Manoj Kumar, Ashish Nath
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.168240
TOPICS: Capacitors, Ultraviolet radiation, Oxygen, Electrodes, Inductance, Carbon dioxide lasers, Laser energy, Laser development, Nitrogen, Carbon monoxide
Ashish Nath, Lala Abhinandan, Praveen Choudhary
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.168848
TOPICS: Carbon dioxide lasers, Gas lasers, Electrodes, Carbon dioxide, Continuous wave operation, Electro optics, Laser resonators, Optical resonators, Magnetism, Pulsed laser operation
Sunita Singh, Kamalesh Dasgupta, Sasi Kumar, K. Manohar, L. Nair, Udit Chatterjee
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.168243
TOPICS: Dye lasers, Optical amplifiers, Amplifiers, Oscillators, Resonators, Prisms, Mirrors, Beam splitters, Beam expanders, Laser applications
Promod Bhatnagar, Bijendra Singh, Utpal Nundy
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.168248
TOPICS: Argon ion lasers, Capacitors, Argon, Electrodes, Laser applications, Neon, Gas lasers, Pulsed laser operation, Surgery, Laser systems engineering
S. Dixit, Bijendra Singh, J. Mittal, R. Choube, R. Bhatnagar
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.168250
TOPICS: Resonators, Mirrors, Confocal microscopy, Laser resonators, Diffraction, Spatial filters, Pulsed laser operation, Beam shaping, Collimation, Geometrical optics
Megha Singh, K. Sampath Kumar
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.168254
TOPICS: Tissues, Reflectivity, Tumors, Bone, Helium neon lasers, Reflectometry, Transistors, Computing systems, Blood, Absorption
Manoj Mittal, Baij Gupta
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.168847
TOPICS: Glasses, Projection systems, Lens design, Objectives, Modulation transfer functions, Spectral resolution, Monochromatic aberrations, Ceramics, Chromatic aberrations, Image analysis
Rina Sharma, Ram Narain, Alok Kanjilal, Vijay Chitnis
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.167151
TOPICS: Moire patterns, Computing systems, Ferroelectric materials, Optical alignment, Photomasks, Control systems, Human-machine interfaces, Calibration, X-ray lithography, Automatic alignment
N. Ramesh, K. Srinivasan
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.167169
TOPICS: Electro optical modeling, Crystals, 3D modeling, Oscillators, Kerr effect, Nonlinear crystals, Electro optics, Ions, Doping, Polarizability
Rakesh Tyagi, V. Rampal, Gopal Bhar
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.170738
TOPICS: Nonlinear optics, Crystals, Nd:YAG lasers, Solid state lasers, Nonlinear crystals, Design for manufacturing, Dye lasers, Rhodamine, Beam splitters, Phase matching
P. Subramaniam, Sukhdev Roy
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.168859
TOPICS: Dielectrics, Nonlinear optics, Waveguides, Cladding, Wave propagation, Nonlinear optical glasses, Radio propagation, Physics, Maxwell's equations, Lead
Subhash Jain, K. Bist, Saila Santara
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.169804
TOPICS: Sensors, Charge-coupled devices, CCD image sensors, Scanners, Prisms, Mirrors, Cameras, Reflection, Modulation transfer functions, Data modeling
Lakhan Tanwar, Baij Gupta, S. Bansal
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.168252
TOPICS: Sensors, Electro optical sensors, Electro optics, Ferroelectric materials, Mirrors, Interferometry, Optical resolution, Resolution enhancement technologies, Transducers, Photodetectors
Ram Vasu, V. Boopathi
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.168862
TOPICS: Point spread functions, Optical transfer functions, Optical signal processing, Filtering (signal processing), Modulation, Optical filters, Fourier transforms, Image processing, Demodulation, Phase retrieval
Annieta Philip, Periasamy Radhakrishnan, V. Nampoori, C. Vallabhan
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.167164
TOPICS: Photoacoustic spectroscopy, Holography, Absorption, Data storage, Laser applications, Laser irradiation, Optical switching, Holograms, Nonlinear response, Solids
Amitabh Joshi, S. Lawande
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.168237
TOPICS: Chemical species, Raman spectroscopy, Quantum electrodynamics, Electromagnetism, Absorption, Electrodynamics, Mathematical modeling, Chemical elements, Laser applications, Physics
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.167154
TOPICS: Speckle, Fringe analysis, Interferometry, Diffraction, Interferometers, Imaging systems, Photography, Moire patterns, Speckle pattern, Collimation
Chandra Shakher, A. Pramila Daniel, Anil Nirala
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.168849
TOPICS: Speckle, Interferometry, Photography, Temperature metrology, Diffusers, Refraction, Interferometers, Moire patterns, Refractive index, Data acquisition
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.168865
TOPICS: Crystals, Speckle, Photography, Laser crystals, Ferroelectric materials, Fringe analysis, Phase shifts, Optical filters, Modulation, Sensors
H. Kandpal, J. Vaishya, K. Joshi
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.170740
TOPICS: Scattering, Spectral coherence, Light, Diffusers, Optical testing, Light scattering, Correlation function, Integrating spheres, Chemical species, Doppler effect
Alan Johnston, Duncan Liu, Siamak Forouhar, George Lutes, Joseph Maserjian, Eric Fossum
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.169726
TOPICS: Modulators, Staring arrays, Waveguides, Modulation, Cryogenics, Receivers, Interference (communication), Interfaces, Fiber optics, Analog electronics
Mehmet Bilgen, Hsien-Sen Hung
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.169737
TOPICS: Point spread functions, Image filtering, Filtering (signal processing), Stochastic processes, Image restoration, Signal processing, Linear filtering, Imaging systems, Image processing, Systems modeling
James Kircher, Steven Marlow, Michael Bastow
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.169720
TOPICS: Sensors, Adaptive optics, Projection systems, Staring arrays, Acousto-optics, Infrared radiation, Thermography, Infrared imaging, Electronics, Modulation
Ayman Kan'an, Rasheed Azzam
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.169724
TOPICS: Prisms, Reflection, Phase shifts, Germanium, Interfaces, Wave plates, Refraction, Refractive index, Polarization, Thin films
Douglas Christensen, James Rotge, Andrew Klemas, Gary Loos, David Merriman
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.169738
TOPICS: Semiconductor lasers, Interferometers, Laser damage threshold, Visibility, Fiber optics, Diodes, Coherence (optics), Fourier transforms, Gas lasers, Lamps
Gordon Lassahn, Jeffrey Lassahn, Paul Taylor, Vance Deason
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.169728
TOPICS: Phase shifts, Fringe analysis, Error analysis, Image analysis, Image processing, Image segmentation, Diffraction gratings, Optical engineering, Moire patterns, Wavefront distortions
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.169736
TOPICS: Monochromatic aberrations, Distortion, Spherical lenses, Imaging systems, Wavefronts, Aspheric lenses, Mirrors, Colorimetry, Polishing, Surface finishing
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.169725
TOPICS: Mirror mounts, Mirrors, Diamond machining, Aluminum, Metals, Optical alignment, Rapid manufacturing, Spherical lenses, Optical mounts, Prototyping
Stephen Fonash, Jingya Hou, Francisco Rubinelli, Murray Bennett, Scott Wiedeman, Liyou Yang, James Newton
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.169735
TOPICS: Quantum efficiency, Amplifiers, Electrons, Photodetectors, Computer simulations, Modulation, Silicon, Amorphous silicon, Phototransistors, Diffusion
Soung Yee, Paul Griffin
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.169713
TOPICS: Imaging systems, Data acquisition, Image enhancement, Calibration, 3D image processing, Light sources and illumination, Image processing, Image segmentation, Image analysis, Structured light
Suresh Gupta, Poonam Agarwal, B. Sharma, A. Sreedhar
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.169698
TOPICS: Silicon, Metals, Germanium, Systems modeling, Composites, Data modeling, Palladium, CCD image sensors, Chemical analysis, Telecommunications
Hong Kyu Chung, Rae-Hong Park
Opt. Eng. 33(6), (1 June 1994) doi:10.1117/12.171898
TOPICS: Hough transforms, Fuzzy logic, Detection and tracking algorithms, Image segmentation, Corner detection, Computer simulations, Algorithm development, Electronics engineering, Machine vision, Computer vision technology
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