optical engineering
VOL. 33 · NO. 8 | August 1994
CONTENTS
IN THIS ISSUE

Articles (46)
Articles (2)
Articles
Brian Thompson
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.189556
TOPICS: Optical engineering, X-ray optics, Roads, Optics, Image processing, Communication engineering, Visual optics, Nanostructures, Polymers, Atomic, molecular, and optical physics
Milton Gottlieb, N. Singh, Richard Hopkins, Robert Mazelsky
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.176513
TOPICS: Crystals, Thallium, Acousto-optics, Tunable filters, Crystallography, Acoustics, Polishing, Infrared radiation, Crystal optics, Beam propagation method
Ahmed Tewfik, Srinath Hosur, Sameh Sowelam
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.176505
TOPICS: Wavelets, Doppler effect, Radar, Synthetic aperture radar, Image resolution, Radar imaging, Algorithm development, Reconstruction algorithms, Matrices, Surveillance systems
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.173573
TOPICS: Image fusion, Data fusion, Photography, Sensors, Spectral resolution, Modulation, Multispectral imaging, Image sensors, Reflectivity, Earth observing sensors
Akhlesh Lakhtakia, Russell Messier
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.177108
TOPICS: Interfaces, Thin films, Reflection, Reflectivity, Beryllium, Silicon films, Tungsten, Dielectrics, Optical fibers, Amorphous silicon
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.173566
TOPICS: Scintillation, Space operations, Sensors, Electronic filtering, Relays, Mirrors, Nd:YAG lasers, Space telescopes, Telescopes, Backscatter
Giampiero Naletto, Giuseppe Tondello, Giovanni Bonanno, Rosario Di Benedetto, Salvatore Scuderi
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.173588
TOPICS: Charge-coupled devices, Quantum efficiency, Ultraviolet radiation, Sensors, Photodiodes, Silicon, Calibration, Coating, Monochromators, Mirrors
JongWon Kim, Sang Uk Lee
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.173580
TOPICS: Motion estimation, Computer programming, Distortion, Motion models, Performance modeling, Signal to noise ratio, Motion measurement, Signal processing, Instrumentation control, Control systems
Glen Abousleman, Eric Gifford, Bobby Hunt
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.173591
TOPICS: Image processing, Image compression, Algorithm development, Data compression, Image filtering, Reconstruction algorithms, Sensors, Visualization, Hyperspectral imaging, Image quality
Joel Rosiene, Ian Greenshields
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.177116
TOPICS: Wavelets, Image compression, Quantization, Signal to noise ratio, Computer programming, Image processing, Image quality standards, Wavelet transforms, Data processing, Receivers
Eero Tervonen, Jari Turunen, Jukka Pekola
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.176512
TOPICS: Optical components, Chemical elements, Diffraction, Binary data, Diffraction gratings, Modulation, Fourier transforms, Optical lithography, Lithography, Lithographic illumination
Wendell Watkins, Richard Dutro
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.177118
TOPICS: Imaging systems, Temperature metrology, Black bodies, Image filtering, Signal detection, Optical turbulence, Aerosols, Signal attenuation, Modulation transfer functions, Electronic filtering
Paul Pigram, Peter Timbrell, Robert Lamb, Mark Sceats, Andrea Cox
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.177113
TOPICS: Optical fibers, Silicon, Optical alignment, Coating, Semiconducting wafers, Microscopes, Fusion splicing, Fiber coatings, Optoelectronic devices, Telecommunications
Herbert Schneckenburger, Karsten Koenig, Thomas Dienersberger, Rainer Hahn
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.177101
TOPICS: Luminescence, Imaging spectroscopy, Picosecond phenomena, Fluorescence spectroscopy, Teeth, Pulsed laser operation, Skin, Spectroscopy, Medical diagnostics, Dental caries
Weizhong Ke, Duowei Yu
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.173571
TOPICS: Raman spectroscopy, Proteins, Molecules, Luminescence, Molecular lasers, Monochromators, NOx, Physics, Chemistry, Biology
Guang Leng, Ding Fan Gu, Xiao Yan Zang
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.176510
TOPICS: Polarization, Interfaces, Refractive index, Reflectivity, Beam propagation method, Fourier transforms, Refraction, Human-machine interfaces, Wave propagation, Physics
Trygve Randen, John Husoy
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.177115
TOPICS: Image filtering, Image segmentation, Optical filters, Image classification, Image compression, Bandpass filters, Optimal filtering, Visual process modeling, Gaussian filters, Spatial frequencies
Pantazis Mouroulis, Xiaoxue Cheng
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.173577
TOPICS: Image quality, Monochromatic aberrations, Modulation transfer functions, Eye, Visualization, Spatial frequencies, Quality measurement, Point spread functions, Image visualization, Video
Andrey Lipovskii, Nikolai Nikonorov, Vladimir Lokalov
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.173570
TOPICS: Ferroelectric materials, Rubidium, Potassium, Ion exchange, Waveguides, Cesium, Crystals, Ions, Silver, Birefringence
Phillip Pace, David Styer
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.173559
TOPICS: Interferometers, Analog electronics, Computer programming, Electrodes, Integrated optics, Sensors, Pulsed laser operation, Signal detection, Electro optics, Modulation
Yoshiharu Morimoto, Harold Gascoigne, Daniel Post
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.173578
TOPICS: Moire patterns, Fringe analysis, Deflectometry, Fourier transforms, Diffraction gratings, Image processing, Composites, Cameras, Mechanical engineering, Statistical analysis
Yinyan Wang, Fu-Pen Chiang
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.177106
TOPICS: Deflectometry, Fringe analysis, Interferometry, Mirrors, Diffraction gratings, Wavefronts, Diffraction, Optical filters, Cameras, Optical testing
Eduardo Barbosa, Jaime Frejlich, Victor Prokofiev, N. Gallo, Jose Andreeta
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.173555
TOPICS: Crystals, Holographic interferometry, Holograms, Holography, Mirrors, Ferroelectric materials, Diffraction, Polarization, Signal processing, Laser crystals
Chandra Shakher, A. Pramila Daniel, S. Angra
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.173575
TOPICS: Temperature metrology, Absorption, Spectrophotometry, Photography, Interferometers, Interferometry, Diffraction gratings, Refraction, Fringe analysis, Deflectometry
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.173590
TOPICS: Glasses, Wave plates, Interferometers, CCD image sensors, Fizeau interferometers, Phase conjugation, Aluminum, Lenses, Ferroelectric materials, Phase interferometry
Paul Ruffin, Cassie Lofts, Chi Sung, Jerry Page
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.173562
TOPICS: Fiber optics, Fiber optic gyroscopes, Interferometers, Temperature metrology, Fiber optics tests, Phase shifts, Optical fibers, Signal detection, Aluminum, Tin
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.173567
TOPICS: Wavefronts, Shearing interferometers, Mirrors, Microlens, Interferometry, Phase shifts, Phase measurement, Molybdenum, Interferometers, Ferroelectric materials
Joseph Nilsen, Brian MacGowan, Luiz Da Silva, Juan Moreno, Jeffrey Koch, James Scofield
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.173558
TOPICS: Titanium, Ions, Nickel, Chromium, Iron, Lasers, Plasma, Vanadium, Cobalt, Calcium
Klaus Gerstner, Theo Tschudi
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.173574
TOPICS: Semiconductor lasers, Resonators, Interferometry, Light sources, Ranging, Laser resonators, Laser stabilization, Laser systems engineering, Helium neon lasers, Tunable lasers
Frederick Mendis, Manas Haldar, Pang Kooi, Jun Wang
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.173576
TOPICS: Semiconductor lasers, Intermodulation, Modulation, Distortion, Multiplexing, Particle filters, Video, Amplitude modulation, Fiber optics, Frequency modulation
Colin Soutar, Kanghua Lu
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.173544
TOPICS: Liquid crystals, Polarizers, Modulation, Video, Phase shift keying, Mathematical modeling, Optical signal processing, Phase modulation, Projection systems, Birefringence
Yidong Chen, Edward Dougherty
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.173552
TOPICS: Image classification, Binary data, Feature extraction, Feature selection, Image segmentation, Signal to noise ratio, Library classification systems, Statistical analysis, Image processing, Interference (communication)
Mehmet Bilgen, Hsien-Sen Hung
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.173563
TOPICS: Neural networks, Algorithms, Stochastic processes, Neurons, Interference (communication), Data modeling, Evolutionary algorithms, Statistical modeling, Error analysis, Chemical elements
Floyd Dowell
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.173579
TOPICS: Neural networks, Reflectivity, Inspection, Error analysis, Optical inspection, Visualization, Spectrophotometry, Agriculture, Library classification systems, Analytical research
Guan-chang Jin, Nai-Keng Bao, Po Sheun Chung
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.173565
TOPICS: Polarizers, Polarization, Phase shifts, Interferometry, Fringe analysis, 3D metrology, Speckle pattern, Nondestructive evaluation, Prisms, Error analysis
Francesco De Carlo, Roberto Stalio, Paolo Trampus, A. Lyle Broadfoot, Bill Sandel, Giovanni Sicuranza
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.173587
TOPICS: Stars, Charge-coupled devices, Detection and tracking algorithms, Sensors, Electro optical systems, Electro optics, CCD image sensors, Imaging systems, Computing systems, Computer simulations
Timothy King, Gerard Cote, Roger McNichols, Marcel Goetz
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.173556
TOPICS: Glucose, Polarimetry, Blood, Active optics, Sensors, Molecules, Modulation, Eye, Signal detection, Superposition
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.173561
TOPICS: CCD image sensors, Interferometers, Modulation, Scanning probe microscopy, Semiconductor lasers, Image sensors, Spatial resolution, Phase interferometry, Photodetectors, Signal detection
Anand Asundi, Chi-Shing Chan, Sajan Marokkey
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.176507
TOPICS: Moire patterns, Modulation, Data acquisition, Semiconductor lasers, Cameras, Head, Defect detection, Phase shifting, Imaging systems, Structured light
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.177107
TOPICS: Receivers, Signal to noise ratio, Photodiodes, Electronic filtering, Optical filters, Optical amplifiers, Laser scanners, 3D scanning, LIDAR, Mirrors
Munir Nazmeev, Nadezhda Pavlycheva
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.173564
TOPICS: Spectrographs, Monochromatic aberrations, Diffraction gratings, Holography, Objectives, Aberration correction, Optical design, Fiber optic illuminators, Spherical lenses, Wavefronts
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.173572
TOPICS: Scattering, Light scattering, Mie scattering, Biomedical optics, Signal attenuation, Photons, Picosecond phenomena, Laser scattering, Sensors, Radiative transfer
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.176518
TOPICS: Standards development, Visibility, Tolerancing, Reflection, Surface finishing, Microscopes, Polishing, Mirrors, Surface roughness, Scattering
Jason Grant, John Davis, Peter Wells, Michael Morgan
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.173548
TOPICS: Sensors, Tomography, Crystals, Silicon, Diffraction, Scattering, Laser crystals, X-rays, Laser scattering, Signal detection
Pramod Rastogi, Leopold Pflug
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.176524
TOPICS: Holography, Interferometers, Holographic interferometry, Holograms, Moire patterns, Modulation, Stress analysis, Optical engineering, Collimation, Illumination engineering
Opt. Eng. 33(8), (1 August 1994) https://doi.org/10.1117/12.176520
TOPICS: Fourier transforms, Spatial frequencies, Photons, Holography, Chlorine, Image processing, Error analysis, Interferometry, System on a chip, Americium
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