Holographic interferometry using substrate guided waves

Qiang Huang; John A. Gilbert; H. John Caulfield

doi:10.1117/12.163188

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1 April 1994 Holographic interferometry using substrate guided waves

Qiang Huang, John A. Gilbert, H. John Caulfield

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Optical Engineering, 33(4), (1994). https://doi.org/10.1117/12.163188

Abstract

A new tool for experimental mechanics called substrate guided wave (SGW) holo-interferometry is described. The approach relies on recording and reconstructing time-average, double-exposure, and realtime holograms using light waves guided to the hologram by a dielectric sheet or substrate waveguide. The study illustrates that SGW holo-interlerometry can be used to isolate the reference wavefront from the environment surrounding the hologram and can be applied to measure the mechanical properties of the substrate itself. These attributes are discussed along with experimental work performed to develop and refine the technique.

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Qiang Huang, John A. Gilbert, and H. John Caulfield "Holographic interferometry using substrate guided waves," Optical Engineering 33(4), (1 April 1994). https://doi.org/10.1117/12.163188

Published: 1 April 1994

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