optical engineering
VOL. 34 · NO. 2 | February 1995
CONTENTS
IN THIS ISSUE

Articles (42)
Articles (2)
Articles
Brian Thompson
Opt. Eng. 34(2), (1 February 1995) https://doi.org/10.1117/12.210191
TOPICS: Optical engineering, X-ray optics, Physics, Optics, Image processing, Roads, Lead, Ophthalmology, Silicon, Polarization analysis
Opt. Eng. 34(2), (1 February 1995) https://doi.org/10.1117/12.210192
TOPICS: Heat flux, X-rays, Optical engineering, Synchrotrons, Mirrors, X-ray optics, Optical components, Thermography, Monochromators, Optical design
Frank Anthony
Opt. Eng. 34(2), (1 February 1995) https://doi.org/10.1117/12.194032
TOPICS: Mirrors, Distortion, Silicon carbide, Synchrotrons, Laser applications, Silicon, Copper, Molybdenum, Laser optics, Laser development
Michael Laughlin
Opt. Eng. 34(2), (1 February 1995) https://doi.org/10.1117/12.194031
TOPICS: Mirrors, Motion measurement, Information operations, Mirror mounts, Received signal strength, Acoustics, Correlation function, Turbulence, Motion analysis, Electromagnetism
Opt. Eng. 34(2), (1 February 1995) https://doi.org/10.1117/12.194195
TOPICS: Mirrors, Distortion, Interferometers, Temperature metrology, Optical coatings, Electron beams, Cameras, High power lasers, Glasses, Raster graphics
John Rosenfeld, Mark North
Opt. Eng. 34(2), (1 February 1995) https://doi.org/10.1117/12.194100
TOPICS: Heat flux, Liquids, Metals, Optical components, Capillaries, Particles, Copper, Performance modeling, Silicon, Interfaces
Opt. Eng. 34(2), (1 February 1995) https://doi.org/10.1117/12.194193
TOPICS: Synchrotron radiation, Polarization, Magnetism, Optical components, X-rays, Photon polarization, Optical design, Electron beams, Charged particle optics, Solids
Eugene Church, Peter Takacs
Opt. Eng. 34(2), (1 February 1995) https://doi.org/10.1117/12.196057
TOPICS: Mirrors, X-rays, Sensors, Fractal analysis, Spatial frequencies, Diffraction, Image quality, Surface finishing, Scattering, X-ray imaging
Jean Susini
Opt. Eng. 34(2), (1 February 1995) https://doi.org/10.1117/12.194835
TOPICS: Mirrors, X-rays, Monochromatic aberrations, Silicon, Silicon carbide, Hard x-rays, Reflectivity, Scattering, X-ray optics, Reflection
Shigeru Sato, Hideki Maezawa, Mihiro Yanagihara, Eiji Ishiguro, Shu-itsu Matsuo
Opt. Eng. 34(2), (1 February 1995) https://doi.org/10.1117/12.194832
TOPICS: Mirrors, Silicon carbide, Chemical vapor deposition, Vacuum ultraviolet, Reflectivity, X-rays, Copper, Multilayers, Profilometers, Coating
Jean Susini, Dieter Pauschinger, Roland Geyl, Jean-Jacques Ferme, Guy Vieux
Opt. Eng. 34(2), (1 February 1995) https://doi.org/10.1117/12.194836
TOPICS: Mirrors, Silicon, X-rays, Metrology, Polishing, Optics manufacturing, Hard x-rays, Synchrotron radiation, X-ray optics, Synchrotrons
Opt. Eng. 34(2), (1 February 1995) https://doi.org/10.1117/12.194834
TOPICS: Mirrors, Prisms, Head, Distortion, Interferometers, In situ metrology, Fourier transforms, Profilometers, Laser beam diagnostics, Beam splitters
Jonathan Bender
Opt. Eng. 34(2), (1 February 1995) https://doi.org/10.1117/12.195194
TOPICS: Mirrors, Polishing, Surface finishing, Spherical lenses, Synchrotrons, Tolerancing, Integrated optics, Surface roughness, Optical testing, Grazing incidence
Opt. Eng. 34(2), (1 February 1995) https://doi.org/10.1117/12.195740
TOPICS: Mirrors, Metals, Beam shaping, X-rays, Optical components, Composites, Tolerancing, Error analysis, Statistical analysis, Optical engineering
Wah Keat Lee, Dennis Mills, Lahsen Assoufid, Robert Blasdell, Patricia Fernandez, Carey Rogers, Robert Smither
Opt. Eng. 34(2), (1 February 1995) https://doi.org/10.1117/12.194621
TOPICS: Crystals, Silicon, Monochromators, X-rays, Liquids, Laser crystals, Diamond, Liquid crystals, Diffraction, Metals
Gerard Marot
Opt. Eng. 34(2), (1 February 1995) https://doi.org/10.1117/12.195196
TOPICS: Crystals, Liquids, Cryogenics, Nitrogen, Silicon, Monochromators, Selenium, Laser crystals, Distortion, Crystallography
Andreas Freund
Opt. Eng. 34(2), (1 February 1995) https://doi.org/10.1117/12.195195
TOPICS: Crystals, Diamond, Laser crystals, Silicon, Monochromators, X-rays, Crystallography, Heat flux, Single crystal X-ray diffraction, Synchrotrons
John Arthur
Opt. Eng. 34(2), (1 February 1995) https://doi.org/10.1117/12.195395
TOPICS: Crystals, Monochromators, Silicon, X-rays, Laser crystals, Resistance, Prototyping, Synchrotron radiation, Synchrotrons, Copper
Opt. Eng. 34(2), (1 February 1995) https://doi.org/10.1117/12.194837
TOPICS: X-rays, Reflectivity, Multilayers, Crystals, Mirrors, Silicon, Annealing, Monochromators, Molybdenum, Synchrotrons
Magdi El-Ghazzawi, Tadashi Saitoh
Opt. Eng. 34(2), (1 February 1995) https://doi.org/10.1117/12.194045
TOPICS: Silicon, Spectroscopic ellipsometry, Polarizers, Semiconducting wafers, Ellipsometry, Dielectrics, Data modeling, Oxides, Spectroscopy, Chemical vapor deposition
Chuan Tjin, David Kilpatrick, Peter Johnston
Opt. Eng. 34(2), (1 February 1995) https://doi.org/10.1117/12.194040
TOPICS: Doppler effect, Blood, In vivo imaging, Blood circulation, Velocity measurements, Calibration, Light scattering, Fiber lasers, Sensors, Fluid dynamics
Ophir Eyal, Abraham Katzir
Opt. Eng. 34(2), (1 February 1995) https://doi.org/10.1117/12.188614
TOPICS: Radiometry, Temperature metrology, Optical fibers, Silver, Signal detection, Sensors, Fiber optics, Calibration, Fiber optics tests, Black bodies
Jerald Britten, Robert Boyd, Bruce Shore
Opt. Eng. 34(2), (1 February 1995) https://doi.org/10.1117/12.194046
TOPICS: Diffraction gratings, Photoresist developing, Diffraction, Photoresist materials, Manufacturing, Detector development, Diagnostics, Process control, Mirrors, Laser beam diagnostics
Fatima Ghailane, Gurusamy Manivannan, Roger Lessard
Opt. Eng. 34(2), (1 February 1995) https://doi.org/10.1117/12.194049
TOPICS: Holography, Diffraction, Polymers, Data storage, Holograms, Diffraction gratings, Surface plasmons, Absorption, Refractive index, Energy efficiency
Henrik Saldner, Nandigana Krishna Mohan, Nils-Erik Molin
Opt. Eng. 34(2), (1 February 1995) https://doi.org/10.1117/12.188613
TOPICS: Mirrors, Interferometry, Image processing, Sensors, Holography, Vibrometry, Fringe analysis, Modulation, Data processing, Phase shifts
Marek Dobosz, Hirokazu Matsumoto, Shige Iwasaki
Opt. Eng. 34(2), (1 February 1995) https://doi.org/10.1117/12.188618
TOPICS: Beam splitters, Interferometers, Interferometry, Glasses, Semiconductor lasers, Radon, Fringe analysis, Prisms, Refractive index, Modulation
Kenneth Fischer, Vincent Abreu, Wilbert Skinner, John Barnes, Matthew McGill, Todd Irgang
Opt. Eng. 34(2), (1 February 1995) https://doi.org/10.1117/12.188598
TOPICS: Aerosols, Wind measurement, LIDAR, Doppler effect, Sensors, Atmospheric modeling, Scattering, Atmospheric particles, Telescopes, Optical filters
Opt. Eng. 34(2), (1 February 1995) https://doi.org/10.1117/12.188599
TOPICS: Clouds, Optical communications, Monte Carlo methods, Transmitters, Mathematical modeling, Free space optics, Wave propagation, Receivers, Systems modeling, Channel projecting optics
Opt. Eng. 34(2), (1 February 1995) https://doi.org/10.1117/12.188600
TOPICS: Sensors, Clouds, Receivers, Optical communications, Telecommunications, Detector arrays, Transmitters, Avalanche photodetectors, Adaptive optics, Signal to noise ratio
Val Morozov, John Neff, Henryk Temkin, Adam Fedor
Opt. Eng. 34(2), (1 February 1995) https://doi.org/10.1117/12.194048
TOPICS: Holograms, Vertical cavity surface emitting lasers, Sensors, Diffraction, Optical interconnects, Holography, Free space optics, Optical design, Distortion, Computing systems
Helena Hedsten, Goran Manneberg
Opt. Eng. 34(2), (1 February 1995) https://doi.org/10.1117/12.188594
TOPICS: Spatial light modulators, Fourier transforms, Diffraction, Reflectivity, Image resolution, Cameras, Image filtering, CCD cameras, Spatial filters, Spatial frequencies
Charly Allemand, Joseph Danko
Opt. Eng. 34(2), (1 February 1995) https://doi.org/10.1117/12.188604
TOPICS: Semiconducting wafers, Optical spheres, Particles, Mirrors, Diffraction, Silicon, Transform theory, Latex, Sensors, Signal detection
Opt. Eng. 34(2), (1 February 1995) https://doi.org/10.1117/12.194047
TOPICS: Optical alignment, Microscopes, Feature extraction, Microlens array, Switching, Interfaces, Geometrical optics, Optical computing, Microlens, Optical instrument design
Opt. Eng. 34(2), (1 February 1995) https://doi.org/10.1117/12.194034
TOPICS: Mirrors, Telescopes, Tolerancing, Polonium, Wavefronts, Titanium, Monochromatic aberrations, Numerical analysis, Algorithms, Zerodur
Opt. Eng. 34(2), (1 February 1995) https://doi.org/10.1117/12.194038
TOPICS: Tolerancing, Mirrors, Ultraviolet radiation, Imaging systems, Image quality, Space telescopes, Phase modulation, Astronomical imaging, Telescopes, Optical fabrication
Nobuyuki Kitaura, Shiro Ogata, Yuzo Mori
Opt. Eng. 34(2), (1 February 1995) https://doi.org/10.1117/12.188608
TOPICS: Spectroscopy, Spectral resolution, Diffraction, Semiconductor lasers, Visible radiation, Absorption, Collimators, Prisms, Micro optics, Light sources
Werner Schmidt
Opt. Eng. 34(2), (1 February 1995) https://doi.org/10.1117/12.188591
TOPICS: Absorption, Spectrophotometry, Monochromators, Optical filters, Calibration, Luminescence, Singular optics, Absorption filters, Data acquisition, Scattering
Mirza Cevro, George Carter
Opt. Eng. 34(2), (1 February 1995) https://doi.org/10.1117/12.188616
TOPICS: Tantalum, Refractive index, Argon, Ions, Oxides, Sputter deposition, Oxygen, Thin films, Deposition processes, Ion beams
Michael Currin, Pierre Schonbaum, Carl Halford, Ronald Driggers
Opt. Eng. 34(2), (1 February 1995) https://doi.org/10.1117/12.188603
TOPICS: GRIN lenses, Sensors, Micro unmanned aerial vehicles, Lenses, Signal detection, Optical tracking, Target detection, Optical fabrication, Prototyping, Signal processing
Israel Gannot, M. Alaluf, Jacob Dror, Johannes Tschepe, Gerhard Mueller, Nathan Croitoru
Opt. Eng. 34(2), (1 February 1995) https://doi.org/10.1117/12.188590
TOPICS: Waveguides, Temperature metrology, Metals, Black bodies, Carbon dioxide lasers, Infrared radiation, Thermal effects, Radiation effects, Endoscopes, Laser energy
Jaroslav Pospisil, Jiri Zahejsky
Opt. Eng. 34(2), (1 February 1995) https://doi.org/10.1117/12.188609
TOPICS: Monochromatic aberrations, Imaging systems, Optical imaging, Image acquisition, Image quality, Error analysis, Modulation transfer functions, Spatial frequencies, Information theory, Refractor telescopes
ZuZhou Yue, Jianmin Gong, Jishu Chen
Opt. Eng. 34(2), (1 February 1995) https://doi.org/10.1117/12.188611
TOPICS: Channel projecting optics, Neural networks, Spatial light modulators, System on a chip, Singular optics, Transmittance, Statistical optics, Liquid crystals, Charge-coupled devices, Optical imaging
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