optical engineering
VOL. 34 · NO. 5 | May 1995

Articles (39)
Articles (1)
Brian Thompson
Opt. Eng. 34(5), (1 May 1995) doi:10.1117/12.210203
TOPICS: Optical engineering, Stress analysis, Roads, Optics, Image processing, Document management, Error control coding, Printing, Polarization analysis, Analytical research
Victor Skormin, Mark Tascillo, Timothy Busch
Opt. Eng. 34(5), (1 May 1995) doi:10.1117/12.201638
TOPICS: Satellites, Acquisition tracking and pointing, Telecommunications, Sensors, Signal processing, Laser communications, Laser systems engineering, Satellite communications, Mirrors, Digital signal processing
Opt. Eng. 34(5), (1 May 1995) doi:10.1117/12.201627
TOPICS: IRIS Consortium, Classification systems, Image classification, Library classification systems, Target detection, Automatic target recognition, Data storage, Environmental sensing, Visualization, System integration
Kai Meng Hock
Opt. Eng. 34(5), (1 May 1995) doi:10.1117/12.199879
TOPICS: Phase transfer function, Modulation transfer functions, Fourier transforms, Spatial frequencies, Modulation, Solids, Image filtering, Image quality, Imaging arrays, Charge-coupled devices
Erich Grossman, Donald McDonald
Opt. Eng. 34(5), (1 May 1995) doi:10.1117/12.199887
TOPICS: Transmittance, FT-IR spectroscopy, Dielectrics, Error analysis, Reflection, Absorption, Silicon, Semiconducting wafers, Fabry–Perot interferometers, Spectral resolution
Lakshminarayan Hazra, Yiping Han, Claude Delisle
Opt. Eng. 34(5), (1 May 1995) doi:10.1117/12.199884
TOPICS: Computer generated holography, Lenses, Geometrical optics, Refractive index, Reflection, Diffraction, Lens design, Optical imaging, Imaging systems, Optical design
Thomas Zurbuchen, Peter Bochsler, Frank Scholze
Opt. Eng. 34(5), (1 May 1995) doi:10.1117/12.199865
TOPICS: Reflection, Reflectivity, Extreme ultraviolet, Aluminum, Ions, Sensors, Analytical research, Gold, Ultraviolet radiation, Particles
Opt. Eng. 34(5), (1 May 1995) doi:10.1117/12.199881
TOPICS: Staring arrays, Mercury cadmium telluride, Sensors, Photodiodes, Signal to noise ratio, Interference (communication), Calibration, Temperature metrology, Computer simulations, Signal detection
Reyer Zwiggelaar, Christine Bull
Opt. Eng. 34(5), (1 May 1995) doi:10.1117/12.201665
TOPICS: Fractal analysis, Fourier transforms, Image segmentation, Spatial frequencies, Spatial filters, Integrated optics, Sensors, Optical filters, Image processing, Agriculture
Minsheng Wang, Zheng Bao
Opt. Eng. 34(5), (1 May 1995) doi:10.1117/12.201623
TOPICS: Time-frequency analysis, Fourier transforms, Wavelets, Radar imaging, Synthetic aperture radar, Doppler effect, Baryon acoustic oscillations, Scattering, Signal processing, Image information entropy
Ting-Chung Poon, Kyu Doh, Bradley Schilling, Ming Wu, Kazunori Shinoda, Yoshiji Suzuki
Opt. Eng. 34(5), (1 May 1995) doi:10.1117/12.201662
TOPICS: Holography, Holograms, 3D image reconstruction, Optical scanning, Digital holography, 3D image processing, Microscopy, Stereoscopy, Optical microscopy, Spherical lenses
Ralph Thoma, Michael Dratz, Norbert Hampp
Opt. Eng. 34(5), (1 May 1995) doi:10.1117/12.201654
TOPICS: Holography, Optical correlators, Holography applications, Absorption, Diffraction, Bandpass filters
Chung Jung Kuo, Hsuan-Ting Chang
Opt. Eng. 34(5), (1 May 1995) doi:10.1117/12.199869
TOPICS: Holography, Holograms, Spatial light modulators, Signal to noise ratio, Optical simulations, Interference (communication), Transmittance, Charge-coupled devices, Quantization, 3D image reconstruction
Bao Hua Zhuang, Zhen Li, Ji-Hua Zhang, Keqian Lu
Opt. Eng. 34(5), (1 May 1995) doi:10.1117/12.199873
TOPICS: Holography, Precision optics, Holographic optical elements, Inspection, Infrared radiation, Computer generated holography, Mathematical modeling, Computer simulations
Terry Chen, Guan Chang, Shih Wu
Opt. Eng. 34(5), (1 May 1995) doi:10.1117/12.199877
TOPICS: Fringe analysis, Gold, Holograms, 3D image reconstruction, Cements, Holographic interferometry, Holography, Teeth, Dental caries, Metals
William Tropf
Opt. Eng. 34(5), (1 May 1995) doi:10.1117/12.201666
TOPICS: Refractive index, Data modeling, Temperature metrology, Laser induced fluorescence, Magnesium fluoride, Zinc, Calcium, Potassium, Nose, Silicon
Michael Roggemann, Byron Welsh, Patrick Gardner, Robert Johnson, Byron Pedersen
Opt. Eng. 34(5), (1 May 1995) doi:10.1117/12.199870
TOPICS: Wavefronts, Tomography, Wavefront sensors, Refraction, Turbulence, Phase measurement, Optical testing, Reconstruction algorithms, Sensors, 3D metrology
Opt. Eng. 34(5), (1 May 1995) doi:10.1117/12.201664
TOPICS: Compound parabolic concentrators, Solar concentrators, Bandpass filters, Optical filters, Receivers, Sensors, Infrared radiation, Dielectrics, Transmittance, Reflectivity
Opt. Eng. 34(5), (1 May 1995) doi:10.1117/12.201651
TOPICS: Polarizers, Polarization, Infrared imaging, Infrared radiation, Black bodies, Cameras, Remote sensing, Thermography, Interfaces, Reflectivity
In-Bok Kong, Seung-Woo Kim
Opt. Eng. 34(5), (1 May 1995) doi:10.1117/12.201667
TOPICS: Phase shifts, Phase interferometry, Mirrors, Inspection, Prototyping, Sensors, Phase shifting, Calibration, Wavefronts, Image processing
Kou Kurosawa, Ryoichi Sonouchi, Atsushi Yokotani, Wataru Sasaki, Masahito Kattoh, Yasuo Takigawa, Kazuhito Nishimura
Opt. Eng. 34(5), (1 May 1995) doi:10.1117/12.199864
TOPICS: Diamond, Mirrors, Excimer lasers, Crystals, Argon ion lasers, Reflectivity, Laser crystals, Krypton, Vacuum ultraviolet, Surface finishing
Guo Li
Opt. Eng. 34(5), (1 May 1995) doi:10.1117/12.201656
TOPICS: Switching, Semiconductor lasers, Copper, Objectives, Laser optics, Fiber optics, Bistable lasers, Laser damage threshold, Solids, Near field optics
Kwang-Suk Kim, Jeong-Moog Kim, Cheol-Jung Kim
Opt. Eng. 34(5), (1 May 1995) doi:10.1117/12.199889
TOPICS: Continuous wave operation, Pulsed laser operation, Nd:YAG lasers, Power supplies, Lamps, Surgery, Reflectivity, Diodes, Mirrors
Jan Braasch, Wolfgang Holzapfel, Stephan Neuschaefer-Rube
Opt. Eng. 34(5), (1 May 1995) doi:10.1117/12.201655
TOPICS: Sensors, Semiconductor lasers, Diodes, Optical amplifiers, Light sources, Temperature metrology, Photodiodes, Optical testing, Beam controllers, Precision optics
Thomas McGee, Michael Gross, Upendra Singh, James Butler, Patrick Kimvilakani
Opt. Eng. 34(5), (1 May 1995) doi:10.1117/12.199883
TOPICS: LIDAR, Aerosols, Ozone, Raman spectroscopy, Backscatter, Sensors, Atmospheric particles, Telescopes, Scattering, Temperature metrology
Opt. Eng. 34(5), (1 May 1995) doi:10.1117/12.201646
TOPICS: Image restoration, Point spread functions, Neurons, Signal to noise ratio, Nuclear medicine, Cameras, Interference (communication), Image processing, Spherical lenses, Neural networks
Satoshi Fujii, Keigo Iizuka
Opt. Eng. 34(5), (1 May 1995) doi:10.1117/12.199888
TOPICS: Neural networks, Signal detection, Glasses, Terahertz radiation, Avalanche photodetectors, Bragg cells, Optical fibers, Image processing, Evolutionary algorithms, Detection and tracking algorithms
Khurram Kazi, Eric Donkor
Opt. Eng. 34(5), (1 May 1995) doi:10.1117/12.199876
TOPICS: Clocks, Picosecond phenomena, Data modeling, Wavelength division multiplexing, Signal processing, Systems modeling, Modeling and simulation, Instrument modeling, Telecommunications, Data conversion
Ranjani Parthasarathi, Ashok Jhunjhunwala
Opt. Eng. 34(5), (1 May 1995) doi:10.1117/12.199886
TOPICS: Passive elements, Symbolic substitution, Polarization, Optical components, Superposition, Optical computing, Binary data, Image compression, Parallel processing, Beam splitters
Mohamad Habli, Tammam Dandashi
Opt. Eng. 34(5), (1 May 1995) doi:10.1117/12.199875
TOPICS: Chemical elements, Electrodes, Optical computing, Optical tomography, Tomography, Computed tomography, Finite element methods, Reconstruction algorithms, Computer simulations, Light emitting diodes
Opt. Eng. 34(5), (1 May 1995) doi:10.1117/12.199874
TOPICS: Monochromatic aberrations, Mirrors, Telescope design, Tolerancing, Aspheric lenses, Telescopes, Optical instrument design, Spherical lenses, Ray tracing, Combined lens-mirror systems
Jose Rodriguez Garcia, Susana Fernandez, Sergio Palacios Diaz, Rosario Diaz Crespo, Julio Fernandez Diaz, Ana Guinea Rueda, Jose Virgos Rovira, Jose Olivares
Opt. Eng. 34(5), (1 May 1995) doi:10.1117/12.201653
TOPICS: Waveguides, Channel waveguides, Refractive index, Wave propagation, Planar waveguides, Directional couplers, Single mode fibers, Radio propagation, Diffusion, Lithium niobate
Yong-Jing Wang, Zhuanyun Guo
Opt. Eng. 34(5), (1 May 1995) doi:10.1117/12.199866
TOPICS: Liquid crystals, Molecules, Phase conjugation, Diffraction, Photorefraction, Modulation, LCDs, Holograms, Beam splitters, Polarization
Opt. Eng. 34(5), (1 May 1995) doi:10.1117/12.199878
TOPICS: Speckle pattern, Speckle, Metals, Light scattering, Skin, Particles, Polarization, Superposition, Cameras, Sensors
Yuri Troitski
Opt. Eng. 34(5), (1 May 1995) doi:10.1117/12.199868
TOPICS: Mirrors, Radium, Rubidium, Interferometers, Reflectivity, Absorption, Dielectric mirrors, Mirror structures, Solids, Light sources
Lixiang Yuan, Zhengxiu Fan, Mingqi Cui, Shaojun Fu
Opt. Eng. 34(5), (1 May 1995) doi:10.1117/12.201632
TOPICS: Multilayers, X-rays, Etching, Ions, Diffraction gratings, Phase modulation, Thin films, Scanning electron microscopy, Transmission electron microscopy, Sensors
Thomas Markert, Claude Canizares, Christie Nelson, James Bauer, Bernard Puc, Bruce Woodgate
Opt. Eng. 34(5), (1 May 1995) doi:10.1117/12.183992
TOPICS: Crystals, X-rays, Spectroscopy, Sensors, X-ray optics, Spectral resolution, Laser crystals, Positron emission tomography, Laser induced fluorescence, Silicon
Opt. Eng. 34(5), (1 May 1995) doi:10.1117/12.201620
TOPICS: Free electron lasers, Laser applications, Laser ablation, Biomedical optics, Pulsed laser operation, Optical parametric oscillators, Optics, Picosecond phenomena, Proteins, Tissues
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