Optical Engineering
VOL. 34 · NO. 6 | June 1995
CONTENTS
IN THIS ISSUE

Articles (44)
Articles
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.210266
TOPICS: Optical engineering, Roads, Stress analysis, Optics, Image processing, Electrical engineering, Systems engineering, Brain, Nonlinear optics, Computer engineering
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.210267
TOPICS: Polarization, Polarimetry, Optical components, Physics, Polarization analysis, Optical design, Infrared radiation, Analytical research, Wave plates, Scattering
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203086
TOPICS: Modulation, Optical components, Modulators, Polarization, Antireflective coatings, Photoelastic modulators, Sensors, Light sources, Signal detection, Destructive interference
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.202063
TOPICS: Mirrors, Vacuum ultraviolet, Dielectric polarization, Erbium, Reflection, Gold, Polarizers, Metals, Ultraviolet radiation, Phase shifts
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.206161
TOPICS: Polarization, Polarimetry, Wave plates, Charge-coupled devices, Point spread functions, Polarizers, Imaging systems, Sensors, Beam splitters, Modulation
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.202070
TOPICS: Polarizers, Silver, Glasses, Polymers, Beam splitters, Polarization, Polarimetry, Charge-coupled devices, Calcite, Transmittance
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.202079
TOPICS: Wave plates, Quartz, Polarization, Crystals, Geometrical optics, Polarimetry, Polarizers, Signal detection, Magnesium fluoride, Error analysis
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203082
TOPICS: Magnetism, Birefringence, Polarimetry, Dichroic materials, Temperature metrology, Particles, Laser sources, Liquids, Wave plates, Modulation
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.202106
TOPICS: Modulators, Polarimetry, Electro optics, Polarization, Birefringence, Polarizers, Wave plates, Refraction, Spectroscopy, Modulation
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.202109
TOPICS: Light scattering, Polarization, Mirrors, Scattering, Polarimetry, Wave plates, Mueller matrices, Scatter measurement, Diamond, Solids
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.202062
TOPICS: Matrices, Scattering, Polarization, Backscatter, Polarimetry, Particles, Multiple scattering, Clouds, Calibration, Jones matrices
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.202060
TOPICS: Dielectrics, Light scattering, Scattering, Backscatter, Interfaces, Dielectric polarization, Glasses, Photoresist materials, Retroreflectors, Reflection
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.202080
TOPICS: Birefringence, Dichroic materials, Polarization, Data modeling, Matrices, Single mode fibers, Optical fibers, Polarimetry, Systems modeling, Refraction
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.202061
TOPICS: Polarization, Ray tracing, Matrices, Jones vectors, Calculus, Wavefronts, Wavefront aberrations, Geometrical optics, Point spread functions, Polarimetry
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.202105
TOPICS: Bidirectional reflectance transmission function, Scattering, Reflectivity, Polarization, Radiative transfer, Solids, Matrices, Electromagnetic scattering, Optical sensors, 3D modeling
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.202093
TOPICS: Condition numbers, Polarimetry, Error analysis, Polarization, Linear polarizers, Sensors, Optical components, Polarizers, Wave plates, Light scattering
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.202098
TOPICS: Polarimetry, Linear polarizers, Condition numbers, Optical components, Polarizers, Optical spheres, Aerospace engineering, Polarization analysis, Selenium, Sensors
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.202075
TOPICS: Polarization, Liquid crystals, Magnetism, Charge-coupled devices, Ferroelectric LCDs, Polarimetry, Telescopes, Modulation, Imaging systems, Doppler effect
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.202088
TOPICS: Polarization, Fiber optics, Calibration, Polarimetry, Beam splitters, Transformers, Sensors, Polarizers, Wave plates, Fiber optics sensors
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203088
TOPICS: Spatial light modulators, Error analysis, Phase shift keying, Optical correlators, Electronic filtering, Phase only filters, Optical filters, Diffraction, Performance modeling, Image filtering
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.201641
TOPICS: Bessel beams, Spherical lenses, Bessel functions, Imaging systems, Beam propagation method, Nondiffracting beams, Wave propagation, Diffraction, Wave propagation interference, Computer simulations
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203138
TOPICS: Waveguides, Refractive index, Cladding, Channel waveguides, Finite element methods, Channel projecting optics, Chemical elements, Wave propagation, Magnetism, Integrated optics
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203112
TOPICS: Chemical species, Fourier transforms, Chemical elements, Reconstruction algorithms, Matrices, Modulation, Vector spaces, Wavelets, MATLAB, Mathematics
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203134
TOPICS: Image compression, Fractal analysis, Distance measurement, Image quality, Image processing, Iterated function systems, Image enhancement, Digital imaging, Vector spaces, Computer science
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203128
TOPICS: RGB color model, Image compression, Data modeling, Composites, Computer programming, Switching, Performance modeling, Image transmission, Algorithm development, Data compression
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203101
TOPICS: Detection and tracking algorithms, Image processing, Binary data, Corner detection, Submerged target modeling, Standards development, Computer science, Mathematical morphology, Image filtering, Optical components
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203116
TOPICS: Reflectors, Rubidium, Reflector design, Differential equations, Light sources and illumination, Manufacturing, Reflectivity, Nonimaging optics, Geometrical optics, Illumination engineering
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203087
TOPICS: Crystals, Raman spectroscopy, Barium, Nonlinear crystals, Infrared radiation, Physics, Space operations, Molecules, Laser crystals, Analytical research
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203102
TOPICS: Turbulence, Atmospheric modeling, Satellites, Radiometry, Mirrors, Aerosols, Data modeling, Refractive index, Atmospheric optics, Water
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203117
TOPICS: Data modeling, Bidirectional reflectance transmission function, Reflection, Scattering, Polarization, Reflectivity, Metals, Radiation thermometry, Solids, Light scattering
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203125
TOPICS: Image classification, Pattern recognition, Surface roughness, Light scattering, Feature extraction, Computer simulations, Probability theory, Machine learning, Classification systems, Library classification systems
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203111
TOPICS: Reflectivity, Gallium arsenide, Oxides, Contrast transfer function, Thin films, Reflectance spectroscopy, Refractive index, Silicon, Glasses, Data modeling
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203115
TOPICS: Prisms, Switches, Polarization, Switching, Modulation, Mirrors, Collimation, Pulsed laser operation, GRIN lenses, Laser scanners
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203137
TOPICS: Silicon, Silicon films, Thin films, Semiconducting wafers, Multilayers, Temperature metrology, Radiation effects, Wafer-level optics, Absorption, Oxides
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203114
TOPICS: Semiconducting wafers, Coating, Glasses, Silicon, Video, Cameras, Metals, Infrared imaging, Infrared radiation, Infrared cameras
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203132
TOPICS: Fourier transforms, Image segmentation, Computer programming, Image processing, Detection and tracking algorithms, Video, Error analysis, Sensors, 3D image processing, Spatial frequencies
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203113
TOPICS: Modulation transfer functions, Atmospheric particles, Atmospheric modeling, Filtering (signal processing), Turbulence, Spatial frequencies, Aerosols, Atmospheric optics, Point spread functions, Image restoration
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203133
TOPICS: Modulation transfer functions, Cameras, Infrared cameras, Spatial frequencies, Imaging systems, Optical filters, Collimators, Fourier transforms, Optical transfer functions, Image processing
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203135
TOPICS: Fourier transforms, Coherence imaging, Zone plates, Near field diffraction, Point spread functions, Image transmission, Diffraction, Tantalum, Convolution, Coherence (optics)
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203091
TOPICS: Zoom lenses, Lenses, Optical components, Complex systems, Roads, Electro-optical engineering, Tantalum, Control systems, Lithium, Electro optical systems
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.207324
TOPICS: Speckle, Phototransistors, Diffusers, Photodetectors, Transistors, Speckle pattern, Stochastic processes, Integrated circuits, Solids, Very large scale integration
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.207325
TOPICS: Mirrors, Reflectivity, Fabry–Perot interferometers, Modulation, Reflection, Silica, Semiconductor lasers, Near field, Phase shifts, Pulsed laser operation
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