optical engineering
VOL. 34 · NO. 6 | June 1995

Articles (42)
Articles (2)
Brian Thompson
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.210266
TOPICS: Optical engineering, Roads, Stress analysis, Optics, Image processing, Electrical engineering, Systems engineering, Brain, Nonlinear optics, Computer engineering
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.210267
TOPICS: Polarization, Polarimetry, Optical components, Physics, Polarization analysis, Optical design, Infrared radiation, Analytical research, Wave plates, Scattering
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203086
TOPICS: Modulation, Optical components, Modulators, Polarization, Antireflective coatings, Photoelastic modulators, Sensors, Light sources, Signal detection, Destructive interference
Ayman Kan'an, Rasheed Azzam
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.202063
TOPICS: Mirrors, Vacuum ultraviolet, Dielectric polarization, Erbium, Reflection, Gold, Polarizers, Metals, Ultraviolet radiation, Phase shifts
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.206161
TOPICS: Polarization, Polarimetry, Wave plates, Charge-coupled devices, Point spread functions, Polarizers, Imaging systems, Sensors, Beam splitters, Modulation
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.202070
TOPICS: Polarizers, Silver, Glasses, Polymers, Beam splitters, Polarization, Polarimetry, Charge-coupled devices, Calcite, Transmittance
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.202079
TOPICS: Wave plates, Quartz, Polarization, Crystals, Geometrical optics, Polarimetry, Polarizers, Signal detection, Magnesium fluoride, Error analysis
Pierre-Yves Gerligand, Bernard Le Jeune, Jack Cariou, Jean Lotrian
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203082
TOPICS: Magnetism, Birefringence, Polarimetry, Dichroic materials, Temperature metrology, Particles, Laser sources, Liquids, Wave plates, Modulation
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.202106
TOPICS: Modulators, Polarimetry, Electro optics, Polarization, Birefringence, Polarizers, Wave plates, Refraction, Spectroscopy, Modulation
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.202109
TOPICS: Light scattering, Polarization, Mirrors, Scattering, Polarimetry, Wave plates, Mueller matrices, Scatter measurement, Diamond, Solids
Shane Cloude, Eric Pottier
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.202062
TOPICS: Matrices, Scattering, Polarization, Backscatter, Polarimetry, Particles, Multiple scattering, Clouds, Calibration, Jones matrices
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.202060
TOPICS: Dielectrics, Light scattering, Scattering, Backscatter, Interfaces, Dielectric polarization, Glasses, Photoresist materials, Retroreflectors, Reflection
Charles Brown, Aakhut Bak
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.202080
TOPICS: Birefringence, Dichroic materials, Polarization, Data modeling, Matrices, Single mode fibers, Optical fibers, Polarimetry, Systems modeling, Refraction
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.202061
TOPICS: Polarization, Ray tracing, Matrices, Jones vectors, Calculus, Wavefronts, Wavefront aberrations, Geometrical optics, Point spread functions, Polarimetry
David Flynn, Cliff Alexander
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.202105
TOPICS: Bidirectional reflectance transmission function, Scattering, Reflectivity, Polarization, Radiative transfer, Solids, Matrices, Electromagnetic scattering, Optical sensors, 3D modeling
Amrit Ambirajan, Dwight Look
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.202093
TOPICS: Condition numbers, Polarimetry, Error analysis, Polarization, Linear polarizers, Sensors, Optical components, Polarizers, Wave plates, Light scattering
Amrit Ambirajan, Dwight Look
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.202098
TOPICS: Polarimetry, Linear polarizers, Condition numbers, Optical components, Polarizers, Optical spheres, Aerospace engineering, Polarization analysis, Selenium, Sensors
Laurence November, Lawrence Wilkins
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.202075
TOPICS: Polarization, Liquid crystals, Magnetism, Charge-coupled devices, Ferroelectric LCDs, Polarimetry, Telescopes, Modulation, Imaging systems, Doppler effect
Bernhard Scholl, Thomas Stein, Arndt Neues, Konrad Mertens
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.202088
TOPICS: Polarization, Fiber optics, Calibration, Polarimetry, Beam splitters, Transformers, Sensors, Polarizers, Wave plates, Fiber optics sensors
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203088
TOPICS: Spatial light modulators, Error analysis, Phase shift keying, Optical correlators, Electronic filtering, Phase only filters, Optical filters, Diffraction, Performance modeling, Image filtering
Zdenek Bouchal, Jaroslav Wagner, Marek Olivik
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.201641
TOPICS: Bessel beams, Spherical lenses, Bessel functions, Imaging systems, Beam propagation method, Nondiffracting beams, Wave propagation, Diffraction, Wave propagation interference, Computer simulations
Tiziana Conese-Bond, Giovanni Barbarossa, Mario Armenise
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203138
TOPICS: Waveguides, Refractive index, Cladding, Channel waveguides, Finite element methods, Channel projecting optics, Chemical elements, Wave propagation, Magnetism, Integrated optics
Hans Feichtinger, Thomas Strohmer, Ole Christensen
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203112
TOPICS: Chemical species, Fourier transforms, Chemical elements, Reconstruction algorithms, Matrices, Modulation, Vector spaces, Wavelets, MATLAB, Mathematics
Behnam Bani-Eqbal
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203134
TOPICS: Image compression, Fractal analysis, Distance measurement, Image quality, Image processing, Iterated function systems, Image enhancement, Digital imaging, Vector spaces, Computer science
Nasir Memon, Khalid Sayood
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203128
TOPICS: RGB color model, Image compression, Data modeling, Composites, Computer programming, Switching, Performance modeling, Image transmission, Algorithm development, Data compression
Prabir Bhattacharya, Weibin Zhu, Kai Qian
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203101
TOPICS: Detection and tracking algorithms, Image processing, Binary data, Corner detection, Submerged target modeling, Standards development, Computer science, Mathematical morphology, Image filtering, Optical components
Pang Ong, Jeffrey Gordon, Ari Rabl, Wen Cai
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203116
TOPICS: Reflectors, Rubidium, Reflector design, Differential equations, Light sources and illumination, Manufacturing, Reflectivity, Nonimaging optics, Geometrical optics, Illumination engineering
Shui-Li Hong, Bo-Chang Wu
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203087
TOPICS: Crystals, Raman spectroscopy, Barium, Nonlinear crystals, Infrared radiation, Physics, Space operations, Molecules, Laser crystals, Analytical research
David Nahrstedt, Timothy Brinkley
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203102
TOPICS: Turbulence, Atmospheric modeling, Satellites, Radiometry, Mirrors, Aerosols, Data modeling, Refractive index, Atmospheric optics, Water
John Burnell, John Nicholas, D. Rod White
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203117
TOPICS: Data modeling, Bidirectional reflectance transmission function, Reflection, Scattering, Polarization, Reflectivity, Metals, Radiation thermometry, Solids, Light scattering
Wei Shi, Siak-Piang Lim, Kim Seng Lee
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203125
TOPICS: Image classification, Pattern recognition, Surface roughness, Light scattering, Feature extraction, Computer simulations, Probability theory, Machine learning, Classification systems, Library classification systems
Ivan Ohlidal, Frantisek Vizd'a, Miloslav Ohlidal
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203111
TOPICS: Reflectivity, Gallium arsenide, Oxides, Contrast transfer function, Thin films, Reflectance spectroscopy, Refractive index, Silicon, Glasses, Data modeling
Masao Shimoji
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203115
TOPICS: Prisms, Switches, Polarization, Switching, Modulation, Mirrors, Collimation, Pulsed laser operation, GRIN lenses, Laser scanners
Peter Wong, Christopher Hess, Ioannis Miaoulis
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203137
TOPICS: Silicon, Silicon films, Thin films, Semiconducting wafers, Multilayers, Temperature metrology, Radiation effects, Wafer-level optics, Absorption, Oxides
Dunbar Birnie, Brian Zelinski, David Perry
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203114
TOPICS: Semiconducting wafers, Coating, Glasses, Silicon, Video, Cameras, Metals, Infrared imaging, Infrared radiation, Infrared cameras
Denis Laurin, Marc Rioux
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203132
TOPICS: Fourier transforms, Image segmentation, Computer programming, Image processing, Detection and tracking algorithms, Video, Error analysis, Sensors, 3D image processing, Spatial frequencies
Dan Sadot, Arnon Rosenfeld, Gil Shuker, Norman Kopeika
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203113
TOPICS: Modulation transfer functions, Atmospheric particles, Atmospheric modeling, Filtering (signal processing), Turbulence, Spatial frequencies, Aerosols, Atmospheric optics, Point spread functions, Image restoration
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203133
TOPICS: Modulation transfer functions, Cameras, Infrared cameras, Spatial frequencies, Imaging systems, Optical filters, Collimators, Fourier transforms, Optical transfer functions, Image processing
Gary Waldman, John Wootton, David Holder
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203135
TOPICS: Fourier transforms, Coherence imaging, Zone plates, Near field diffraction, Point spread functions, Image transmission, Diffraction, Tantalum, Convolution, Coherence (optics)
Mau-Shiun Yeh, Shin-Guo Shiue, Mao-Hong Lu
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.203091
TOPICS: Zoom lenses, Lenses, Optical components, Complex systems, Roads, Electro-optical engineering, Tantalum, Control systems, Lithium, Electro optical systems
Philippe Lalanne, Eric Belhaire, Jean-Claude Rodier, Antoine Dupret, Patrick Garda, Pierre Chavel
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.207324
TOPICS: Speckle, Phototransistors, Diffusers, Photodetectors, Transistors, Speckle pattern, Stochastic processes, Integrated circuits, Solids, Very large scale integration
Opt. Eng. 34(6), (1 June 1995) https://doi.org/10.1117/12.207325
TOPICS: Mirrors, Reflectivity, Fabry–Perot interferometers, Modulation, Reflection, Silica, Semiconductor lasers, Near field, Phase shifts, Pulsed laser operation
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