PLZT modulator characterization

Dennis H. Goldstein

doi:10.1117/12.202106

1 June 1995 PLZT modulator characterization

Dennis H. Goldstein

Author Affiliations +

Optical Engineering, Vol. 34, Issue 6, (June 1995). https://doi.org/10.1117/12.202106

Abstract

A commercial PLZT modulator is characterized at wavelengths from 0.6328 μm to the limits of its IR transmission around 9 μm. Laser polarimetry and IR spectropolárimetry are the characterization techniques used. Polarization measurement results include diattenuation and retardation. The PLZT modulator is found to be an electrically controllable polarizer as well as an electrically controllable retarder.

Citation Download Citation

Dennis H. Goldstein "PLZT modulator characterization," Optical Engineering 34(6), (1 June 1995). https://doi.org/10.1117/12.202106

Published: 1 June 1995

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available