optical engineering
VOL. 34 · NO. 10 | October 1995
CONTENTS
IN THIS ISSUE

Articles (36)
Articles
Brian Thompson
Opt. Eng. 34(10), (1 October 1995) https://doi.org/10.1117/12.222872
TOPICS: Applied physics, Optical engineering, Roads, Electrical engineering, Image processing, Diffusion, Ophthalmic optics, Nomenclature, Optical communications
Tomas Milster, Cynthia Vernold
Opt. Eng. 34(10), (1 October 1995) https://doi.org/10.1117/12.210764
TOPICS: Modulation, Phase shift keying, Fringe analysis, Diffraction gratings, Optical alignment, Objectives, Monochromatic aberrations, Diffraction, CCD cameras, Computer generated holography
Israel Tugendhaft, Aharon Bornstein, Yitzhak Weissman, Amos Hardy
Opt. Eng. 34(10), (1 October 1995) https://doi.org/10.1117/12.210769
TOPICS: Optical fibers, Multimode fibers, Mid-IR, Chalcogenide glass, Fiber optics, Fiber couplers, Refraction, Sensors, Cladding, Distance measurement
Opt. Eng. 34(10), (1 October 1995) https://doi.org/10.1117/12.210740
TOPICS: Scattering, Doppler effect, Laser scattering, Speckle, Gaussian beams, Blood, Lymphatic system, Capillaries, Blood circulation, Diffraction
Cassie Lofts, Paul Ruffin, Mike Parker, Chi Sung
Opt. Eng. 34(10), (1 October 1995) https://doi.org/10.1117/12.210771
TOPICS: Thermal effects, Gyroscopes, Temperature metrology, Thermal sensing, Fiber optic gyroscopes, Solids, Optical sensing, Interferometry, Polarization maintaining fibers, Thermal modeling
Dietmar Uttenweiler, Reinhold Wojciechowski, Makoto Makabe, Claudia Veigel, Rainer Fink
Opt. Eng. 34(10), (1 October 1995) https://doi.org/10.1117/12.210736
TOPICS: Calcium, Imaging systems, Luminescence, Mirrors, Image filtering, Spatial resolution, Ions, Cameras, Image acquisition, CCD cameras
Sigang Qiu
Opt. Eng. 34(10), (1 October 1995) https://doi.org/10.1117/12.210731
TOPICS: Wavelets, Matrices, Transform theory, Fourier transforms, Reconstruction algorithms, Information operations, Mathematics, Roads, Optical engineering, Time-frequency analysis
Opt. Eng. 34(10), (1 October 1995) https://doi.org/10.1117/12.210739
TOPICS: Refractive index, Diffraction gratings, Polarization, Diffraction, Birefringence, Holography, Prisms, Holograms, Mirrors, Reflectivity
Eduardo Tepichin-Rodriguez, Jose Suarez-Romero, Gustavo Ramirez Zabaleta
Opt. Eng. 34(10), (1 October 1995) https://doi.org/10.1117/12.210744
TOPICS: Holography, Holograms, Diffraction, Diffraction gratings, Polarization, Mirrors, 3D image reconstruction, Spatial filters, Visibility, Astrophysics
Qiang Huang, John Gilbert
Opt. Eng. 34(10), (1 October 1995) https://doi.org/10.1117/12.210766
TOPICS: Holograms, Diffraction, Volume holography, Holography, Waveguides, 3D image reconstruction, Solids, Visual optics, Nondestructive evaluation, Wave propagation
Opt. Eng. 34(10), (1 October 1995) https://doi.org/10.1117/12.210756
TOPICS: Mirrors, Bragg cells, Acoustics, Holography, Scanners, Eye, Holograms, Electrodes, Image segmentation, Transducers
Sheng Zhong, Francis Chin, Qing-Yun Shi
Opt. Eng. 34(10), (1 October 1995) https://doi.org/10.1117/12.210738
TOPICS: Computer programming, Image compression, Quantization, Distortion, Image quality, Image processing, Computer science, Receivers, Digital imaging, Mathematics
YihChuan Lin, Shen-Chuan Tai
Opt. Eng. 34(10), (1 October 1995) https://doi.org/10.1117/12.210743
TOPICS: Distortion, Quantization, Computer programming, Image quality, Image compression, Dimension reduction, Medical imaging, Bridges, Angiography, Signal to noise ratio
Opt. Eng. 34(10), (1 October 1995) https://doi.org/10.1117/12.210745
TOPICS: Calibration, Neural networks, Transmittance, Near infrared, Data modeling, Proteins, Inspection, Library classification systems, Statistical modeling, Nondestructive evaluation
Ruikang Wang, Christopher Chatwin, Lin Shang
Opt. Eng. 34(10), (1 October 1995) https://doi.org/10.1117/12.210732
TOPICS: Joint transforms, Optical correlators, Binary data, Distortion, Fourier transforms, Spatial light modulators, Image filtering, Complex systems, Optical filters, Charge-coupled devices
Zou Mou-yan, Rolf Unbehauen
Opt. Eng. 34(10), (1 October 1995) https://doi.org/10.1117/12.210741
TOPICS: Deconvolution, Filtering (signal processing), Signal to noise ratio, Electronic filtering, Image restoration, Astronomy, Error analysis, Matrices, Convolution, Fourier transforms
Opt. Eng. 34(10), (1 October 1995) https://doi.org/10.1117/12.210750
TOPICS: Phase conjugation, Fizeau interferometers, Glasses, Lenses, Mirrors, Interferometers, Phase measurement, Wave plates, Computer simulations, CCD image sensors
Martin Pechersky, Robert Miller, Chandra Vikram
Opt. Eng. 34(10), (1 October 1995) https://doi.org/10.1117/12.210762
TOPICS: Laser interferometry, Interferometry, Interferometers, Fringe analysis, Computer simulations, Speckle, Finite element methods, Temperature metrology, Speckle pattern, Heat treatments
Opt. Eng. 34(10), (1 October 1995) https://doi.org/10.1117/12.210737
TOPICS: Interferometers, Mirrors, Objectives, Spherical lenses, Reflection, Wavefronts, Zoom lenses, Spatial coherence, Temporal coherence, Optical spheres
Opt. Eng. 34(10), (1 October 1995) https://doi.org/10.1117/12.210747
TOPICS: Laser welding, Laser processing, Carbon dioxide lasers, Thulium, Temperature metrology, Absorption, Terbium, Pulsed laser operation, Laser applications, Standards development
Yan Liao, Huijuan He, Yongchun Li, Shengru Gu, ZhiJiang Wang
Opt. Eng. 34(10), (1 October 1995) https://doi.org/10.1117/12.210763
TOPICS: Resonators, Solid state lasers, Quantum cascade lasers, Nd:YAG lasers, Laser resonators, Lenses, Mechanics, Thermal effects, Output couplers, Quantum efficiency
Hartmut Hillmer, Stefan Hansmann, Herbert Burkhard
Opt. Eng. 34(10), (1 October 1995) https://doi.org/10.1117/12.210767
TOPICS: Pulsed laser operation, Modulation, Data modeling, Phase shifts, Refractive index, Quantum wells, Reflectivity, Hole burning spectroscopy, Laser damage threshold, Semiconducting wafers
Haiyin Sun, Steve Menhart, Alois Adams
Opt. Eng. 34(10), (1 October 1995) https://doi.org/10.1117/12.210752
TOPICS: Diffraction gratings, Stereolithography, Wavelength tuning, Diffraction, Mirrors, Semiconductor lasers, Photodiodes, Calibration, Monochromators, Diodes
Haiming Wang, Sofia Acosta-Ortiz
Opt. Eng. 34(10), (1 October 1995) https://doi.org/10.1117/12.210761
TOPICS: Diffraction, Scanning electron microscopy, Optical discs, Inspection, Diffraction gratings, Statistical analysis, Laser beam diagnostics, Solids, Optical storage, Integrated optics
Christopher Wright, Jing Zhao, Nicholas Heyes, Warwick Clegg
Opt. Eng. 34(10), (1 October 1995) https://doi.org/10.1117/12.210753
TOPICS: Confocal microscopy, Sensors, Signal detection, Optical storage, Optical discs, Photodiodes, Optical recording, Objectives, Signal to noise ratio, Optical microscopes
Opt. Eng. 34(10), (1 October 1995) https://doi.org/10.1117/12.210765
TOPICS: Absorption, Refractive index, Metals, Cladding, Waveguides, Wave propagation, Dielectrics, Oxides, Dielectric filters, Optoelectronics
Marcelo Algrain, Douglas Ehlers
Opt. Eng. 34(10), (1 October 1995) https://doi.org/10.1117/12.210754
TOPICS: Gyroscopes, Filtering (signal processing), Electronic filtering, Complex systems, Error analysis, Velocity measurements, Motion estimation, Motion measurement, Control systems, Nonlinear filtering
Chun Ye
Opt. Eng. 34(10), (1 October 1995) https://doi.org/10.1117/12.210734
TOPICS: Wave plates, Modulators, Polarization, Optical components, Liquid crystals, Polarizers, Geometrical optics, Electrooptic modulators, Polarimetry, Optics manufacturing
Mehrdad Nikoonahad, Philip Rigg, Moe Sondossi, Keith Wells, Brian Leslie
Opt. Eng. 34(10), (1 October 1995) https://doi.org/10.1117/12.210749
TOPICS: Semiconducting wafers, Signal detection, Laser scanners, Reflectivity, Sensors, Ferroelectric materials, Inspection, Wafer inspection, Scattering, Laser scattering
Dinghai Zou, Shenghua Ye, Chunhe Wang
Opt. Eng. 34(10), (1 October 1995) https://doi.org/10.1117/12.210742
TOPICS: Sensors, Calibration, Sensor calibration, Image processing, Cameras, Projection systems, Machine vision, Computer vision technology, Image sensors, Inspection
Simon Godber, Max Robinson, J. Paul Evans
Opt. Eng. 34(10), (1 October 1995) https://doi.org/10.1117/12.210746
TOPICS: Line scan image sensors, Sensors, Cameras, Imaging systems, Algorithm development, Mathematical modeling, Calibration, 3D modeling, Image processing, Stereoscopic cameras
Zhiqiang Zhao, W. Lau, Albert Choi, Y. Shan
Opt. Eng. 34(10), (1 October 1995) https://doi.org/10.1117/12.210759
TOPICS: Modulation, Sensors, Fiber optics sensors, Reflectivity, Rubidium, Numerical integration, Information technology, Reflection, Light, Promethium
Ofer Hadar, A. Kuntsevitsky, M. Wasserblat, Norman Kopeika, Stanley Rotman
Opt. Eng. 34(10), (1 October 1995) https://doi.org/10.1117/12.210733
TOPICS: Image segmentation, Automatic target recognition, Image processing, Target detection, Modulation transfer functions, Sensors, Field effect transistors, Image restoration, Image quality, Fractal analysis
Ningfang Liao, Hua Zeng, Fengxiang Bai, Heling Shan, Weiping Yang, Jiangang Xiao, Hongfei Yu, Junsheng Shi
Opt. Eng. 34(10), (1 October 1995) https://doi.org/10.1117/12.210735
TOPICS: Spectrophotometry, Light sources, Lamps, Systems modeling, Instrument modeling, Channel projecting optics, Charge-coupled devices, Spectral models, Xenon, CCD image sensors
Rung-Ywan Tsai, Mu-Yi Hua, Fang Ho
Opt. Eng. 34(10), (1 October 1995) https://doi.org/10.1117/12.210748
TOPICS: Composites, Magnesium fluoride, Crystals, Transmission electron microscopy, Diffraction, Glasses, Solids, Photomicroscopy, Ions, X-rays
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