optical engineering
VOL. 35 · NO. 2 | February 1996
CONTENTS
IN THIS ISSUE

Articles (41)
Articles
Brian Thompson
Opt. Eng. 35(2), (1 February 1996) doi:10.1117/1.600946
William Miceli, Xiangyang Yang
Opt. Eng. 35(2), (1 February 1996) doi:10.1117/1.600944
Haizhang Li, Xiaodan Li, Manfred Grindel, Peter Takacs
Opt. Eng. 35(2), (1 February 1996) doi:10.1117/1.600900
TOPICS: Mirrors, X-ray telescopes, Laser beam diagnostics, Space telescopes, Telescopes, Surface finishing, X-ray optics, Prisms, Prototyping, Head
Opt. Eng. 35(2), (1 February 1996) doi:10.1117/1.600901
TOPICS: Monochromatic aberrations, Mirrors, Aspheric lenses, Objectives, Aspheric optics, Microscopes, Optical engineering, Wavefronts, Optical spheres, Beam splitters
Opt. Eng. 35(2), (1 February 1996) doi:10.1117/1.600902
TOPICS: Image segmentation, Spherical lenses, Cameras, Inspection, Image processing, Reflectivity, Light sources and illumination, Optical engineering, Imaging systems, Signal processing
Opt. Eng. 35(2), (1 February 1996) doi:10.1117/1.600903
TOPICS: Monochromatic aberrations, Transmittance, Point diffraction interferometers, Point spread functions, Wavefronts, Systems modeling, Gold, Optical engineering, Diffraction, Optical testing
Vladimir Manasson, Lev Sadovnik, Paul Shnitser, Robert Mino, John Kruger
Opt. Eng. 35(2), (1 February 1996) doi:10.1117/1.600904
TOPICS: Antennas, Extremely high frequency, Plasma, Diffraction, Diffraction gratings, Silicon, Semiconductors, Lamps, Diffusion, Refractive index
Zu-Han Gu, Richard Dummer, Jun Lu, Paul McKenna
Opt. Eng. 35(2), (1 February 1996) doi:10.1117/1.600905
TOPICS: LIDAR, Backscatter, Reflectivity, Data modeling, Dielectrics, Sensors, Scattering, Metals, Light scattering, Dielectric polarization
Zu-Han Gu, Michel Josse, Mikael Ciftan
Opt. Eng. 35(2), (1 February 1996) doi:10.1117/1.600906
TOPICS: Backscatter, Dielectrics, Light scattering, Scattering, Metals, Dielectric polarization, Retroreflectors, Aluminum, Sensors, Mirrors
Opt. Eng. 35(2), (1 February 1996) doi:10.1117/1.601023
TOPICS: Cameras, 3D image processing, Stereoscopic cameras, 3D acquisition, Imaging systems, Image processing, CCD cameras, Optical filters, Linear filtering, 3D vision
Opt. Eng. 35(2), (1 February 1996) doi:10.1117/1.600907
TOPICS: Stars, Cameras, CCD cameras, Telescopes, Observatories, Charge-coupled devices, Calibration, Tolerancing, Detection and tracking algorithms, Optical engineering
Hui Henry Li, Yi-Tong Zhou
Opt. Eng. 35(2), (1 February 1996) doi:10.1117/1.600908
TOPICS: Image registration, Visualization, Image visualization, Image sensors, Infrared imaging, Feature extraction, Sensors, Image processing, Wavelets, Optical engineering
William Franklin
Opt. Eng. 35(2), (1 February 1996) doi:10.1117/1.600909
TOPICS: Image processing, Signal processing, Optical signal processing, Fourier transforms, Radar, Sensors, Radar signal processing, Transducers, Doppler effect, Phase shifts
Luzhong Cai, Yahong Jin, Shaomin Zhou, Pochi Yeh, Neville Marzwell, Hua-Kuang Liu
Opt. Eng. 35(2), (1 February 1996) doi:10.1117/1.600910
TOPICS: Optical correlators, Fingerprint recognition, Optical engineering, Sensors, Diffraction, Fourier transforms, Optical filters, Image filtering, Tolerancing, Computing systems
Lev Sadovnik, Alexander Rizkin, Oleg Rashkovskiy, Alexander Sawchuk
Opt. Eng. 35(2), (1 February 1996) doi:10.1117/1.600899
TOPICS: Image processing, Diffraction, Phase shift keying, Distance measurement, Target recognition, Optically addressed spatial light modulators, Diffraction gratings, Photoresist materials, Phase modulation, Automatic target recognition
Xiao Jing Lu, Charles Wrigley, Don Gregory
Opt. Eng. 35(2), (1 February 1996) doi:10.1117/1.600911
TOPICS: Optical correlators, Spatial light modulators, Charge-coupled devices, Optical filters, Joint transforms, Fourier transforms, Image filtering, Optical engineering, Optical design, Missiles
Peter Guilfoyle, David McCallum
Opt. Eng. 35(2), (1 February 1996) doi:10.1117/1.600912
TOPICS: Sensors, Switches, Optoelectronics, Vertical cavity surface emitting lasers, Spatial light modulators, Logic, Optical components, Logic devices, Silicon, Optical interconnects
Ryszard Burzynski, Martin Casstevens, Yue Zhang, Saswati Ghosal
Opt. Eng. 35(2), (1 February 1996) doi:10.1117/1.600913
TOPICS: Composites, Chromophores, Nonlinear optics, Molecules, Polymers, Waveguides, Sol-gels, Electro optics, Crystals, Data storage
Xiangyang Yang, Zu-Han Gu
Opt. Eng. 35(2), (1 February 1996) doi:10.1117/1.600914
TOPICS: Multiplexing, 3D optical data storage, Data storage, Holograms, Optical storage, Holography, Crystals, Laser crystals, Phase shift keying, Modulators
Lup Loh, Joseph LoCicero
Opt. Eng. 35(2), (1 February 1996) doi:10.1117/1.600915
TOPICS: Clocks, Binary data, Computer programming, Logic, Switching, Diodes, Beam splitters, Quantization, Picosecond phenomena, Free space optics
Lixiang Yuan, Zhengxiu Fan, Runwen Wang
Opt. Eng. 35(2), (1 February 1996) doi:10.1117/1.600916
TOPICS: Diffraction, Diffraction gratings, Sensors, Multilayers, Geometrical optics, Reflectivity, X-ray optics, X-rays, X-ray diffraction, Molybdenum
Nisha Biswas, Samir Sarkar, Amitabha Basuray
Opt. Eng. 35(2), (1 February 1996) doi:10.1117/1.600917
TOPICS: Refractive index, Glasses, GRIN lenses, Silver, Ions, Optical engineering, Ceramics, Photography, Spherical lenses, Fringe analysis
Aner Lev, Boris Khanokh, Meir Nitzan
Opt. Eng. 35(2), (1 February 1996) doi:10.1117/1.600918
TOPICS: Skin, Temperature metrology, Infrared radiation, Radiometry, Thermography, Blood circulation, Heart, Black bodies, Tissues, Thermometry
Yun Woo Lee, Hyun-Mo Cho, In Won Lee
Opt. Eng. 35(2), (1 February 1996) doi:10.1117/1.600919
TOPICS: Mirrors, Shearing interferometers, Wavefronts, Collimation, Darmstadtium, Interferometry, Fringe analysis, Optical engineering, Error analysis, Molybdenum
Opt. Eng. 35(2), (1 February 1996) doi:10.1117/1.600897
TOPICS: Spatial frequencies, Instrumentation engineering, Optical engineering, Optical testing, Interferometers, Fizeau interferometers, Fourier transforms, Detector arrays, Applied physics, Optical instrument design
Marek Dobosz, Hirokazu Matsumoto, Shige Iwasaki
Opt. Eng. 35(2), (1 February 1996) doi:10.1117/1.600920
TOPICS: Interferometers, Interferometry, Mirrors, Beam splitters, Semiconductor lasers, Prisms, Reflectors, Calibration, Light sources, Metrology
Opt. Eng. 35(2), (1 February 1996) doi:10.1117/1.600921
TOPICS: Distance measurement, Feedback signals, Modulation, Interferometers, Phase interferometry, Semiconductor lasers, Phase shift keying, Interferometry, Error analysis, Phase measurement
Junbiao Zhu, Ming Wang, Zhijiang Wang, J. Lee
Opt. Eng. 35(2), (1 February 1996) doi:10.1117/1.600922
Duncan Hand, Daoning Su, Mohammed Naeem, Julian Jones
Opt. Eng. 35(2), (1 February 1996) doi:10.1117/1.600923
TOPICS: Nd:YAG lasers, Modulation, Beam delivery, Materials processing, Fiber optics, Near field, Speckle, Laser cutting, Near field optics, Fiber lasers
LiJiang Zeng, Hirokazu Matsumoto, Shigeru Sunada, Keiji Kawachi
Opt. Eng. 35(2), (1 February 1996) doi:10.1117/1.600924
TOPICS: Motion measurement, Acousto-optics, Position sensors, Beam shaping, Video, Spatial resolution, Laser beam diagnostics, Sensors, High speed cameras, Cameras
Mario Montes-Usategui, Juan Campos Rubio, Josue Sallent, Ignacio Juvells
Opt. Eng. 35(2), (1 February 1996) doi:10.1117/1.600925
TOPICS: Image filtering, Optical filters, Optical engineering, Signal to noise ratio, Fourier transforms, Detection and tracking algorithms, Digital filtering, Target detection, Optical correlators, Databases
Opt. Eng. 35(2), (1 February 1996) doi:10.1117/1.600926
TOPICS: Chaos, Optical components, Logic, Optical engineering, Computer programming, Complex systems, Nonlinear optics, Binary data, Control systems, Feedback signals
Palma Blonda, Vincenza la Forgia, Guido Pasquariello, Giuseppe Satalino
Opt. Eng. 35(2), (1 February 1996) doi:10.1117/1.600898
TOPICS: Classification systems, Neurons, Image classification, Feature extraction, Remote sensing, Neural networks, Data compression, Machine learning, Computer architecture, Computing systems
Phillip Stroud
Opt. Eng. 35(2), (1 February 1996) doi:10.1117/1.600927
TOPICS: Scintillation, Atmospheric propagation, Correlation function, Radio propagation, Atmospheric scintillation, Turbulence, Error analysis, Statistical analysis, Optical engineering, Atmospheric turbulence
Raja Holavanahalli, Gary Carter, Shabbir Bambot, Vadde Venkatesh, Vivek Srinivas
Opt. Eng. 35(2), (1 February 1996) doi:10.1117/1.601024
TOPICS: Signal to noise ratio, Phase measurement, Oxygen, Modulation, Luminescence, Light emitting diodes, Sensors, Interference (communication), Optical amplifiers, Phase shift keying
John Worden, Thomas Woods, Gary Rottman, Gerhard Schmidtke, Hongsheng Tai, Harry Doll, Stanley Solomon
Opt. Eng. 35(2), (1 February 1996) doi:10.1117/1.601037
TOPICS: Calibration, Extreme ultraviolet, Spectroscopy, Sensors, Airglow, Data modeling, Magnesium, Rockets, Satellites, Photons
Yuri Denisyuk, Nina Savostyanenko
Opt. Eng. 35(2), (1 February 1996) doi:10.1117/1.600928
TOPICS: 3D image reconstruction, Holograms, Diffraction gratings, 3D image processing, Photosensitive materials, Light, Transparency, Diffusers, Light scattering, Photography
Kenji Nagashima
Opt. Eng. 35(2), (1 February 1996) doi:10.1117/1.600929
TOPICS: Holograms, 3D image processing, 3D image reconstruction, 3D image enhancement, Computer generated holography, Fourier transforms, Image enhancement, Quantization, Image quality, Optical design
Opt. Eng. 35(2), (1 February 1996) doi:10.1117/1.600896
TOPICS: Scattering media, Tomography, Scattering, Light scattering, Reflectivity, Light sources, Holography, Image processing, Image enhancement, Continuous wave operation
Mark Reeves, Colin Garner, John Dent, Neil Halliwell
Opt. Eng. 35(2), (1 February 1996) doi:10.1117/1.601025
TOPICS: Particles, Particle image velocimetry, Velocity measurements, Cameras, Photography, Glasses, Combustion, Head, Motion measurement, Pulsed laser operation
Opt. Eng. 35(2), (1 February 1996) doi:10.1117/1.600943
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