optical engineering
VOL. 35 · NO. 10 | October 1996
CONTENTS
IN THIS ISSUE

Articles (41)
Articles
Brian Thompson
Opt. Eng. 35(10), (1 October 1996) doi:10.1117/1.600988
TOPICS: Inspection, Optical engineering
Aniceto Belmonte, Adolfo Comeron, Javier Bara, Juan Rubio
Opt. Eng. 35(10), (1 October 1996) doi:10.1117/1.600989
TOPICS: Receivers, Turbulence, Telecommunications, Scintillation, Atmospheric optics, Astronomical imaging, Atmospheric propagation engineering, Atmospheric propagation, Radio propagation, Wave propagation
Wolfgang Singer, Hans Peter Herzig, Markku Kuittinen, Eckhard Piper, Johannes Wangler
Opt. Eng. 35(10), (1 October 1996) doi:10.1117/1.600960
TOPICS: Binary data, Etching, Diffraction, Lenses, Zone plates, Optical components, Fourier transforms, Convolution, Optical engineering, Error analysis
Andre Booysen, Pieter Swart, Beatrys Lacquet, Stephanus Spammer
Opt. Eng. 35(10), (1 October 1996) doi:10.1117/1.600961
TOPICS: Sensors, Fiber optics sensors, Light emitting diodes, Light sources, Refractive index, Photodiodes, Modulation, Fiber optics, Optical engineering, Signal processing
Opt. Eng. 35(10), (1 October 1996) doi:10.1117/1.600962
TOPICS: Thin films, Modulation, Reflectivity, Multilayers, Refraction, Transmittance, Reflection, Dielectrics, Optical fibers, Electromagnetic scattering theory
Opt. Eng. 35(10), (1 October 1996) doi:10.1117/1.600963
TOPICS: Sensors, Fiber optics sensors, Light emitting diodes, Solid state electronics, Objectives, Calibration, Mirrors, Reflection, Semiconductor lasers, Optical design
Carlos Lima, Lucila Cescato
Opt. Eng. 35(10), (1 October 1996) doi:10.1117/1.600964
TOPICS: Photoresist materials, Glasses, Holography, Reflection, Interfaces, Fringe analysis, Silicon, Reflectivity, Two wave mixing, Diffraction
Opt. Eng. 35(10), (1 October 1996) doi:10.1117/1.600965
TOPICS: Holograms, 3D image reconstruction, Computer generated holography, Diffraction, Binary data, Image quality, Quantization, Computer simulations, Optical components, Optical engineering
Alexandros Stavdas, Polina Bayvel, John Midwinter
Opt. Eng. 35(10), (1 October 1996) doi:10.1117/1.600966
TOPICS: Monochromatic aberrations, Optical design, Holography, Diffraction gratings, Wavefronts, Spectrographs, Spherical lenses, Diffraction, Optical networks, Fiber amplifiers
Opt. Eng. 35(10), (1 October 1996) doi:10.1117/1.600967
TOPICS: Holograms, Multiplexing, Diffraction, Diffraction gratings, Signal to noise ratio, 3D image reconstruction, Spatial filters, Optical engineering, Scientific research, Plutonium
Ranjani Parthasarathi, Ashok Jhunjhunwala
Opt. Eng. 35(10), (1 October 1996) doi:10.1117/1.600968
TOPICS: Symbolic substitution, Optical components, Optical engineering, Image processing, Passive elements, Superposition, Instrumentation engineering, Signal to noise ratio, Electrical engineering, Optical instrument design
Jianping Fan, Liming Zhang, Rong Wang, Dingjia Xing, Fuxi Gan
Opt. Eng. 35(10), (1 October 1996) doi:10.1117/1.600969
TOPICS: Image compression, Motion estimation, Quantization, Bismuth, Signal to noise ratio, Visual system, Sensors, Video, Image segmentation, Optical engineering
Opt. Eng. 35(10), (1 October 1996) doi:10.1117/1.600970
TOPICS: Diffraction gratings, Transmittance, Diffraction, Fourier transforms, Far-field diffraction, Optical engineering, Modulation, Visual optics, CCD cameras, Algorithm development
Thomas Weldon, William Higgins, Dennis Dunn
Opt. Eng. 35(10), (1 October 1996) doi:10.1117/1.600971
TOPICS: Image segmentation, Optical filters, Image filtering, Error analysis, Statistical analysis, Fourier transforms, Optical engineering, Solids, Gaussian filters, Optimal filtering
Felipe Lumbreras, Joan Serrat
Opt. Eng. 35(10), (1 October 1996) doi:10.1117/1.600972
TOPICS: Image segmentation, Wavelets, Image filtering, Polarizers, Optical filters, Microscopes, Visualization, Optical engineering, Crystals, Image processing
Chao-Hao Lee, Bor-Shenn Jeng, Hon-Fai Yau, Pei-Yih Ting, Shyh-Rong Lay, Chien-Cheng Tseng
Opt. Eng. 35(10), (1 October 1996) doi:10.1117/1.600990
TOPICS: Optical character recognition, Optical engineering, Image segmentation, Telecommunications, Intelligence systems, Computing systems, Detection and tracking algorithms, Physics, Feature extraction, Inspection
Aleksandar Zavaljevski, Atam Dhawan, David Kelch, James Riddell
Opt. Eng. 35(10), (1 October 1996) doi:10.1117/1.600973
TOPICS: Sensors, Target detection, Reflectivity, Signal to noise ratio, Image classification, Multispectral imaging, Calibration, Optical engineering, Hyperspectral target detection, Neural networks
Opt. Eng. 35(10), (1 October 1996) doi:10.1117/1.600974
TOPICS: Error analysis, Sensors, Statistical analysis, Image sensors, Image analysis, Binary data, Signal detection, Motion estimation, Wavefront sensors, Microchannel plates
Ofer Hadar, M. Robbins, Y. Novogrozky, D. Kaplan
Opt. Eng. 35(10), (1 October 1996) doi:10.1117/1.600959
TOPICS: Optical transfer functions, Image restoration, Image processing, Filtering (signal processing), Cameras, Electronic filtering, Motion measurement, Sensors, Motion estimation, Modulation transfer functions
Jihong Kim, Yongmin Kim, Robert Gove, Jeremiah Golston
Opt. Eng. 35(10), (1 October 1996) doi:10.1117/1.600958
TOPICS: Signal processing, Image processing, Digital signal processing, Computing systems, Multimedia, Digital filtering, Image filtering, Binary data, Video, Imaging systems
Opt. Eng. 35(10), (1 October 1996) doi:10.1117/1.600975
TOPICS: Fuzzy logic, Fuzzy systems, Mathematical morphology, Rule based systems, Optical engineering, Image filtering, Image processing, Binary data, Digital filtering, Computer simulations
YihChuan Lin, Shen-Chuan Tai
Opt. Eng. 35(10), (1 October 1996) doi:10.1117/1.600976
TOPICS: Distortion, Computer programming, Principal component analysis, Quantization, Algorithm development, Optical engineering, Detection and tracking algorithms, Medical imaging, Image compression, Binary data
Opt. Eng. 35(10), (1 October 1996) doi:10.1117/1.600956
TOPICS: Interferometers, Mirrors, Phase shifts, Sensors, Fringe analysis, Spatial filters, Computing systems, Feedback loops, Signal detection, Optical engineering
Torgny Carlsson, Nils Abramson, Kai Fischer
Opt. Eng. 35(10), (1 October 1996) doi:10.1117/1.600977
TOPICS: Prisms, Interferometers, Interferometry, Reflection, Industrial metrology, Image processing, Distortion, Grazing incidence, Light sources, Optical components
Opt. Eng. 35(10), (1 October 1996) doi:10.1117/1.600978
TOPICS: Visibility, Polarization, Interferometers, Mirrors, Interferometry, Stellar interferometry, Polarimetry, Coating, Calibration, Silver
Opt. Eng. 35(10), (1 October 1996) doi:10.1117/1.600979
TOPICS: Phase shifts, Interferometers, Surface roughness, Mirau interferometers, Error analysis, Ferroelectric materials, Feedback control, Phase shifting, Reflection, Quantization
Opt. Eng. 35(10), (1 October 1996) doi:10.1117/1.600991
TOPICS: Wavefronts, Interferometers, Sensors, Modulation, Aspheric lenses, Interferometry, Fringe analysis, Optical spheres, Calibration, Glasses
Opt. Eng. 35(10), (1 October 1996) doi:10.1117/1.600980
TOPICS: Photomasks, Excimer lasers, Chromium, Lithography, Phase measurement, Phase shifts, Scanning electron microscopy, Optics manufacturing, Semiconducting wafers, Semiconductors
Martin Eisner, Johannes Schwider
Opt. Eng. 35(10), (1 October 1996) doi:10.1117/1.600981
TOPICS: Etching, Silicon, Microlens, Lenses, Reactive ion etching, Ions, Photoresist processing, Spherical lenses, Glasses, Optical spheres
Gerd Klose, Azad Siahmakoun
Opt. Eng. 35(10), (1 October 1996) doi:10.1117/1.600982
TOPICS: Mode locking, Crystals, Bragg cells, Laser crystals, Mirrors, Continuous wave operation, Helium neon lasers, Phase conjugation, Spectrum analysis, Modulation
Bin Wang, Feihong Yu, Xu Liu, Peifu Gu, Jinfa Tang
Opt. Eng. 35(10), (1 October 1996) doi:10.1117/1.600983
TOPICS: Transform theory, Logic, Polarization, LCDs, Logic devices, Polarizers, Optical engineering, Signal detection, Computer programming, Beam splitters
Opt. Eng. 35(10), (1 October 1996) doi:10.1117/1.600957
TOPICS: Glasses, Refraction, Infrared radiation, Visible radiation, Manufacturing, Optical engineering, Refractive index, Lens design, Chromatic aberrations, Crown glass
Yasuhisa Tamagawa, Toru Tajime
Opt. Eng. 35(10), (1 October 1996) doi:10.1117/1.600984
TOPICS: Lenses, Colorimetry, Temperature metrology, Optical design, Modulation transfer functions, Optical engineering, Germanium, Graphic design, Refractive index, Contact lenses
Genyuan Wang, Zheng Bao, Xiaobing Sun
Opt. Eng. 35(10), (1 October 1996) doi:10.1117/1.600985
TOPICS: Time-frequency analysis, Radar, Synthetic aperture radar, Radar imaging, Doppler effect, Baryon acoustic oscillations, Sun, Motion models, Solids, Fourier transforms
Jianping Yin, Shiqun Zhu, Weijian Gao, Zhaoming Pu
Opt. Eng. 35(10), (1 October 1996) doi:10.1117/1.600986
TOPICS: Stray light, Monochromators, Optical filtering, Transmittance, Calibration, Spectroscopy, Optical testing, Photon counting, Photonics systems, Raman spectroscopy
Opt. Eng. 35(10), (1 October 1996) doi:10.1117/1.600987
TOPICS: Wavelet transforms, Wavelets, Infrared imaging, Visualization, Target detection, Detection and tracking algorithms, Infrared radiation, Image processing, Target acquisition, Optical engineering
Grant Gerhart, Edwina Bednarz, Thomas Meitzler, Eui Sohn, Robert Karlsen
Opt. Eng. 35(10), (1 October 1996) doi:10.1117/1.600953
TOPICS: Target detection, Visual process modeling, Target acquisition, Data modeling, Sensors, Visualization, Performance modeling, Sensor performance, Electro optical modeling, Signal to noise ratio
Opt. Eng. 35(10), (1 October 1996) doi:10.1117/1.600954
TOPICS: X-ray telescopes, Mirrors, Error analysis, Tolerancing, Telescopes, Monochromatic aberrations, Assembly tolerances, Scattering, X-rays, Space telescopes
Opt. Eng. 35(10), (1 October 1996) doi:10.1117/1.600955
TOPICS: Profilometers, Photodetectors, Commercial off the shelf technology, Forward looking infrared, Scanners, Mirrors, Microscopy, Televisions, Instrumentation engineering, Photodiodes
Juergen Gutowski
Opt. Eng. 35(10), (1 October 1996) doi:10.1117/1.600992
TOPICS: Optical semiconductors, Semiconductors, Semiconductor lasers, Mode locking, Nonlinear optics, Solid state lasers, Ultrafast phenomena, Excitons, Fiber lasers, Solid state physics
Martin Guy
Opt. Eng. 35(10), (1 October 1996) doi:10.1117/1.600993
TOPICS: Ultrafast phenomena
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