Aberrations introduced in off-axis testing of spherical surfaces

Daniel Malacara-Hernandez; Manuel Servin Guirado

doi:10.1117/1.601064

1 November 1996 Aberrations introduced in off-axis testing of spherical surfaces

Daniel Malacara-Hernandez, Manuel Servin Guirado

Optical Engineering, Vol. 35, Issue 11, (November 1996). https://doi.org/10.1117/1.601064

It is well known that off-axis testing of a spherical surface introduces aberrations, mainly primary astigmatism. The magnitudes of these aberrations are discussed and analytically calculated. Their influence in several testing configurations is discussed. A case of particular interest is when a linear carrier fringe pattern is used in a Fizeau interferometer.

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Daniel Malacara-Hernandez and Manuel Servin Guirado "Aberrations introduced in off-axis testing of spherical surfaces," Optical Engineering 35(11), (1 November 1996). https://doi.org/10.1117/1.601064

Published: 1 November 1996

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