Binary fractal image quantification using probe coherent beam scanning

doi:10.1117/1.601373

1 May 1997 Binary fractal image quantification using probe coherent beam scanning

Optical Engineering, Vol. 36, Issue 5, (May 1997). https://doi.org/10.1117/1.601373

Some possibilities for binary 2-D fractal image characterization using correlation analysis of the transmitted light intensity fluctuations are discussed. These intensity fluctuations are produced by the probe coherent beam scanning of the studied object. Two different cases of diagnostics of the mass fractal structures are considered: with a broad collimated illuminating beam and with a sharply focused beam. Relationships between generalized characteristics of the studied structures (e.g., Hausdorff dimension) and asymptotic parameters of the structure functions of the intensity fluctuations (e.g., their exponents) are analyzed. Experimental results obtained with the specially prepared 2-D mass fractal structures (binary amplitude screens) are presented. Possible applications for morphological analysis of tissue structures are discussed.

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"Binary fractal image quantification using probe coherent beam scanning," Optical Engineering 36(5), (1 May 1997). https://doi.org/10.1117/1.601373

Published: 1 May 1997

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