Editorial
Opt. Eng. 38(8), (1 August 1999) doi:10.1117/1.602287
Adaptive Optics
David Miller, Simon Grocott
Opt. Eng. 38(8), (1 August 1999) doi:10.1117/1.602186
TOPICS: Mirrors, Actuators, Wavefronts, Control systems, Atmospheric modeling, Telescopes, Deformable mirrors, Sensors, Space telescopes, Wavefront sensors
ATMOSPHERIC OPTICS
Daniel Hutt
Opt. Eng. 38(8), (1 August 1999) doi:10.1117/1.602188
TOPICS: Atmospheric modeling, Data modeling, Heat flux, Turbulence, Optical turbulence, Atmospheric optics, Scintillation, Systems modeling, Optical testing, Humidity
DEFECTS INSPECTION
Yuri Eremin, John Stover, N. Orlov
Opt. Eng. 38(8), (1 August 1999) doi:10.1117/1.602187
TOPICS: Particles, Scattering, Silicon, Semiconducting wafers, Light scattering, Polarization, Optical engineering, Optical spheres, Interfaces, Chemical elements
Bernard Lamalle, Sophie Kohler-Hemmerlin, Patrick Gorria, Claudine Coulot
Opt. Eng. 38(8), (1 August 1999) doi:10.1117/1.602172
TOPICS: Reflection, Light sources, Machine vision, Cameras, Mathematical modeling, Visual process modeling, Light, CCD cameras, Optical engineering, Light sources and illumination
Opt. Eng. 38(8), (1 August 1999) doi:10.1117/1.602189
TOPICS: Image analysis, Corrosion, Image filtering, Cartography, Light sources and illumination, Binary data, Mathematical morphology, Image processing, Optical engineering, Microscopes
DIFFRACTION
Eusebio Bernabeu, Ibrahim Serroukh, Luis Sanchez-Brea
Opt. Eng. 38(8), (1 August 1999) doi:10.1117/1.602173
TOPICS: Diffraction, Geometrical optics, Data modeling, Statistical modeling, Statistical analysis, Systems modeling, Error analysis, Optical engineering, Instrument modeling, Control systems
IMAGE CODING
Wen-Jyi Hwang, Wen-Liang Hwang, Yeong-Cherng Lu
Opt. Eng. 38(8), (1 August 1999) doi:10.1117/1.602174
TOPICS: Computer programming, Image resolution, Image transmission, Wavelets, Lutetium, Wavelet transforms, Image compression, Visualization, Receivers, Signal to noise ratio
IMAGE RECONSTRUCTION
Katherine Redford, Ge Wang, Michael Vannier
Opt. Eng. 38(8), (1 August 1999) doi:10.1117/1.602175
TOPICS: Computed tomography, Sensors, X-ray computed tomography, X-ray sources, Tomography, 3D image reconstruction, X-rays, Scanners, Detector arrays, X-ray imaging
Binsheng Zhao, Anthony Reeves, David Yankelevitz, Claudia Henschke
Opt. Eng. 38(8), (1 August 1999) doi:10.1117/1.602176
TOPICS: Image segmentation, 3D image processing, Computed tomography, Digital filtering, Blood vessels, Super resolution, Optical engineering, Visualization, Algorithm development, Image filtering
Seunghyeon Rhee, Moon Gi Kang
Opt. Eng. 38(8), (1 August 1999) doi:10.1117/1.602177
TOPICS: Reconstruction algorithms, Image quality, Deconvolution, Image processing, Optical engineering, Image restoration, Fourier transforms, Charge-coupled devices, Image sensors, Image resolution
Interferometry
Chunlong Wei, Mingyi Chen, Zhijiang Wang
Opt. Eng. 38(8), (1 August 1999) doi:10.1117/1.602190
TOPICS: Phase shift keying, Phase measurement, Calibration, Algorithm development, Phase shifts, Phase interferometry, Modulation, Interferometry, Optical engineering, Optical discs
Chunyong Yin, Gaoliang Dai, Zhixia Chao, Yi Xu, Jie Xu
Opt. Eng. 38(8), (1 August 1999) doi:10.1117/1.602178
TOPICS: Interferometers, Calibration, Heterodyning, Mirrors, Visibility, Prisms, Polarization, Optical testing, Photodetectors, Metrology
Opt. Eng. 38(8), (1 August 1999) doi:10.1117/1.602179
TOPICS: 3D image processing, Speckle interferometry, Mirrors, Speckle, Laser induced fluorescence, Charge-coupled devices, Light sources, Computing systems, Holography, Interferometry
Opt. Eng. 38(8), (1 August 1999) doi:10.1117/1.602180
TOPICS: Phase shifts, Nanoimprint lithography, Optical testing, Monochromatic aberrations, Wavefronts, Fizeau interferometers, Semiconductor lasers, Sensors, Beam splitters, Foam
NEAR-FIELD MICROSCOPY
David Schaafsma, Reza Mossadegh, Jasbinder Sanghera, Ishwar Aggarwal, M. Luce, Renato Generosi, P. Perfetti, Antonio Cricenti, Jonathan Gilligan, Norman Tolk
Opt. Eng. 38(8), (1 August 1999) doi:10.1117/1.602181
TOPICS: Near field scanning optical microscopy, Chalcogenides, Free electron lasers, Fiber lasers, Near field optics, Infrared microscopy, Infrared radiation, Optical microscopy, Absorption, Spatial resolution
OBJECT TRACKING
Farid Behazin, Mehdi Fesharaki, Abdolreza Nabavi, Ali Mahmoodi
Opt. Eng. 38(8), (1 August 1999) doi:10.1117/1.602192
TOPICS: Reflection, Channel projecting optics, Monte Carlo methods, Ray tracing, Geometrical optics, Specular reflections, Mathematical modeling, Solids, Optical engineering, Absorption
Optical Interconnects
Silviu Reinhorn, Ram Oron, Yaakov Amitai, Asher Friesem, Klara Vinokur, Nissim Pilossof
Opt. Eng. 38(8), (1 August 1999) doi:10.1117/1.602182
TOPICS: Switches, Telescopes, Holography, Optical components, Diffraction, Sensors, Switching, Transmittance, Space telescopes, Spatial light modulators
POLARIMETRY
Opt. Eng. 38(8), (1 August 1999) doi:10.1117/1.602183
TOPICS: Modulators, Polarization, Modulation, Wave plates, Polarimetry, CCD image sensors, Magnetism, Liquid crystals, Phase shift keying, Demodulation
POSITIONING TECHNIQUES
Roberto Torroba, L. Nunes, Alberto Tagliaferri
Opt. Eng. 38(8), (1 August 1999) doi:10.1117/1.602191
TOPICS: Visibility, Diffraction gratings, CCD cameras, Digital imaging, Light, Image processing, Cameras, Ronchi rulings, Speckle, Imaging systems
Remote Sensing
Opt. Eng. 38(8), (1 August 1999) doi:10.1117/1.602193
TOPICS: Spatial resolution, Reflectivity, Thermography, Sensors, Temperature metrology, 3D modeling, Thermal sensing, Near infrared, Vegetation, Anisotropy
Opt. Eng. 38(8), (1 August 1999) doi:10.1117/1.602184
TOPICS: Resistance, Capacitance, Quantum well infrared photodetectors, Quantum wells, Sensors, Data modeling, Circuit switching, Doping, Instrument modeling, Optical engineering
TARGET DETECTION
Guy Aviram, Stanley Rotman
Opt. Eng. 38(8), (1 August 1999) doi:10.1117/1.602185
TOPICS: Image enhancement, Target detection, Infrared imaging, Image quality, Detection and tracking algorithms, Infrared radiation, Image processing, Infrared detectors, Optical filters, Image filtering
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