Editorial
OPTICAL METHODS FOR SHAPE MEASUREMENT
Fang Chen, Gordon Brown, Mumin Song
Opt. Eng. 39(1), (1 January 2000) https://doi.org/10.1117/1.602438
TOPICS: Sensors, 3D metrology, Optical testing, Calibration, Computer aided design, Computing systems, Clouds, 3D image processing, Cameras, Structured light
Huai Shang, Y.Y. Hung, W. Luo, Fang Chen
Opt. Eng. 39(1), (1 January 2000) https://doi.org/10.1117/1.602331
TOPICS: Shearography, Profiling, Phase measurement, Digital imaging, Photography, Optical engineering, Holography, Refractive index, Cameras, Fringe analysis
Hans Tiziani, M. Wegner, Daniela Steudle
Opt. Eng. 39(1), (1 January 2000) https://doi.org/10.1117/1.602332
TOPICS: Confocal microscopy, Microlens, Colorimetry, Microlens array, Calibration, Objectives, Mirrors, Sensors, Cameras, Surface finishing
Ichirou Yamaguchi, Akihiro Yamamoto, Masaru Yano
Opt. Eng. 39(1), (1 January 2000) https://doi.org/10.1117/1.602333
TOPICS: Mirrors, Interferometry, Interferometers, Fizeau interferometers, Michelson interferometers, Surface finishing, Imaging systems, Fourier transforms, Reflectivity, Optical engineering
Joseph Marron, Kurt Gleichman
Opt. Eng. 39(1), (1 January 2000) https://doi.org/10.1117/1.602334
TOPICS: Tunable lasers, 3D image processing, Interferometry, Stereoscopy, Fourier transforms, Interferometers, Imaging systems, 3D metrology, Sensors, Computer aided design
Bernard Gilbert, Joel Blatt
Opt. Eng. 39(1), (1 January 2000) https://doi.org/10.1117/1.602335
TOPICS: Phase shifts, Interferometers, Phase measurement, Mirrors, 3D acquisition, Optical engineering, Cameras, Michelson interferometers, Mach-Zehnder interferometers, Video
Mitsuo Takeda, Takahiro Aoki, Yoko Miyamoto, Hideyuki Tanaka, Ruowei Gu, Zhibo Zhang
Opt. Eng. 39(1), (1 January 2000) https://doi.org/10.1117/1.602336
TOPICS: Fringe analysis, Optical transfer functions, Fourier transforms, 3D metrology, Microscopes, Confocal microscopy, Image sensors, Spatial frequencies, Projection systems, Optical engineering
Thomas Ditto, Douglas Lyon
Opt. Eng. 39(1), (1 January 2000) https://doi.org/10.1117/1.602337
TOPICS: Diffraction gratings, Diffraction, Cameras, Prototyping, Holography, Optical design, Projection systems, Sensors, Magnetism, Optical engineering
Opt. Eng. 39(1), (1 January 2000) https://doi.org/10.1117/1.602339
TOPICS: Interferometry, Interferometers, Diffraction gratings, Metrology, 3D metrology, Optical testing, Surface roughness, Grazing incidence, Surface finishing, Phase shifts
C. Coggrave, Jonathan Huntley
Opt. Eng. 39(1), (1 January 2000) https://doi.org/10.1117/1.602340
TOPICS: Projection systems, Cameras, Spatial light modulators, Phase shifts, Phase measurement, Fringe analysis, Phase shifting, Optical engineering, Fourier transforms, Modulation
Opt. Eng. 39(1), (1 January 2000) https://doi.org/10.1117/1.602341
TOPICS: Holography, Holograms, Visibility, Holographic interferometry, Modulation, Optical testing, Fourier transforms, Data processing, Optical engineering, Mirrors
Michael Mermelstein, Daniel Feldkhun, Lyle Shirley
Opt. Eng. 39(1), (1 January 2000) https://doi.org/10.1117/1.602342
TOPICS: Bragg cells, Sensors, Acousto-optics, Fringe analysis, Phase measurement, Video rate surface profiling, Adaptive optics, Amplitude modulation, Cameras, Prototyping
Wenjian Wang, Xiaogu Wu, William Wee
Opt. Eng. 39(1), (1 January 2000) https://doi.org/10.1117/1.602343
TOPICS: 3D modeling, Computed tomography, Inspection, Sensors, Optical testing, Edge detection, Image filtering, Detection and tracking algorithms, Optical engineering, Linear filtering
Gordon Brown, Ryszard Pryputniewicz
Opt. Eng. 39(1), (1 January 2000) https://doi.org/10.1117/1.602353
TOPICS: Microelectromechanical systems, Sensors, Tolerancing, Manufacturing, Microscopes, Optical engineering, Interferometry, Beam splitters, Actuators, Optoelectronics
Minfu Lu, XiaoYan He, Sheng Liu
Opt. Eng. 39(1), (1 January 2000) https://doi.org/10.1117/1.602344
TOPICS: Fourier transforms, Error analysis, Phase modulation, Phase shifts, Fringe analysis, Projection systems, Calibration, Electronic components, Glasses, Algorithm development
Y.Y. Hung, L. Lin, B. Park
Opt. Eng. 39(1), (1 January 2000) https://doi.org/10.1117/1.602345
TOPICS: Fringe analysis, Machine vision, Computer vision technology, Phase shifts, Reflectivity, 3D vision, Calibration, 3D metrology, Cameras, Spatial resolution
Richard Kowarschik, Peter Kuehmstedt, Joerg Gerber, Wolfgang Schreiber, Gunther Notni
Opt. Eng. 39(1), (1 January 2000) https://doi.org/10.1117/1.602346
TOPICS: Cameras, 3D metrology, Projection systems, Calibration, Adaptive optics, Optical testing, Phase measurement, Optical engineering, CCD cameras, Structured light
Wolfgang Schreiber, Gunther Notni
Opt. Eng. 39(1), (1 January 2000) https://doi.org/10.1117/1.602347
TOPICS: Cameras, Calibration, Projection systems, 3D metrology, Photogrammetry, Phase measurement, Imaging systems, 3D vision, Optical engineering, Sensors
Xiang Zhou, Ruihua Yin, Wenjian Wang, Xiaogu Wu, William Wee
Opt. Eng. 39(1), (1 January 2000) https://doi.org/10.1117/1.602348
TOPICS: Cameras, Calibration, Imaging systems, 3D image processing, Data processing, Ranging, Error analysis, Data acquisition, 3D metrology, Sensing systems
Roland Hoefling, Petra Aswendt, Reimund Neugebauer
Opt. Eng. 39(1), (1 January 2000) https://doi.org/10.1117/1.602349
TOPICS: Reflection, Scattering, Phase shifts, Phase measurement, Fringe analysis, Mirrors, Defect detection, Metals, Retroreflectors, Charge-coupled devices
XianZhu Zhang, Walter North
Opt. Eng. 39(1), (1 January 2000) https://doi.org/10.1117/1.602350
TOPICS: Metrology, 3D imaging standards, Image analysis, 3D metrology, Standards development, Image processing, Projection systems, Phase shifts, Retroreflectors, Process control
Francis Lilley, Michael Lalor, David Burton
Opt. Eng. 39(1), (1 January 2000) https://doi.org/10.1117/1.602351
TOPICS: Fringe analysis, Calibration, Radiotherapy, Shape analysis, Interferometers, Projection systems, Mathematical modeling, Optical testing, Optical engineering, Algorithm development
J. Beraldin, Francois Blais, Marc Rioux, Luc Cournoyer, Denis Laurin, Steve MacLean
Opt. Eng. 39(1), (1 January 2000) https://doi.org/10.1117/1.602352
TOPICS: Cameras, Sensors, Photodiodes, Three dimensional sensing, 3D surface sensing, 3D modeling, Calibration, Imaging systems, Laser scanners, Optical engineering
Opt. Eng. 39(1), (1 January 2000) https://doi.org/10.1117/1.602354
TOPICS: 3D metrology, Stress analysis, Sensors, Shape analysis, Inspection, Head, Interferometry, Speckle interferometry, Optical engineering, Computer simulations
Opt. Eng. 39(1), (1 January 2000) https://doi.org/10.1117/1.602355
TOPICS: Imaging systems, Speckle, Calibration, Computer aided design, Shape analysis, Cameras, CCD cameras, Ferroelectric materials, Speckle pattern, Holography
Carsten Reich, Reinhold Ritter, Jan Thesing
Opt. Eng. 39(1), (1 January 2000) https://doi.org/10.1117/1.602356
TOPICS: Sensors, Clouds, 3D metrology, Photogrammetry, Cameras, Optical engineering, 3D acquisition, Phase measurement, Phase shifts, Imaging systems
Opt. Eng. 39(1), (1 January 2000) https://doi.org/10.1117/1.602357
TOPICS: Phase measurement, Optical testing, 3D modeling, Cameras, Computer aided design, Calibration, Data modeling, 3D metrology, Reverse modeling, Visualization
DIGITAL INTERFEROMETRY
Opt. Eng. 39(1), (1 January 2000) https://doi.org/10.1117/1.602362
TOPICS: Holograms, 3D image reconstruction, CCD image sensors, Holography, Digital holography, Oxygen, Holographic interferometry, Photography, Charge-coupled devices, Optical engineering
ELECTRON MICROSCOPY
Ira Cohen, Rotem Golan, Stanley Rotman
Opt. Eng. 39(1), (1 January 2000) https://doi.org/10.1117/1.602358
TOPICS: Sensors, Scanning electron microscopy, Signal processing, Selenium, Statistical analysis, Signal detection, Detection theory, Electron microscopes, Microchannel plates, Atmospheric particles
HOLOGRAPHIC CORRELATORS
George Sefler, Jian Ma, Tallis Chang, John Hong
Opt. Eng. 39(1), (1 January 2000) https://doi.org/10.1117/1.602367
TOPICS: Optical correlators, Holography, Holograms, Spatial light modulators, LCDs, Modulation, Crystals, Multiplexing, Integrated optics, Polarization
IMAGE EVALUATION
Xose Fernandez-Vidal, Alexander Toet, Jose Garcia, Joaquin Fdez-Valdivia-DUPE RECORD-DO NOT USE
Opt. Eng. 39(1), (1 January 2000) https://doi.org/10.1117/1.602360
TOPICS: Visualization, Image filtering, Target detection, Visual process modeling, Optical filters, Optical engineering, Digital imaging, Image processing, Gaussian filters, Distance measurement
Opt. Eng. 39(1), (1 January 2000) https://doi.org/10.1117/1.602363
TOPICS: Image segmentation, Image registration, Image fusion, Image processing, Infrared imaging, Visualization, Sensors, Visible radiation, Optical engineering, Feature extraction
MICROLENS ARRAYS
Silke Traut, Hans Peter Herzig
Opt. Eng. 39(1), (1 January 2000) https://doi.org/10.1117/1.602359
TOPICS: Microlens array, Microlens, Spectroscopy, Chemical elements, Holography, Diffraction gratings, Photoresist materials, Optical components, Ray tracing, Coating
POLYMER OPTICAL FIBERS
Rabah Attia, Jacques Marcou
Opt. Eng. 39(1), (1 January 2000) https://doi.org/10.1117/1.602365
TOPICS: Polymer optical fibers, Phase only filters, Performance modeling, Optical engineering, Signal attenuation, Multimode fibers, Optical fibers, Instrument modeling, Light, Computer simulations
PRECISION MEASUREMENT
Opt. Eng. 39(1), (1 January 2000) https://doi.org/10.1117/1.602364
TOPICS: Mirrors, Sensors, Fourier transforms, Calibration, Precision calibration, Error analysis, Tolerancing, Head, Optical engineering, Prisms
SENSORS
Yi-Chang Cheng, WenKuan Su, JiannHorng Liou
Opt. Eng. 39(1), (1 January 2000) https://doi.org/10.1117/1.602366
TOPICS: Sensors, Dielectrics, Prisms, Liquids, Metals, Reflectivity, Gold, Plasma, Surface plasmons, Interfaces
SPACE OPTICS
Jack McKay, David Rees
Opt. Eng. 39(1), (1 January 2000) https://doi.org/10.1117/1.602361
TOPICS: Fabry–Perot interferometers, Transmittance, Reflectivity, Distortion, Zerodur, LIDAR, Optical mounts, Reflection, Capacitance, Spectral resolution
Communications
Kazuyoku Tei, Masaaki Kato, Fumiaki Matsuoka, Yoshito Niwa, Yoichiro Maruyama, Tohru Matoba, Takashi Arisawa
Opt. Eng. 39(1), (1 January 2000) https://doi.org/10.1117/1.602329
TOPICS: Nd:YAG lasers, Crystals, Optical amplifiers, Oscillators, Telescopes, Laser development, Laser crystals, Laser systems engineering, Laser stabilization, Second-harmonic generation
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