Opt. Eng. 39(2), (1 February 2000) doi:10.1117/1.602368
Hassen Zghal, Hoda Elmaraghy
Opt. Eng. 39(2), (1 February 2000) doi:10.1117/1.602369
TOPICS: Cameras, Calibration, CCD cameras, Video, Sensors, Imaging systems, Reflectivity, Video surveillance, Charge-coupled devices, Machine vision
Opt. Eng. 39(2), (1 February 2000) doi:10.1117/1.602370
TOPICS: Cameras, Calibration, Infrared cameras, Black bodies, Spectral calibration, Optical filters, Sensors, Infrared imaging, Medium wave, Temperature metrology
I. Alex Vitkin, Emile Hoskinson
Opt. Eng. 39(2), (1 February 2000) doi:10.1117/1.602371
TOPICS: Polarization, Scattering, Light scattering, Glucose, Mie scattering, Signal detection, Statistical analysis, Multiple scattering, Optical engineering, Modulation
Bernard Tilkens, Yves Lion, Yvon Renotte
Opt. Eng. 39(2), (1 February 2000) doi:10.1117/1.602372
TOPICS: Reflectivity, Dielectrics, Metals, Surface plasmons, Gold, Error analysis, Optical engineering, Absorption, Glasses, Interfaces
Chien-Chung Lee, Sien Chi
Opt. Eng. 39(2), (1 February 2000) doi:10.1117/1.602373
TOPICS: Reflectometry, Modulation, Computer programming, Signal attenuation, Optical fibers, Composites, Video, Nondestructive evaluation, Single mode fibers, Signal detection
Opt. Eng. 39(2), (1 February 2000) doi:10.1117/1.602374
TOPICS: Switches, Fiber optics, Micromirrors, Free space optics, Mirrors, Geometrical optics, GRIN lenses, Optical switching, Wavelength division multiplexing, Switching
Philippe Chanclou, Monique Thual, Jean Lostec, D. Pavy, Michel Gadonna
Opt. Eng. 39(2), (1 February 2000) doi:10.1117/1.602375
TOPICS: Micro optics, GRIN lenses, Silica, Single mode fibers, Optical fibers, Tolerancing, Semiconductor lasers, Fiber lasers, Distance measurement, Optical engineering
Ting Xing
Opt. Eng. 39(2), (1 February 2000) doi:10.1117/1.602376
TOPICS: Fourier transforms, Apodization, Spectroscopy, Physics, Roads, Electronic filtering, Optical alignment, Convolution, Optical engineering
Jingfeng Liu, V. Boopathi, Tow Chong Chong, Yihong Wu, Zengmin Li
Opt. Eng. 39(2), (1 February 2000) doi:10.1117/1.602377
TOPICS: Imaging systems, Tolerancing, Spatial frequencies, Point spread functions, Image acquisition, Digital holography, Holographic data storage systems, Data storage, Optical engineering, Signal detection
Luzhong Cai, Hua-Kuang Liu
Opt. Eng. 39(2), (1 February 2000) doi:10.1117/1.602378
TOPICS: Image retrieval, Optical pattern recognition, Image filtering, Optical filters, Holography, Holograms, Multiplexing, Camera shutters, Image storage, Joint transforms
Frederic Truchetet, Benjamin Joanne, Francis Perot, Olivier Laligant
Opt. Eng. 39(2), (1 February 2000) doi:10.1117/1.602379
TOPICS: Image compression, Wavelets, Image analysis, Cones, Visualization, Data compression, Human vision and color perception, Quantization, RGB color model, Visual system
Xose Fernandez-Vidal, Jose Garcia, Joaquin Fdez-Valdivia-DUPE RECORD-DO NOT USE, Rosa Rodriguez-Sanchez
Opt. Eng. 39(2), (1 February 2000) doi:10.1117/1.602380
TOPICS: Visualization, Image filtering, Visual process modeling, Optical filters, Palladium, Optical engineering, Data modeling, Target detection, Distance measurement, Sensors
Opt. Eng. 39(2), (1 February 2000) doi:10.1117/1.602381
TOPICS: Multispectral imaging, Reflectivity, Image enhancement, Landsat, Error analysis, Optical engineering, Image processing, Spatial resolution, Resolution enhancement technologies, Earth observing sensors
Jianping Fan, Gen Fujita, Makoto Furuie, Takao Onoye, Isao Shirakawa, Lide Wu
Opt. Eng. 39(2), (1 February 2000) doi:10.1117/1.602382
TOPICS: Image segmentation, Video, Semantic video, Image processing algorithms and systems, Feature extraction, Motion estimation, Optical engineering, Temporal coherence, Video coding, Detection and tracking algorithms
Image Processing
W. Conner, Robert Schowengerdt, Martin Munro, Malcolm Hughes
Opt. Eng. 39(2), (1 February 2000) doi:10.1117/1.602383
TOPICS: Edge detection, Sensors, Image acquisition, Image registration, Analytical research, Statistical analysis, Detection and tracking algorithms, Computing systems, Image processing, Microscopes
YuChen Hu, Chin-Chen Chang
Opt. Eng. 39(2), (1 February 2000) doi:10.1117/1.602384
TOPICS: Image compression, Image segmentation, Quantization, Image quality, Computer programming, Distance measurement, Optical engineering, Image processing, Algorithm development, Multimedia
Opt. Eng. 39(2), (1 February 2000) doi:10.1117/1.602385
TOPICS: Signal to noise ratio, Optical filters, Electronic filtering, Optimal filtering, Fourier transforms, Phase only filters, Image filtering, Solids, Pattern recognition, Computer simulations
Tomas Lindstroem, Daniel Roennow
Opt. Eng. 39(2), (1 February 2000) doi:10.1117/1.602386
TOPICS: Scattering, Light scattering, Reflectivity, Transmittance, Interfaces, Profilometers, Integrating spheres, Scatter measurement, Reflection, Surface roughness
Klaus Streubel, Mattias Hammar, F. Salomonsson, J. Bentell, Sebastian Mogg, S. Rapp, Joel Jacquet, J. Boucart, Christophe Starck, Antonina Plais, F. Gaborit, E. Derouin, N. Bouche, Alok Rudra, Alexei Syrbu, Vladimir Iakovlev, Claude-Albert Berseth, O. Dehaese, Eli Kapon, H. Moussa, Isabelle Sagnes, R. Raj
Opt. Eng. 39(2), (1 February 2000) doi:10.1117/1.602387
TOPICS: Mirrors, Semiconducting wafers, Gallium arsenide, Reflectivity, Absorption, Continuous wave operation, Resistance, Optical engineering, Quantum wells
Meg Tuma, Lawrence Greer, Michael Krasowski, Lawrence Oberle, Kristie Elam, Daniel Spina
Opt. Eng. 39(2), (1 February 2000) doi:10.1117/1.602399
TOPICS: Speckle pattern, Optical correlators, Charge-coupled devices, Speckle, Structured optical fibers, Sensors, Data processing, Optical fibers, Optical engineering, Silicon carbide
M. Simmons, Sohail Zaidi, B. Azzopardi
Opt. Eng. 39(2), (1 February 2000) doi:10.1117/1.602388
TOPICS: Backscatter, Diffraction, Glasses, Light scattering, Particles, Laser optics, Image analysis, Sensors, Water, Doppler effect
Opt. Eng. 39(2), (1 February 2000) doi:10.1117/1.602389
TOPICS: Acousto-optics, Mirrors, Acoustics, Signal generators, Adaptive optics, Crystals, Homodyne detection, Vibrometry, Control systems, Head
Hong Jiang, Chunyong Yin
Opt. Eng. 39(2), (1 February 2000) doi:10.1117/1.602390
TOPICS: Sensors, Commercial off the shelf technology, Polarizers, Photodetectors, Polarization, Beam splitters, Phase measurement, Optical engineering, Instrumentation engineering, Light sources
Abraham Friedenberg
Opt. Eng. 39(2), (1 February 2000) doi:10.1117/1.602391
TOPICS: Modulation transfer functions, Optical filters, Gaussian filters, Signal processing, Electronic filtering, Filtering (signal processing), Visibility, Phase shifts, Optical engineering, Interference (communication)
Tianhao Zhang, Chunping Zhang, Guanghua Fu, Yu-Dong Li, Liqun Gu, Guangyin Zhang, Qi Wang Song, Bruce Parsons, Robert Birge
Opt. Eng. 39(2), (1 February 2000) doi:10.1117/1.602400
TOPICS: Logic devices, Logic, Space based lasers, Absorption, Photonics, Binary data, Optical computing, Proteins, Optical engineering, Transistors
Opt. Eng. 39(2), (1 February 2000) doi:10.1117/1.602392
TOPICS: Crystals, Laser crystals, Absorption, Spatial frequencies, Refractive index, Semiconductor lasers, Image processing, Crystallography, Electro optical modeling, Iron
Aden Meinel, Marjorie Meinel
Opt. Eng. 39(2), (1 February 2000) doi:10.1117/1.602393
TOPICS: Mirrors, Polymers, Wavefronts, Liquids, Reflectivity, Monochromatic aberrations, Optical engineering, Surface finishing, Metrology, Gold
Yu Shi, X.-D. Zhang
Opt. Eng. 39(2), (1 February 2000) doi:10.1117/1.602394
TOPICS: Space operations, Filtering (signal processing), Error analysis, Infrared sensors, Electronic filtering, Optical filters, Digital filtering, Gyroscopes, Sensors, Computer simulations
Juan Hurtado-Ramos, Orestes Stavroudis, G. Gomez-Rosas, Haiming Wang
Opt. Eng. 39(2), (1 February 2000) doi:10.1117/1.602395
TOPICS: Waveguides, Prisms, Signal attenuation, Scattering, Light scattering, Thin films, Sensors, Scatter measurement, Photography, Optical fibers
Cristian Penciu, Duncan MacFarlane
Opt. Eng. 39(2), (1 February 2000) doi:10.1117/1.602396
TOPICS: Waveguides, Glasses, Ion exchange, Aluminum, Scattering, Sodium, Ions, Polishing, Potassium, Light scattering
Jolyon De Freitas
Opt. Eng. 39(2), (1 February 2000) doi:10.1117/1.602397
TOPICS: Interferometers, Heterodyning, Photoresist materials, Waveguides, Birefringence, Dichroic materials, Interferometry, Optical lithography, Beam splitters, Laser sources
Opt. Eng. 39(2), (1 February 2000) doi:10.1117/1.602436
TOPICS: Interferometers, Photoresist materials, Heterodyning, Waveguides, Birefringence, Dichroic materials, Optical lithography, Interferometry, Beam splitters, Laser sources
Back to Top