Initial bias dependency in dc drift of z-cut LiNbO3 optical intensity modulators

Hirotoshi Nagata; Hideki Honda; Katsuya Akizuki

doi:10.1117/1.602470

1 April 2000 Initial bias dependency in dc drift of z-cut LiNbO3 optical intensity modulators

Hirotoshi Nagata, Hideki Honda, Katsuya Akizuki

Optical Engineering, Vol. 39, Issue 4, (April 2000). https://doi.org/10.1117/1.602470

Estimation of a long-term dc drift behavior is essential for the application of LiNbO3 optical intensity modulators to fiber communication systems. Therefore temperatureaccelerated tests are carried out using a feedback-biascontrol operation system, and the results are converted into a duration at ordinary device operation temperatures, e.g., 50°C.

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Hirotoshi Nagata, Hideki Honda, and Katsuya Akizuki "Initial bias dependency in dc drift of z-cut LiNbO3 optical intensity modulators," Optical Engineering 39(4), (1 April 2000). https://doi.org/10.1117/1.602470

Published: 1 April 2000

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