Editorial
Opt. Eng. 40(1), (1 January 2001) doi:10.1117/1.1342236
SPECIAL SECTION GUEST EDITORIAL
Thierry Bosch, Silvano Donati
Opt. Eng. 40(1), (1 January 2001) doi:10.1117/1.1336577
DISTANCE AND DISPLACEMENT MEASUREMENTS BY LASER TECHNIQUE
Markus-Christian Amann, Thierry Bosch, Marc Lescure, Risto Myllylae, Marc Rioux
Opt. Eng. 40(1), (1 January 2001) doi:10.1117/1.1330700
TOPICS: Distance measurement, Semiconductor lasers, Modulation, Ranging, Receivers, Sensors, Time metrology, Signal processing, Laser applications, Signal to noise ratio
Thierry Bosch, Noel Servagent, Silvano Donati
Opt. Eng. 40(1), (1 January 2001) doi:10.1117/1.1330701
TOPICS: Interferometry, Signal detection, Sensors, Interferometers, Signal to noise ratio, Distance measurement, Semiconductor lasers, Modulation, Signal attenuation, Mirrors
Opt. Eng. 40(1), (1 January 2001) doi:10.1117/1.1330702
TOPICS: Modulation, Distance measurement, Semiconductor lasers, Interferometry, LIDAR, Diodes, Signal detection, Sensors, Interferometers, Laser interferometry
Richard Schneider, Peter Thuermel, Michael Stockmann
Opt. Eng. 40(1), (1 January 2001) doi:10.1117/1.1332772
TOPICS: Distance measurement, Interferometers, LIDAR, Calibration, Modulation, Signal detection, Semiconductor lasers, Tunable lasers, Diodes, Signal processing
Sahin Ozdemir, Shigenobu Shinohara, Satoshi Ito, Hirofumi Yoshida
Opt. Eng. 40(1), (1 January 2001) doi:10.1117/1.1331268
TOPICS: Semiconductor lasers, Speckle, Neurons, Surface finishing, Time metrology, Optical components, Signal detection, Reflectivity, Aluminum, Classification systems
Opt. Eng. 40(1), (1 January 2001) doi:10.1117/1.1331270
TOPICS: Fringe analysis, Profilometers, Diffractive optical elements, Fourier transforms, Diffraction, Optical engineering, Inspection, Interferometers, Spherical lenses, Superposition
Mitsuru Baba, Kozo Ohtani, Makoto Imai, Tadataka Konishi
Opt. Eng. 40(1), (1 January 2001) doi:10.1117/1.1331269
TOPICS: Image sensors, Photomasks, Reflectivity, Metals, Commercial off the shelf technology, Charge-coupled devices, Optical engineering, Prototyping, 3D metrology, Projection systems
E. Garcia, Horacio Lamela
Opt. Eng. 40(1), (1 January 2001) doi:10.1117/1.1331267
TOPICS: Mirrors, 3D vision, Control systems, Modulation, Semiconductor lasers, Laser applications, Scanners, Machine vision, 3D scanning, 3D acquisition
Opt. Eng. 40(1), (1 January 2001) doi:10.1117/1.1331272
TOPICS: Holography, 3D acquisition, Holograms, Digital holography, 3D modeling, Visualization, 3D image processing, Charge-coupled devices, Holographic interferometry, Finite element methods
Fabrizio Bertinetto, Enrico Canuto
Opt. Eng. 40(1), (1 January 2001) doi:10.1117/1.1332773
TOPICS: Interferometers, Ferroelectric materials, Mirrors, Modulation, Interferometry, Active optics, Acoustics, Optical amplifiers, Control systems, Laser stabilization
Pascal Picart, Eric Lolive, Jean-Marie Berthelot
Opt. Eng. 40(1), (1 January 2001) doi:10.1117/1.1330516
TOPICS: Foam, Calibration, Speckle, Error analysis, Head, Beam splitters, Phase shifts, Composites, Finite element methods, Optical engineering
Opt. Eng. 40(1), (1 January 2001) doi:10.1117/1.1331271
TOPICS: Speckle, Digital signal processing, Speckle pattern, Optical signal processing, Cameras, Optical filters, Filtering (signal processing), Quantization, Laser processing, Sensors
Opt. Eng. 40(1), (1 January 2001) doi:10.1117/1.1332276
TOPICS: Signal attenuation, Mirrors, Interferometry, Signal detection, Semiconductor lasers, Autocollimators, Reflectors, Signal to noise ratio, Ferroelectric materials, Photodiodes
COLOR IMAGE ANALYSIS
Hyun Wook Park, Taiyi Cheng, Yongmin Kim
Opt. Eng. 40(1), (1 January 2001) doi:10.1117/1.1334605
TOPICS: Image filtering, Nonlinear filtering, Electronic filtering, Image processing, RGB color model, Signal processing, Edge detection, Filtering (signal processing), Optical filters, Boxcar filters
IMAGE CODING
YuChen Hu, Chin-Chen Chang
Opt. Eng. 40(1), (1 January 2001) doi:10.1117/1.1327497
TOPICS: Image compression, Image quality, Quantization, Image segmentation, Digital imaging, Algorithm development, Image processing, Optical engineering, Computer programming, Computer science
INFRARED DOPPLER LIDAR
Christian Werner, Pierre Flamant, Oliver Reitebuch, Friedrich Koepp, Juergen Streicher, Stephan Rahm, Engelbert Nagel, Michael Klier, H. Herrmann, Claude Loth, P. Delville, Ph. Drobinski, B. Romand, Ch. Boitel, D. Oh, M. Lopez, Mireille Meissonnier, Didier Bruneau, Alain Dabas
Opt. Eng. 40(1), (1 January 2001) doi:10.1117/1.1335530
TOPICS: LIDAR, Doppler effect, Infrared radiation, Data centers, Sensors, Global Positioning System, Wind measurement, Heterodyning, Data storage, Pulsed laser operation
LASER THERMAL RECOVERY
Haiwu Yu, Wanguo Zheng, Chengcheng Wang, Shaobo He, Jun Tang, Yong Liu, Yu Chun
Opt. Eng. 40(1), (1 January 2001) doi:10.1117/1.1327502
TOPICS: Optical amplifiers, Nitrogen, Distortion, Adaptive optics, Prototyping, National Ignition Facility, Wavefront distortions, Refractive index, Lamps, Thermography
OPTICAL ENCRYPTION
Mitsuhiro Yamazaki, Junji Ohtsubo
Opt. Eng. 40(1), (1 January 2001) doi:10.1117/1.1334947
TOPICS: Holograms, 3D image reconstruction, Image encryption, Binary data, Computer security, Algorithms, Image processing, Annealing, Image quality, Fourier transforms
OPTICAL LIMITERS
Fengqi Guo, Wenfang Sun, Duo-Yuan Wang, Yinglin Song
Opt. Eng. 40(1), (1 January 2001) doi:10.1117/1.1334948
TOPICS: Optical limiting, Cadmium, Chlorine, Metals, Transmittance, Nonlinear optics, Absorption, Chemical species, Samarium, Saturable absorption
Communications
Massimo Martinelli, Joseph Palais
Opt. Eng. 40(1), (1 January 2001) doi:10.1117/1.1330703
TOPICS: Polarization, Fiber optics, Optical amplifiers, Light sources, Fiber optic communications, Modulation, Modulators, Light, Erbium, Ions
E. Kyriakis-Bitzaros, N. Haralabidis, Y. Moisiadis, Michalis Lagadas, A. Georgakilas, G. Halkias
Opt. Eng. 40(1), (1 January 2001) doi:10.1117/1.1334949
TOPICS: Semiconductor lasers, Pulsed laser operation, Optical interconnects, Computing systems, CMOS technology, Photodetectors, Microelectronics, Capacitance, Picosecond phenomena, Optoelectronics
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