Editorial
Opt. Eng. 40(6), (1 June 2001) doi:10.1117/1.1379367
ARTIFICIAL NOSES
Jeevanandra Karunamuni, Katherine Stitzer, DeLyle Eastwood, Keith Albert, David Walt, Steve Brown, Michael Myrick
Opt. Eng. 40(6), (1 June 2001) doi:10.1117/1.1367255
TOPICS: Sensors, Optical filters, Luminescence, Polymers, Niobium, Interference filters, Transmittance, Transducers, Nose, Beam splitters
CCD AND CMOS CAMERA EVALUATION
Jyrki Laitinen, Jani Saviaro, Heikki Ailisto
Opt. Eng. 40(6), (1 June 2001) doi:10.1117/1.1365937
TOPICS: Cameras, CCD cameras, Video, Interference (communication), Video surveillance, Signal to noise ratio, Imaging systems, CMOS cameras, Optical filtering, Control systems
COLOR IMAGE PROCESSING
Bogdan Smolka, Andrzej Chydzinski, Konrad Wojciechowski, Konstantinos Plataniotis, Anastasios Venetsanopoulos
Opt. Eng. 40(6), (1 June 2001) doi:10.1117/1.1367347
TOPICS: Image filtering, Digital filtering, Optical filters, Nonlinear filtering, Signal to noise ratio, Image processing, Denoising, RGB color model, Color image processing, Image enhancement
CONFOCAL MICROSCOPY
Opt. Eng. 40(6), (1 June 2001) doi:10.1117/1.1367864
TOPICS: Ferroelectric materials, Actuators, Confocal microscopy, Microscopes, Error analysis, Mirrors, Capacitance, Ceramics, Optical components, Interferometry
CURRENT DETECTORS
Benshun Yi, Beatrice Chu, Kin Seng Chiang
Opt. Eng. 40(6), (1 June 2001) doi:10.1117/1.1365106
TOPICS: Sensors, Magnetic sensors, Magnetism, Polarization, Glasses, Tolerancing, Birefringence, Reflection, Signal processing, Optical engineering
DIFFRACTIVE OPTICS FABRICATION
Manuel Ornelas-Rodriguez, Sergio Calixto-Carrera
Opt. Eng. 40(6), (1 June 2001) doi:10.1117/1.1367348
TOPICS: Microlens, Diffraction gratings, Gas lasers, Mid-IR, Microlens array, Carbon monoxide, Multiphoton lithography, Diffraction, Modulation, Spatial frequencies
DIGITAL HOLOGRAPHIC INTERFEROMETRY
Opt. Eng. 40(6), (1 June 2001) doi:10.1117/1.1367346
TOPICS: Digital micromirror devices, Holograms, Digital holography, Holographic interferometry, 3D image reconstruction, Micromirrors, Holography, Charge-coupled devices, Mirrors, Binary data
ELECTROLUMINESCENT DISPLAYS
Sara Otero-Barros, Robert Stevens, Wayne Cranton
Opt. Eng. 40(6), (1 June 2001) doi:10.1117/1.1357194
TOPICS: Ions, Thin films, Thin film devices, Etching, Electrodes, Silicon films, Scanning electron microscopy, Dielectrics, Head-mounted displays, Silicon
IMAGING
Opt. Eng. 40(6), (1 June 2001) doi:10.1117/1.1367345
TOPICS: Fractal analysis, Iterated function systems, Quantization, Computed tomography, Computer programming, Optical engineering, Computer simulations, Image compression, Image resolution, Binary data
H. Chung, Nelson Yung, Paul Cheung
Opt. Eng. 40(6), (1 June 2001) doi:10.1117/1.1367865
TOPICS: Motion estimation, Video, Video coding, Optical engineering, Video compression, Motion models, Reconstruction algorithms, Signal to noise ratio, Visualization, Detection and tracking algorithms
Opt. Eng. 40(6), (1 June 2001) doi:10.1117/1.1367256
TOPICS: Eye, Cameras, Video, Visualization, Eye models, Point spread functions, Image registration, Spatial frequencies, Target recognition, Image restoration
Opt. Eng. 40(6), (1 June 2001) doi:10.1117/1.1367352
TOPICS: Image filtering, Nonlinear filtering, Digital filtering, Remote sensing, Image processing, Image enhancement, Chemical elements, Optical engineering, Statistical analysis, Error analysis
Interferometry
Mats Lofdahl, Henrik Eriksson
Opt. Eng. 40(6), (1 June 2001) doi:10.1117/1.1365936
TOPICS: Interferometry, Chemical elements, Telescopes, Optical engineering, Wavefront sensors, Space telescopes, Mirrors, Error analysis, Wavefronts, Optical filters
LASERS
Haifeng Wang, Zhongyu Chen, Fuxi Gan
Opt. Eng. 40(6), (1 June 2001) doi:10.1117/1.1367349
TOPICS: Digital video discs, Phase shifts, Objectives, Gallium nitride, Computer simulations, Optical storage, Super resolution, Collimation, Optical discs, Optical engineering
Yakov Sidorin, Roland Shack
Opt. Eng. 40(6), (1 June 2001) doi:10.1117/1.1369596
TOPICS: Monochromatic aberrations, Semiconductor lasers, Gaussian beams, Imaging systems, Beam analyzers, Optical engineering, Calibration, Optical testing, Laser sources, Sensors
David Dayton, Stephen Browne, John Gonglewski, Steven Sandven, Joe Gallegos, Michael Shilko
Opt. Eng. 40(6), (1 June 2001) doi:10.1117/1.1370059
TOPICS: Speckle, Fiber optic illuminators, Signal to noise ratio, Sensors, Receivers, Imaging systems, Atmospheric turbulence, Backscatter, Image processing, Deconvolution
NEAR-FIELD MICROSCOPY
Laurent Thiery, Nathalie Marini, Claudine Bainier, Daniel Charraut
Opt. Eng. 40(6), (1 June 2001) doi:10.1117/1.1369597
TOPICS: Reflection, Thermal modeling, Geometrical optics, Near field scanning optical microscopy, Metals, Coating, Ray tracing, Wet etching, Diffusion, Optical engineering
NEAR-INFRARED BIREFRINGENT FILTERS
Jingshan Wang, Haimin Wang, Philip Goode, Thomas Spirock, Chik-Yin Lee, Nuggehalli Ravindra, Jun Ma, Carsten Denker
Opt. Eng. 40(6), (1 June 2001) doi:10.1117/1.1367350
TOPICS: Calcite, Optical filters, Optical design, Wave plates, Fabry–Perot interferometers, Magnetism, Crystals, Observatories, Image filtering, Liquid crystals
OLEFIN COPOLYMERS, OPTICAL PROPERTIES
Opt. Eng. 40(6), (1 June 2001) doi:10.1117/1.1369411
TOPICS: Polymers, Birefringence, Refractive index, Optical properties, Transmittance, Glasses, Polymethylmethacrylate, Waveguides, Thermography, Absorption
OPTICAL DATA STORAGE
Opt. Eng. 40(6), (1 June 2001) doi:10.1117/1.1369410
TOPICS: Sensors, Modulation, Diffraction, Signal detection, Optical discs, Phase shift keying, Reflectivity, Optical engineering, Computer simulations, Convolution
OPTICAL FIBERS
Masaaki Takaya, Shinji Nagasawa
Opt. Eng. 40(6), (1 June 2001) doi:10.1117/1.1369142
TOPICS: Connectors, Multimode fibers, Lithium, Single mode fibers, Temperature metrology, Optical engineering, Polishing, Humidity, Optical fabrication, Index matching antireflective coatings
Farhad Hakimi, Hosain Hakimi
Opt. Eng. 40(6), (1 June 2001) doi:10.1117/1.1369144
TOPICS: Dispersion, Optical fibers, Optical testing, Fourier transforms, Picosecond phenomena, Interferometers, Modulation, Double patterning technology, Spectral resolution, Phase shifts
OPTICAL NETWORKS
Wencai Jing, Ge Zhou, Yimo Zhang, Wei Liu, Jindong Tian, Xun Zhang, Haifeng Li, Nan Zhang
Opt. Eng. 40(6), (1 June 2001) doi:10.1117/1.1371286
TOPICS: Data transmission, Sensors, Optical interconnects, Optical networks, Computer networks, Human-machine interfaces, Telecommunications, Field programmable gate arrays, Detector arrays, Signal attenuation
E. Buimovich, Dan Sadot, Samuel Rubin
Opt. Eng. 40(6), (1 June 2001) doi:10.1117/1.1364501
TOPICS: Receivers, Modulation, Homodyne detection, Interference (communication), Avalanche photodetectors, Computing systems, Computer simulations, Systems modeling, Optical networks, Binary data
OPTICAL RETARDATION
Yi Zhang, Shulian Zhang, Yanmei Han, Yan Li, Xiaonan Xu
Opt. Eng. 40(6), (1 June 2001) doi:10.1117/1.1371287
TOPICS: Wave plates, Laser applications, Laser resonators, Optical testing, Birefringence, Mirrors, Anisotropy, Interferometers, Resonators, Modulators
OPTOELECTRONIC MODULATORS
Opt. Eng. 40(6), (1 June 2001) doi:10.1117/1.1369143
TOPICS: Modulators, Modulation, Silicon, Mirrors, Waveguides, Diodes, Refractive index, Reflectivity, Solids, Optoelectronics
REFLECTANCE
Bernadette Philips-Invernizzi, Daniel Dupont, Claude Caze
Opt. Eng. 40(6), (1 June 2001) doi:10.1117/1.1370387
TOPICS: Scattering, Reflectivity, Light scattering, Absorption, Mie scattering, Particles, Radiative transfer, Rayleigh scattering, Optical engineering, Differential equations
SEEKER SIMULATION
HyunKi Hong, SurngGabb Jahng, KyoungSoo Doo, Jong Choi, Sung-Hyun Han
Opt. Eng. 40(6), (1 June 2001) doi:10.1117/1.1367344
TOPICS: Missiles, Reticles, Infrared radiation, Imaging infrared seeker, Modulation, Mid-IR, Short wave infrared radiation, Thermography, Infrared signatures, Infrared countermeasures
SOLID STATE LASERS
Xiaoyuan Peng, Anand Asundi, Yihong Chen, Zhengjun Xiong
Opt. Eng. 40(6), (1 June 2001) doi:10.1117/1.1365105
TOPICS: Thermal effects, Crystals, Temperature metrology, Thermography, Laser crystals, Semiconductor lasers, Infrared radiation, Interferometers, Refractive index, Laser beam diagnostics
THERMAL MEASUREMENT
Krzysztof Chrzanowski, Robert Matyszkiel, Joachim Fischer, Jaroslaw Barela
Opt. Eng. 40(6), (1 June 2001) doi:10.1117/1.1367351
TOPICS: Cameras, Temperature metrology, Transmittance, Calibration, Standards development, Signal processing, Black bodies, Mathematical modeling, Sensors, Optical engineering
Thin Films
Opt. Eng. 40(6), (1 June 2001) doi:10.1117/1.1369145
TOPICS: Coating, Thin films, Zinc, Diamond, Interfaces, Multilayers, Chemical vapor deposition, Optical engineering, Thin film coatings, Bessel functions
UNDERWATER IMAGE TRANSMISSION
Zhishen Liu, Yifan Yu, Kailin Zhang, Hailong Huang
Opt. Eng. 40(6), (1 June 2001) doi:10.1117/1.1364500
TOPICS: Image transmission, Modulation transfer functions, Image restoration, Point spread functions, Optical transfer functions, Water, Filtering (signal processing), Scattering, Light scattering, Image processing
VIBRATION SENSORS
K. Dharmsaktu, Arvind Kumar, Kehar Singh
Opt. Eng. 40(6), (1 June 2001) doi:10.1117/1.1370556
TOPICS: Crystals, Speckle, Diffusers, Speckle pattern, Vibrometry, Photography, Laser crystals, Fringe analysis, Phase modulation, Interferometry
Communications
Futoshi Yamamoto, Yasuyuki Miyama, Hirotoshi Nagata, Masumi Tamai
Opt. Eng. 40(6), (1 June 2001) doi:10.1117/1.1367257
TOPICS: Silicon, Modulators, Silicon films, Electrodes, Semiconducting wafers, Optoelectronic devices, Gold, Temperature metrology, Sputter deposition, Electro optics
Opt. Eng. 40(6), (1 June 2001) doi:10.1117/1.1367342
TOPICS: Ear, Temperature metrology, Fiber optics, Infrared radiation, Fiber optics tests, Radiometry, Optical fibers, Infrared detectors, Thermography, Sensors
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