Editorial
Opt. Eng. 41(12), (1 December 2002) doi:10.1117/1.1529200
OE Letters
Yi Bin Lu, Pak Lim Chu
Opt. Eng. 41(12), (1 December 2002) doi:10.1117/1.1521134
TOPICS: Switching, Switches, Nonlinear optics, Refractive index, Optical fibers, Erbium, Optical switching, Signal attenuation, Lutetium, Electrical engineering
Fei Liu, Yupin Luo, Dongcheng Hu
Opt. Eng. 41(12), (1 December 2002) doi:10.1117/1.1519542
TOPICS: Image segmentation, Image processing algorithms and systems, Data modeling, Binary data, Magnetic resonance imaging, Instrument modeling, Image classification, Image analysis, Prototyping, Partial differential equations
Opt. Eng. 41(12), (1 December 2002) doi:10.1117/1.1520542
TOPICS: LCDs, Wave plates, Birefringence, Polarization, Linear polarizers, Polarizers, Phase shifts, Sensors, Argon ion lasers, Physics
SPECIAL SECTION ON ADVANCES IN UV GROUND- AND SPACE-BASED MEASUREMENTS AND MODELING
Opt. Eng. 41(12), (1 December 2002) doi:10.1117/1.1516824
TOPICS: Ultraviolet radiation, Ozone, Atmospheric particles, Atmospheric modeling, Absorption, Scattering, Molecules, Visible radiation, Water, Atmospheric optics
Opt. Eng. 41(12), (1 December 2002) doi:10.1117/1.1516822
TOPICS: Ultraviolet radiation, Absorption, Atmospheric modeling, Clouds, Aerosols, Data modeling, Visible radiation, Satellites, Optical properties, Water
Nickolay Krotkov, Jay Herman, Pawan Bhartia, Colin Seftor, Antti Arola, Jussi Kaurola, S. Kalliskota, Petteri Taalas, Igor Geogdzhayev
Opt. Eng. 41(12), (1 December 2002) doi:10.1117/1.1519541
TOPICS: Clouds, Ultraviolet radiation, Aerosols, Satellites, Atmospheric modeling, Reflectivity, Data modeling, Ozone, Spectroscopy, 3D modeling
Alois Schmalwieser, Guenther Schauberger, Michal Janouch, Manuel Nunez, Tapani Koskela, Daniel Berger, Gabriel Karamanian, Pavel Prosek, Kamil Laska
Opt. Eng. 41(12), (1 December 2002) doi:10.1117/1.1517575
TOPICS: Ultraviolet radiation, Atmospheric modeling, Radiation effects, Ozone, Clouds, Medicine, Sun, Optical engineering, Solar radiation models, Data modeling
Opt. Eng. 41(12), (1 December 2002) doi:10.1117/1.1516818
TOPICS: Ultraviolet radiation, Clouds, Ozone, Aerosols, Reflectivity, Satellites, Absorption, Atmospheric modeling, Transmittance, Error analysis
Masako Sasaki, Shu Takeshita, Takehiko Oyanagi, Yukiharu Miyake, Toshibumi Sakata
Opt. Eng. 41(12), (1 December 2002) doi:10.1117/1.1516823
TOPICS: Ozone, Radiometry, Calibration, Scientific research, Lamps, Optical engineering, Precision calibration, Clouds, Solar energy, Aerosols
Opt. Eng. 41(12), (1 December 2002) doi:10.1117/1.1516819
TOPICS: Ultraviolet radiation, Aerosols, Clouds, Molybdenum, Satellites, Line edge roughness, UV optics, Ozone, Radiometry, Reflectivity
Anna Siani, Giuseppe Casale, Alessandro Galliani
Opt. Eng. 41(12), (1 December 2002) doi:10.1117/1.1516821
TOPICS: Ozone, Ultraviolet radiation, Atmospheric modeling, Optical engineering, Data centers, Radiation effects, Climatology, Diagnostics, Displays, Data modeling
Daniel Schmucki, Rolf Philipona
Opt. Eng. 41(12), (1 December 2002) doi:10.1117/1.1516820
TOPICS: Ultraviolet radiation, Aerosols, Atmospheric modeling, Solar radiation, Ozone, Atmospheric particles, Radiation effects, Optical engineering, Clouds, Instrument modeling
Opt. Eng. 41(12), (1 December 2002) doi:10.1117/1.1517574
TOPICS: Calibration, Lamps, Ultraviolet radiation, Mercury, Monochromators, Optical engineering, Agriculture, Photon counting, Temperature metrology, Photomultipliers
Opt. Eng. 41(12), (1 December 2002) doi:10.1117/1.1516825
TOPICS: Ozone, Calibration, Sun, Satellites, Ultraviolet radiation, Spectral calibration, Fermium, Frequency modulation, Spectrometers, Satellite communications
APODIZATION
Alexander Goncharov, Daniil Puryayev
Opt. Eng. 41(12), (1 December 2002) doi:10.1117/1.1518506
TOPICS: Apodization, Mirrors, Point spread functions, Ray tracing, Diffraction, Wavefronts, Spherical lenses, Geometrical optics, Solids, Optical engineering
DEFECT DETECTION
Xue Zhi Yang, Grantham Pang, Nelson Yung
Opt. Eng. 41(12), (1 December 2002) doi:10.1117/1.1517290
TOPICS: Wavelets, Defect detection, Sensors, Wavelet transforms, Feature extraction, Error analysis, Optical engineering, Digital filtering, Optical filters, Discrete wavelet transforms
DIFFRACTIVE OPTICS
Jyh-Rou Sze, Mao-Hong Lu
Opt. Eng. 41(12), (1 December 2002) doi:10.1117/1.1517287
TOPICS: Lutetium, Signal to noise ratio, Reactive ion etching, Image segmentation, Bessel beams, Optical engineering, Optical components, Double patterning technology, Photography, Etching
Opt. Eng. 41(12), (1 December 2002) doi:10.1117/1.1518993
TOPICS: Axicons, Ultraviolet radiation, Optical components, Diffraction, Chemical elements, Diffraction gratings, Sol-gels, Collimation, Optical testing, Binary data
Opt. Eng. 41(12), (1 December 2002) doi:10.1117/1.1518994
TOPICS: Vertical cavity surface emitting lasers, Diffraction, Tolerancing, Integrated optics, Fiber couplers, Microlens, Optical engineering, Near field, Refractive index, Mathematical modeling
FRACTURE TESTING
Claude Klein, Richard Miller, Richard Gentilman
Opt. Eng. 41(12), (1 December 2002) doi:10.1117/1.1517578
TOPICS: Failure analysis, Sapphire, Zinc, Crystals, Polishing, Chemical vapor deposition, Infrared materials, Diamond, Glasses, Unattended ground sensors
Image Processing
Abdel-Ouahab Boudraa, Azeddine Beghdadi, Sidi-Mohammed Dehak, Razvan Iordache
Opt. Eng. 41(12), (1 December 2002) doi:10.1117/1.1518031
TOPICS: Fuzzy logic, Image compression, Image quality, Image processing algorithms and systems, Quantization, Image segmentation, Image processing, Prototyping, Optical engineering, Reconstruction algorithms
Youssef Charfi, Vladimir Stankovic, Raouf Hamzaoui, Ameur Haouari, Dietmar Saupe
Opt. Eng. 41(12), (1 December 2002) doi:10.1117/1.1519244
TOPICS: Fractal analysis, Image compression, Distortion, Forward error correction, Reconstruction algorithms, Optical engineering, Binary data, Lithium, Error analysis, Image transmission
Chong Tong, P. Yuen, Y. Wong
Opt. Eng. 41(12), (1 December 2002) doi:10.1117/1.1517289
TOPICS: Image segmentation, Image processing algorithms and systems, Algorithm development, Detection and tracking algorithms, Image processing, Optical engineering, Algorithms, Mathematics, Visual process modeling, Machine vision
Yongchang Zhu, Tatsuo Takada, Yoshihiro Murooka
Opt. Eng. 41(12), (1 December 2002) doi:10.1117/1.1510535
TOPICS: Birefringence, Modulation, Optical testing, Image processing, Kerr effect, Geometrical optics, Electro optics, Dielectrics, Photoelasticity, Liquids
INJECTION LASERS
Opt. Eng. 41(12), (1 December 2002) doi:10.1117/1.1518677
TOPICS: Vertical cavity surface emitting lasers, Refractive index, Gallium arsenide, Semiconductor lasers, Reflectivity, Semiconductors, Photonic crystals, Waveguides, Reflection, Aluminum
Interferometry
Huijie Zhao, Guangjun Zhang
Opt. Eng. 41(12), (1 December 2002) doi:10.1117/1.1517055
TOPICS: Interferometers, Polarization, Heterodyning, Prisms, Mirrors, Error analysis, Phase measurement, Metals, Reflectors, Nonlinear optics
Opt. Eng. 41(12), (1 December 2002) doi:10.1117/1.1518032
TOPICS: Continuous wavelet transforms, Wavelets, Wavelet transforms, Speckle, Fringe analysis, Image filtering, Speckle pattern, Phase measurement, Interferometry, Spatial frequencies
Opt. Eng. 41(12), (1 December 2002) doi:10.1117/1.1518678
TOPICS: Optimization (mathematics), Dielectric filters, Signal attenuation, Mach-Zehnder interferometers, Dispersion, Optical filters, Wavelength division multiplexing, Optical engineering, Manufacturing, Optical communications
LASER MICROWELDING
Ulrich Fischer, O. Krips, E. Mueller, A. Jacob
Opt. Eng. 41(12), (1 December 2002) doi:10.1117/1.1517577
TOPICS: Optical fibers, Laser welding, Fiber couplers, Photonic integrated circuits, Fiber lasers, Fiber coupled lasers, Single mode fibers, Polishing, Semiconductor lasers, Lasers
On-Chip Light Sources
Opt. Eng. 41(12), (1 October 2003) doi:10.1117/1.1520541
TOPICS: Silicon, Interfaces, Electro optics, Integrated circuit design, Integrated circuits, CMOS technology, Quantum efficiency, Integrated optics, External quantum efficiency, Standards development
OPTICAL CORRELATION
Opt. Eng. 41(12), (1 December 2002) doi:10.1117/1.1518676
TOPICS: Fourier transforms, Binary data, Optical engineering, Image processing, Fringe analysis, Brain, Transparency, Charge-coupled devices, Analog electronics, Optical correlators
Opt. Eng. 41(12), (1 December 2002) doi:10.1117/1.1517576
TOPICS: Phase only filters, Signal to noise ratio, Spatial light modulators, RGB color model, Pattern recognition, Optical correlators, Phase shift keying, Optical engineering, Image filtering, Optimization (mathematics)
Optical Sensors
S. Lee, K. Geetha, V. Nampoori, C. Vallabhan, Periasamy Radhakrishnan
Opt. Eng. 41(12), (1 December 2002) doi:10.1117/1.1519243
TOPICS: Sensors, Cladding, Optical fibers, Fiber optics sensors, Wave sensors, Absorption, Biological and chemical sensing, Modulation, Remote sensing, Fiber optics
I. Abdulhalim, S. Millward, G. Moores, L. Firth, Francis Placido
Opt. Eng. 41(12), (1 December 2002) doi:10.1117/1.1518505
TOPICS: Signal to noise ratio, Modulation, Sensors, Position sensors, Light sources, Electrodes, Amplifiers, Optical amplifiers, Inspection, Time metrology
Zhaofei Zhou, Tao Zhang, Wenjie Li, Wei Huang
Opt. Eng. 41(12), (1 December 2002) doi:10.1117/1.1518507
TOPICS: Sensors, Scattering, Laser scattering, Interferometry, Photodetectors, Light scattering, Calibration, Profilometers, Integration, Objectives
Opt. Eng. 41(12), (1 December 2002) doi:10.1117/1.1517056
TOPICS: Modulation transfer functions, Image restoration, Filtering (signal processing), Sensors, Electronic filtering, Optical transfer functions, Signal to noise ratio, Image sensors, Fourier transforms, Linear filtering
REFLECTANCE MEASUREMENT
Xiao Tang, Jian Zheng
Opt. Eng. 41(12), (1 December 2002) doi:10.1117/1.1517288
TOPICS: Reflectivity, Glasses, Scattering, Coating, Optical discs, Calibration, Refractive index, Metals, Standards development, Digital video discs
Remote Sensing
Opt. Eng. 41(12), (1 December 2002) doi:10.1117/1.1518995
TOPICS: Expectation maximization algorithms, Principal component analysis, Image classification, Vegetation, Statistical analysis, Remote sensing, Optical engineering, Multispectral imaging, Algorithm development, Earth observing sensors
SYNTHETIC APERTURE RADAR
Bir Bhanu, Grinnell Jones
Opt. Eng. 41(12), (1 December 2002) doi:10.1117/1.1517286
TOPICS: Synthetic aperture radar, Scattering, Data modeling, Detection and tracking algorithms, Performance modeling, Systems modeling, Optical engineering, Target recognition, Process modeling, Radar
Opt. Eng. 41(12), (1 December 2002) doi:10.1117/1.1519245
TOPICS: Wavelets, Synthetic aperture radar, Image processing, Optical correlators, Speckle, Fourier transforms, Denoising, Device simulation, Image filtering, Discrete wavelet transforms
WAVE PLATES
Opt. Eng. 41(12), (1 December 2002) doi:10.1117/1.1519242
TOPICS: Wave plates, Polarizers, Reflection, Surface finishing, Phase shifts, Polarization, Reflectivity, Polishing, Helium cadmium lasers, Metals
WAVEGUIDE LASERS
Yangwu Ma, Di Liang
Opt. Eng. 41(12), (1 December 2002) doi:10.1117/1.1518033
TOPICS: Gas lasers, Carbon monoxide, Waveguide lasers, Laser stabilization, Modulation, Servomechanisms, Reflectivity, Mirrors, Ceramics, Control systems
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