OE Letters
Hai-Han Lu, Heng-Sheng Su, Ming-Chuan Wang, Hsu-Hung Huang
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1567262
TOPICS: Modulation, Semiconductor lasers, Single mode fibers, Composites, Optical testing, Fiber amplifiers, Fiber lasers, Telecommunications, Analog electronics, Fiber optics
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1567261
TOPICS: Fiber Bragg gratings, Sensors, Reflectivity, Remote sensing, Backscatter, Telecommunications, Fiber lasers, Modulation, Standards development, Signal detection
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1567734
TOPICS: Diffraction, Holograms, Volume holography, Diffraction gratings, Light, Light sources, Picosecond phenomena, Instrument modeling, Modulation, Multiplexing
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1566968
TOPICS: Inspection, Shearography, CCD image sensors, Sensors, Speckle, Image sensors, CMOS sensors, Nondestructive evaluation, CCD cameras, Image processing
Y.Y. Hung, HuaiMin Shang, Lian Xiang Yang
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1567263
TOPICS: Holography, Shearography, Fringe analysis, Speckle pattern, Digital holography, Prisms, Cameras, Nondestructive evaluation, Light scattering, Wavefronts
Pramod Rastogi, Akshay Sharma
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1566774
TOPICS: Holograms, 3D image reconstruction, Digital holography, Charge-coupled devices, Fourier transforms, Holography, Image acquisition, Spatial frequencies, CCD cameras, Digital recording
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1566004
TOPICS: Speckle pattern, Holography, Fourier transforms, Speckle, Interferometers, Polarization, Visibility, Microscopes, Speckle interferometry, CCD cameras
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1566776
TOPICS: Microelectromechanical systems, Optoelectronics, Sensors, Computer aided design, Clouds, Holography, Optical engineering, Electromechanical design, Shape analysis, Finite element methods
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1565350
TOPICS: Spherical lenses, Optical testing, Surface finishing, Tolerancing, Cameras, Wavefronts, Optical spheres, Data acquisition, Microscopy, Microscopes
Xiaoping Qian, Kevin Harding
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1566777
TOPICS: Cameras, Sensors, Spherical lenses, Inspection, Algorithm development, Optical spheres, Optical engineering, Imaging systems, Reflection, Picosecond phenomena
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1566780
TOPICS: Projection systems, CCD cameras, Error analysis, Optical engineering, Calibration, LCDs, Cameras, Modulation, Phase shift keying, Inspection
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1566781
TOPICS: 3D metrology, Sensors, Speckle pattern, Interferometry, Optical engineering, CCD cameras, Glasses, Phase measurement, Fringe analysis, Environmental sensing
Ichirou Yamaguchi, Jun-ichi Kato, Hirokazu Matsuzaki
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1566778
TOPICS: Digital holography, Phase shifts, Digital imaging, Imaging systems, Speckle, Interferometry, 3D image reconstruction, Charge-coupled devices, Mirrors, 3D image processing
John Palmateer
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1565349
TOPICS: Inspection, Computer aided design, Reflection, Optical filters, Clouds, Solid modeling, Convolution, Cameras, Scanners, Feature extraction
Vladimir Markov, James Trolinger, John Webster, Gerard Pardoen
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1566003
TOPICS: Laser Doppler velocimetry, Sensors, Corrosion, Inspection, Signal processing, Signal detection, Signal to noise ratio, Chemical elements, Metals, Optical engineering
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1565351
TOPICS: Speckle, Heart, Mechanics, Speckle pattern, Ischemia, Fourier transforms, Particles, Microelectromechanical systems, Speckle metrology, Optical engineering
Jeffrey Helm, Michael Sutton, Stephen McNeill
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1566001
TOPICS: Cameras, 3D metrology, 3D image processing, Imaging systems, 3D modeling, Image processing, Calibration, Optical engineering, Machine vision, Computer vision technology
Jeffrey Helm, Michael Sutton, Stephen McNeill
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1566002
TOPICS: Finite element methods, 3D modeling, Optical engineering, Shape analysis, 3D metrology, Aluminum, Numerical simulations, Data conversion, 3D image processing, Computer simulations
Pramod Rastogi, Jean-Luc Sandoz
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1566775
TOPICS: Holography, Holographic interferometry, Deflectometry, Fringe analysis, Reliability, Holograms, Optical engineering, Photography, Phase shifts, Data modeling
Alejandro Maranon, Andrew Nurse, Jonathan Huntley
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1566779
TOPICS: Genetic algorithms, Composites, Inverse problems, Gallium, Optical engineering, Chemical elements, Optimization (mathematics), Manufacturing, Damage detection, Nondestructive evaluation
Steven Shepard, James Lhota, Bruce Rubadeux, David Wang, Tasdiq Ahmed
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1566969
TOPICS: Infrared cameras, Thermography, Signal to noise ratio, Cameras, Signal processing, Image enhancement, Image processing, Diffusion, Infrared imaging, Data acquisition
Y.Y. Hung, HuaiMin Shang
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1567264
TOPICS: Fringe analysis, Nondestructive evaluation, Reflectivity, Machine vision, Mirrors, Computer vision technology, Phase shifts, Shearography, 3D vision, Inspection
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1566773
TOPICS: Holography, Image processing, Interferometry, Speckle, Cameras, Holograms, Shearography, Mirrors, Computing systems, Holographic interferometry
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1566005
TOPICS: Pulsed laser operation, 3D metrology, Inspection, Sensors, Laser systems engineering, Analytical research, Image sensors, Modal analysis, Phase measurement, Image processing
Fang Chen, Gordon Brown, M. Marchi, Martin Dale
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1566006
TOPICS: Pulsed laser operation, Fringe analysis, Holographic interferometry, Laser interferometry, Speckle pattern, Optical engineering, Laser metrology, Laser applications, Interferometry, High speed cameras
Hai-Han Lu, Po-Chou Lai, Hsiang-Chih Chen, Ya-Lin Chen
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1564593
TOPICS: Dense wavelength division multiplexing, Optical amplifiers, Channel projecting optics, Analog electronics, Vestigial sideband modulation, Receivers, Modulation, Video, Amplitude modulation, Single mode fibers
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1564104
TOPICS: Wavelets, Data modeling, Image segmentation, Wavelet transforms, Expectation maximization algorithms, Edge detection, Optical engineering, Model-based design, Californium, Quantization
Vladimir Svirid, Sergei Khotiaintsev, Pieter Swart
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1563648
TOPICS: Transducers, Refractive index, Optical fibers, Optical components, Liquids, Geometrical optics, Reflection, Multimode fibers, Optical engineering, Glasses
Ken Hsu, Shiuan-Huei Lin, Yi-Nan Hsiao, Wha-Tzong Whang
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1564102
TOPICS: Holograms, Holography, Diffraction, Molecules, Polymers, Data storage, Scattering, Diffraction gratings, Volume holography, Refractive index
Wen-Jyi Hwang, Ching-Fung Chine, Wen-Liang Hwang
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1563233
TOPICS: Computer programming, Wavelets, JPEG2000, Image transmission, Signal to noise ratio, Laser induced plasma spectroscopy, Lithium, Optical engineering, Distortion, Reconstruction algorithms
Wen-Nung Lie, Cheng Chuang
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1564099
TOPICS: Image registration, Detection and tracking algorithms, Laser induced plasma spectroscopy, Image segmentation, Optical engineering, Mouth, Feature extraction, Thermography, Thermal modeling, Image processing algorithms and systems
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1564103
TOPICS: Mirrors, Phase shifts, Speckle pattern, Calibration, Microelectromechanical systems, Ferroelectric materials, Spatial resolution, Beam splitters, Fringe analysis, CCD cameras
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1563231
TOPICS: Fiber amplifiers, Optical amplifiers, Modulators, Modulation, Phase modulation, Oscillators, Structured optical fibers, Phase shift keying, Optical engineering, Signal to noise ratio
Wenjie Xie, Wentao Hu, Jiandong Xu, Feng Zhou
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1564100
TOPICS: Diffraction, Rod lasers, Transmission electron microscopy, Solid state lasers, Modes of laser operation, GRIN lenses, Laser crystals, Thermal modeling, Laser resonators, Resonators
Yinian Zhu, Pieter Swart, Beatrys Lacquet, Ping Shum, Chao Lu, Stephanus Spammer
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1564105
TOPICS: Optical amplifiers, Phase shifts, Optical filters, Ultraviolet radiation, Cladding, Refractive index, Wavelength division multiplexing, Fiber Bragg gratings, Optical engineering, Dense wavelength division multiplexing
S. Ziolkowski, Ines Frese, Henryk Kasprzak, Stefan Kufner
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1557171
TOPICS: Microlens, Spherical lenses, Microlens array, Polymers, Optical engineering, Temperature metrology, Physics, Microtechnology, Tolerancing, Polymethylmethacrylate
Ting-Ying Shen, Sham-Tsong Shiue
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1563647
TOPICS: Optical fibers, Optical coatings, Glasses, Polymers, Polymer optical fibers, Thin film coatings, Silica, Interfaces, Temperature metrology, Optical engineering
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1563234
TOPICS: Calibration, Modulators, Modulation, Polarimetry, Birefringence, Polarizers, Optical alignment, Bessel functions, Electro optics, Oscilloscopes
Anders Kaestner, Carl Nilsson
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1567260
TOPICS: Signal to noise ratio, Sensors, Luminescence, Time-frequency analysis, Signal detection, Statistical analysis, Fourier transforms, Optical engineering, Error analysis, Critical dimension metrology
Sajan George, S. Dilna, R. Prasanth, Periasamy Radhakrishnan, C. Vallabhan, V. Nampoori
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1564101
TOPICS: Doping, Semiconductors, Diffusion, Photoacoustic spectroscopy, Gallium arsenide, Modulation, Silicon, Optical proximity correction, Phonons, Phase shift keying
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1564791
TOPICS: Sensors, Signal to noise ratio, Infrared sensors, Reliability, Sensor fusion, Statistical analysis, Optical engineering, Feature extraction, Solids, Target detection
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1563235
TOPICS: Sensors, Head, Image registration, Cameras, Data acquisition, Optical engineering, Motion measurement, Position sensors, Image storage, Error analysis
Jong-Un Won, Jae-Gark Choi, Sang-Keun Oh, Dong-Min Kwak, Kil-Houm Park
Opt. Eng. 42(5), (1 May 2003) https://doi.org/10.1117/1.1563232
TOPICS: Video, Target detection, Cameras, Error analysis, Sensors, Motion models, Optical engineering, Detection and tracking algorithms, Multimedia, Databases
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