OE Letters
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1575235
TOPICS: Holography, Multiplexing, Head, Holograms, Spherical lenses, Optical design, Virtual point source, Signal to noise ratio, Diffraction, Image retrieval
Olivier Morice
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1574326
TOPICS: Diffraction, Kerr effect, Diffraction gratings, Optical engineering, Optical amplifiers, Wave propagation, Laser systems engineering, Frequency conversion, Systems modeling, Optical components
B. Zhang, Youfu Li, Fuchao Wu
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1574037
TOPICS: Cameras, Calibration, Distortion, Lithium, Optical engineering, Computer simulations, Curium, Device simulation, 3D image processing, Robot vision
Stephen Feng, Patrick Yip
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1572891
TOPICS: Signal to noise ratio, Error analysis, Optical engineering, Complex systems, Genetic algorithms, Statistical analysis, Interference (communication), Algorithm development, Dynamical systems, Computer engineering
Wendy Plesniak
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1572501
TOPICS: Holograms, Holography, Stereo holograms, Computing systems, 3D image reconstruction, Visualization, Image quality, Spherical lenses, Optical engineering, 3D modeling
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1573214
TOPICS: Data fusion, Signal attenuation, Signal detection, Signal processing, Error analysis, Switching, Optical engineering, Wireless communications, Code division multiplexing, Telecommunications
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1570429
TOPICS: Image encryption, Phase contrast, Spatial light modulators, Computer programming, Phase shifts, Fractional fourier transform, Crystals, Fourier transforms, Sensors, Phase shift keying
Changho Lee, Yongbae Jeon, Kwangsoo No
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1570427
TOPICS: Electro optics, Sensors, Electric field sensors, Electrodes, Crystals, Polishing, Lithium niobate, Electro optical sensors, Platinum, LCDs
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1571061
TOPICS: Sensors, Fiber Bragg gratings, Multiplexing, Reflectivity, Reflectometry, Temperature metrology, Optical fibers, Calibration, Light, Optical engineering
Masato Mizukami, Nobuhide Tanaka, Kunihiko Sasakura, Kazumasa Kaneko
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1569245
TOPICS: Connectors, Optical fibers, Optical networks, Prototyping, CCD cameras, Buildings, Interfaces, Optical engineering, Optical matrix switches, Switches
G. Charmaine Gilbreath, William Rabinovich, Timothy Meehan, Michael Vilcheck, Mena Stell, Rita Mahon, Peter Goetz, Eun Oh, John Vasquez, Kerry Cochrell, Robert Lucke, Sharon Mozersky
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1572155
TOPICS: Modulators, Video, Modulation, Eye, Video compression, Unmanned aerial vehicles, Retroreflectors, Analytical research, Wavelets, Optical engineering
Jackson Stroud
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1571549
TOPICS: Glasses, Standards development, Optical components, Phase shifts, Visibility, Optical design, Interferometers, Adaptive optics, Inspection, Interferometry
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1569496
TOPICS: Holograms, Charge-coupled devices, Digital holography, 3D image reconstruction, Interferometers, Spherical lenses, Digital imaging, Wavefronts, Holography, Holographic interferometry
Yih-Shyang Cheng, Chien-Mo Lai
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1570430
TOPICS: Holograms, 3D image reconstruction, Holography, Image processing, Fluorescence correlation spectroscopy, Numerical simulations, Charge-coupled devices, Eye, Optical engineering, Image segmentation
Xingsong Hou, Guizhong Liu
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1572497
TOPICS: Wavelets, Image compression, Quantization, Wavelet packet decomposition, Optical engineering, Distortion, Visualization, Reconstruction algorithms, Laser induced breakdown spectroscopy, Image quality
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1572889
TOPICS: Image compression, Modulation, Genetic algorithms, Optical engineering, Signal to noise ratio, Computer programming, Image quality, Image quality standards, Data compression, Error analysis
Image Processing
Edward Hore, Bin Qiu, Hong Ren Wu
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1572156
TOPICS: Digital filtering, Optical filters, Image filtering, Fuzzy logic, Distance measurement, Linear filtering, Switching, RGB color model, Electronic filtering, Interference (communication)
Toshihiro Okamura, Jun-ichi Kudo, Kunihiro Tanikawa
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1569497
TOPICS: Image processing, Multispectral imaging, Target detection, Visible radiation, Detection and tracking algorithms, Image classification, Sensors, Illumination engineering, Optical engineering, Remote sensing
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1571829
TOPICS: Wavelets, Angiography, Detection and tracking algorithms, Denoising, Algorithm development, Image resolution, Edge detection, X-rays, Stars, Image processing
Zadok Hadas, Kalman Wilner, Nissim Ben-Yosef
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1569495
TOPICS: Atrial fibrillation, Sun, Anisotropy, Infrared imaging, Thermography, Motion models, Superposition, Image processing, Absorption, Heat flux
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1572887
TOPICS: Absorption, Semiconductor lasers, Modulation, Laser stabilization, Solid state lasers, Spectroscopy, LIDAR, Pulsed laser operation, Feedback loops, Logic
Canan Karaalioglu, Yani Skarlatos
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1572498
TOPICS: Thin films, Fourier transforms, Aluminum, Fringe analysis, Cameras, Speckle interferometry, Interferometry, Speckle, Spatial frequencies, Image filtering
Carlos Rodrigues, Joao Pinto
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1571827
TOPICS: Speckle pattern, Speckle, Surface roughness, Profilometers, Optical engineering, Light scattering, Surface finishing, Coherence (optics), Scattering, Physics
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1570824
TOPICS: Fringe analysis, Image processing, Fourier transforms, Projection systems, High speed cameras, LCDs, Vibrometry, CCD cameras, Calibration, Sensors
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1573640
TOPICS: Phase measurement, Phase shifting, Fringe analysis, Fourier transforms, Phase shifts, Speckle, Interferometry, LCDs, Interferometers, Sensors
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1572890
TOPICS: LCDs, Ronchi rulings, Diffraction, Optical testing, Phase shifts, Fizeau interferometers, Wavefronts, Monochromatic aberrations, Liquid crystals, Diffraction gratings
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1573217
TOPICS: Calibration, Phase measurement, Phase shifts, Optical design, Teeth, Transmittance, Optical engineering, Charge-coupled devices, Distortion, 3D metrology
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1572500
TOPICS: Optical networks, Networks, Switching, Solids, Systems modeling, Switches, Packet switching, Optical engineering, Signal to noise ratio, Wave propagation
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1573215
TOPICS: Thin films, Antimony, Optical switching, Crystals, Transmittance, Gallium nitride, Optical storage, Data storage, Artificial intelligence, Interfaces
G. Qureshi, V. Gupta, Amit Singh, Avinashi Kapoor, K. Tripathi
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1569491
TOPICS: Waveguides, Birefringence, Multilayers, Polymers, Wave propagation, Refractive index, Glasses, Picosecond phenomena, Polymer multimode waveguides, Prisms
Chih-Sung Wu, Chulung Chen
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1571060
TOPICS: Optical correlators, Signal to noise ratio, Pattern recognition, Spatial light modulators, Joint transforms, Detection and tracking algorithms, Target detection, Fourier transforms, Optical engineering, Target recognition
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1570428
TOPICS: Infrared sensors, Sensors, Infrared radiation, Target detection, Detection and tracking algorithms, Target recognition, Surface properties, Data storage, Sensing systems, Double patterning technology
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1573641
TOPICS: Mirrors, Light scattering, Scattering, Optical design, Commercial off the shelf technology, Sensors, Image resolution, Charge-coupled devices, Geometrical optics, CCD image sensors
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1571828
TOPICS: Reconstruction algorithms, Image processing, Feature extraction, 3D displays, 3D image processing, Optical engineering, Displays, Computer simulations, Cameras, Imaging systems
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1572499
TOPICS: Thermal modeling, Solid state lasers, Rod lasers, Thermal effects, Optical engineering, Birefringence, Finite element methods, Temperature metrology, Refractive index, Thermography
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1570825
TOPICS: Statistical analysis, Surface roughness, Error analysis, Statistical modeling, Optical engineering, Image processing, Soil science, Analytical research, Ultrasonography, Backscatter
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1571830
TOPICS: Temperature metrology, Luminescence, Sensors, Temperature sensors, Optical filters, Fiber optics sensors, Silica, Optical fibers, Signal to noise ratio, Sensor performance
Outi Meinander, Weine Josefsson, Jussi Kaurola, Tapani Koskela, Kaisa Lakkala
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1569492
TOPICS: Ultraviolet radiation, Monochromators, Meteorology, Stray light, Clouds, Optical engineering, Environmental sensing, Ozone, Error analysis, Time metrology
Thomas Meitzler, David Bednarz, Darryl Bryk, Kimberly Lane, Euijung Sohn
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1572888
TOPICS: Data modeling, Fuzzy logic, Camouflage, Visualization, Light sources and illumination, Optical engineering, Calibration, Digital cameras, Oceanography, Reconnaissance
Wen-Yuan Chen, Chin-Hsing Chen
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1573216
TOPICS: Digital watermarking, Frequency shift keying, Amplitude shift keying, Image processing, Modulation, Discrete wavelet transforms, Image compression, Optical engineering, Demodulation, Wavelets
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1569494
TOPICS: Reflectivity, Interference (communication), Modulation, Semiconductor optical amplifiers, Optical engineering, Wavelength division multiplexing networks, Data conversion, Interferometers, Optical amplifiers, Signal attenuation
Ramon Rodriguez-Dagnino, Jose Faz-Gomez, Ignacio Larraga-Orozco
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1569493
TOPICS: Neural networks, Wavelength division multiplexing, Raman spectroscopy, Raman scattering, Evolutionary algorithms, Channel projecting optics, Wavelength division multiplexing networks, Receivers, Optical engineering, Nonlinear optics
Opt. Eng. 42(6), (1 June 2003) https://doi.org/10.1117/1.1571062
TOPICS: Sensors, Target detection, Multispectral imaging, Signal detection, Interference (communication), Optical filters, Electronic filtering, Signal to noise ratio, Detection and tracking algorithms, Signal attenuation
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