Opt. Eng. 42(10), (1 October 2003) doi:10.1117/1.1618233
OE Letters
Opt. Eng. 42(10), (1 October 2003) doi:10.1117/1.1609996
TOPICS: Polarization, Switching, Fiber lasers, Semiconductor lasers, Fiber Bragg gratings, Beam splitters, Semiconductors, Reflectivity, Signal to noise ratio, Semiconductor optical amplifiers
Ching-Cherng Sun, Chih-Yuan Hsu, Chia-Hao Wu, Wei-Chia Su
Opt. Eng. 42(10), (1 October 2003) doi:10.1117/1.1609454
TOPICS: Volume holography, Spatial filters, Optical filters, Diffraction, Holograms, Tolerancing, Holography, Image filtering, Three dimensional sensing, 3D surface sensing
Zhong Yu, Wei Wei, Xun Hou
Opt. Eng. 42(10), (1 October 2003) doi:10.1117/1.1609455
TOPICS: Ytterbium, Erbium, Waveguides, Beam propagation method, Absorption, Numerical analysis, Optical amplifiers, Amplifiers, Upconversion, Ions
Kemao Qian, Hock Soon Seah, Anand Asundi
Opt. Eng. 42(10), (1 October 2003) doi:10.1117/1.1609457
TOPICS: Fourier transforms, Fringe analysis, Phase interferometry, Phase shifts, Phase retrieval, Optical filters, Speckle, Interference (communication), Computer engineering, Mechanical engineering
Xiaoming Peng, Mingyue Ding, Chengping Zhou, Tianxu Zhang
Opt. Eng. 42(10), (1 October 2003) doi:10.1117/1.1609995
TOPICS: Pattern recognition, Algorithm development, Artificial intelligence, Image processing, Process control, Target recognition, Instrumentation engineering, Sensors, Parallel processing
Hanwei Guo, Diannong Liang, Yan Wang, Xiaotao Huang
Opt. Eng. 42(10), (1 October 2003) doi:10.1117/1.1609456
TOPICS: Synthetic aperture radar, Target detection, Data compression, Roads, Radar, Signal detection, Sensors, Antennas, Image compression, Detection and tracking algorithms
Opt. Eng. 42(10), (1 October 2003) doi:10.1117/1.1615993
Opt. Eng. 42(10), (1 October 2003) doi:10.1117/1.1600729
TOPICS: Semiconductor lasers, Waveguides, Glasses, Dense wavelength division multiplexing, Optical fibers, Fiber lasers, Integrated optics, Fiber Bragg gratings, Laser applications, Optical amplifiers
Gualtiero Nunzi Conti, Victor Tikhomirov, Marco Bettinelli, S. Berneschi, Massimo Brenci, Baojiu Chen, Stefano Pelli, Adolfo Speghini, Angela Seddon, Giancarlo Righini
Opt. Eng. 42(10), (1 October 2003) doi:10.1117/1.1604782
TOPICS: Glasses, Erbium, Waveguides, Diffusion, Sodium, Absorption, Ions, Ion exchange, Refractive index, Tungsten
Opt. Eng. 42(10), (1 October 2003) doi:10.1117/1.1605736
TOPICS: Diffusion, Glasses, Waveguides, Silver, Ions, Sodium, Refractive index, Refraction, Fabrication, Computer engineering
Shibin Jiang, Sergio Mendes, Yongdan Hu, Gualtiero Nunzi Conti, Arturo Chavez-Pirson, Yushi Kaneda, Tao Luo, Qingyun Chen, Sandrine Hocde, Dan Nguyen, Ewan Wright, Jiafu Wang, Wenyan Tian, Thomas Nikolajsen, Nasser Peyghambarian
Opt. Eng. 42(10), (1 October 2003) doi:10.1117/1.1600460
TOPICS: Optical amplifiers, Fiber amplifiers, Glasses, Semiconductor lasers, Cladding, Absorption, Erbium, Beam propagation method, High power fiber amplifiers, Ytterbium
Opt. Eng. 42(10), (1 October 2003) doi:10.1117/1.1605416
TOPICS: Waveguides, Silica, Ultraviolet radiation, Etching, Glasses, Integrated optics, Semiconducting wafers, Resonators, Ions, Cladding
Opt. Eng. 42(10), (1 October 2003) doi:10.1117/1.1601235
TOPICS: Waveguides, Silicon, Refractive index, Switches, Thermal optics, Beam propagation method, Interfaces, Crystals, Amorphous silicon, Wave propagation
Lawrence Shacklette, Paul Ferm, Robert Blomquist, MacRae Maxfield, Kevin Killian, L.S. Chun
Opt. Eng. 42(10), (1 October 2003) doi:10.1117/1.1601617
TOPICS: Switches, Polymers, Thermal optics, Waveguides, Switching, Optical simulations, Silicon, Optical engineering, Signal attenuation, Wave propagation
Opt. Eng. 42(10), (1 October 2003) doi:10.1117/1.1605104
TOPICS: Waveguides, Integrated optics, Beam propagation method, Telecommunications, Light wave propagation, Geometrical optics, Wave propagation, Ion exchange, Glasses, Phased array optics
Su-Frang Shu, Yin-Chieh Lai, Ci-Ling Pan
Opt. Eng. 42(10), (1 October 2003) doi:10.1117/1.1602087
TOPICS: Fiber Bragg gratings, Optical filters, Optical design, Dense wavelength division multiplexing, Modulation, Feature extraction, Composites, Genetic algorithms, Thallium, Refractive index
Opt. Eng. 42(10), (1 October 2003) doi:10.1117/1.1600730
TOPICS: Polarization, Waveguides, Polarizers, Optical alignment, Polarization maintaining fibers, Matrices, Jones vectors, Measurement devices, Optical engineering, Optical fibers
Jiubin Tan, Jie Zhang
Opt. Eng. 42(10), (1 October 2003) doi:10.1117/1.1602459
TOPICS: Sensors, Confocal microscopy, GRIN lenses, Signal detection, Capacitance, Ferroelectric materials, Actuators, Optical resolution, Gradient-index optics, Optical tracking
Yong Wang, Hong Po
Opt. Eng. 42(10), (1 October 2003) doi:10.1117/1.1602088
TOPICS: Fiber Bragg gratings, Raman spectroscopy, Fiber lasers, Reflectivity, Surface plasmons, Optical simulations, Solids, Continuous wave operation, Polonium, Laser resonators
Opt. Eng. 42(10), (1 October 2003) doi:10.1117/1.1606684
TOPICS: Reflectors, Polarization, Birefringence, Fiber lasers, Mirrors, Erbium, Physics, Laser applications, Polarization maintaining fibers, Single mode fibers
Wen-Yuan Chen, Chin-Hsing Chen
Opt. Eng. 42(10), (1 October 2003) doi:10.1117/1.1604783
TOPICS: Image processing, Image compression, Image restoration, Steganography, Quantization, Internet, Computer security, Data hiding, Image quality, Network security
Alfred Mertins
Opt. Eng. 42(10), (1 October 2003) doi:10.1117/1.1603757
TOPICS: Image transmission, Image restoration, Error analysis, Magnetorheological finishing, Wavelet transforms, Wavelets, Optical engineering, Reconstruction algorithms, Reliability, Forward error correction
Ju Jia Zou, Hong Yan, David Levy
Opt. Eng. 42(10), (1 October 2003) doi:10.1117/1.1607329
TOPICS: Image processing, Quantization, Image compression, Optical engineering, Signal processing, Image quality, Iterative methods, Distance measurement, Visual system, Visual process modeling
Opt. Eng. 42(10), (1 October 2003) doi:10.1117/1.1604399
TOPICS: Photomasks, Gallium arsenide, Etching, Lithography, Scanning electron microscopy, Holography, Photoresist materials, Fabrication, Diffusion, Ion beams
Hoshin Yee, H. Hong, J. Y. Chang
Opt. Eng. 42(10), (1 October 2003) doi:10.1117/1.1604118
TOPICS: Reactive ion etching, Resistance, Gallium nitride, Crystals, Etching, Plasma, Plasma etching, Resistors, Optical properties, Luminescence
Opt. Eng. 42(10), (1 October 2003) doi:10.1117/1.1601236
TOPICS: Calibration, Cameras, Laser processing, Fringe analysis, Projection systems, Dynamical systems, Gas lasers, Data modeling, Laser systems engineering, Binary data
Gang Liu, Binming Liang, Qu Li, Guo Liang Jin
Opt. Eng. 42(10), (1 October 2003) doi:10.1117/1.1604398
TOPICS: Voltage controlled current source, Current controlled current source, Switching, Directional couplers, Waveguides, Nonlinear optics, Optical engineering, Modulation, Lithium, Physics
Opt. Eng. 42(10), (1 October 2003) doi:10.1117/1.1607332
TOPICS: Liquid crystals, Optical limiting, Diffraction, Sensors, Laser damage threshold, Crystals, Nonlinear optics, Liquids, Nonlinear crystals, Refractive index
Yonghong Ma, Shizhong Xie, Shouxian She, Minghua Chen
Opt. Eng. 42(10), (1 October 2003) doi:10.1117/1.1604400
TOPICS: Raman spectroscopy, Single mode fibers, Fiber amplifiers, Optical amplifiers, Systems modeling, Electronics engineering, Telecommunications, Complex systems, Nonlinear optics, Wavelength division multiplexing
Dah-Jye Lee, Joseph Eifert, Pengcheng Zhan, Benjamin Westover
Opt. Eng. 42(10), (1 October 2003) doi:10.1117/1.1605737
TOPICS: 3D modeling, Distance measurement, Binary data, 3D metrology, 3D image processing, Cameras, Error analysis, Calibration, Machine vision, Data modeling
Zhenzhong Wei, Guangjun Zhang, Yuan Xu
Opt. Eng. 42(10), (1 October 2003) doi:10.1117/1.1606683
TOPICS: Calibration, Sensors, Visual process modeling, Cameras, Mathematical modeling, Sensor calibration, Projection systems, 3D acquisition, 3D vision, Inspection
George Fung, Nelson Yung, Grantham Pang
Opt. Eng. 42(10), (1 October 2003) doi:10.1117/1.1606458
TOPICS: Cameras, Calibration, Roads, Barium, 3D image processing, Optical engineering, Content addressable memory, Device simulation, Commercial off the shelf technology, Surveillance
Optical Sensors
Jolanata Ignac-Nowicka, Tadeusz Pustelny, Zbigniew Opilski, Erwin Maciak, Wieslaw Jakubik, Marian Urbanczyk
Opt. Eng. 42(10), (1 October 2003) doi:10.1117/1.1603756
TOPICS: Sensors, Lead, Gold, Signal detection, Nitrogen, NOx, Plasmons, Molecules, Thin films, Surface plasmons
Changsen Sun, Farhad Ansari
Opt. Eng. 42(10), (1 October 2003) doi:10.1117/1.1605417
TOPICS: Sensors, Acoustics, Fiber optics sensors, Ferroelectric materials, Transducers, Optical fibers, Fiber optics, Multiplexing, Michelson interferometers, Interferometers
Taketsugu Yao, Takumi Minemoto
Opt. Eng. 42(10), (1 October 2003) doi:10.1117/1.1605957
TOPICS: Image filtering, Phase only filters, Fourier transforms, Modulation, Image processing, Signal to noise ratio, Quantization, Electronic filtering, Nonlinear filtering, Pattern recognition
Opt. Eng. 42(10), (1 October 2003) doi:10.1117/1.1605956
TOPICS: Laser beam diagnostics, Diffraction, Error analysis, Reflection, Optical engineering, Sensors, Gaussian beams, Beam propagation method, Profilometers, Light
Yuanqing Wang
Opt. Eng. 42(10), (1 October 2003) doi:10.1117/1.1603758
TOPICS: Profilometers, Polarization, Optical amplifiers, Wave plates, Microscopes, 3D scanning, Surface finishing, Calcite, 3D metrology, Beam splitters
Khoa Le, Kishor Dabke, Gregory Egan
Opt. Eng. 42(10), (1 October 2003) doi:10.1117/1.1608002
TOPICS: Wavelets, Electrocardiography, Signal detection, Optical engineering, Time-frequency analysis, Chaos, Signal processing, Oscillators, Fourier transforms, Wavelet transforms
Fengzhi Pan, Liming Zhang
Opt. Eng. 42(10), (1 October 2003) doi:10.1117/1.1604397
TOPICS: Neural networks, Super resolution, Image filtering, Image restoration, Error analysis, Image resolution, Image enhancement, Linear filtering, Associative arrays, Optical engineering
Opt. Eng. 42(10), (1 October 2003) doi:10.1117/1.1607331
TOPICS: Visible radiation, Infrared imaging, Target recognition, Thermography, Sensors, Target acquisition, Contrast transfer function, Infrared radiation, Performance modeling, Modulation transfer functions
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