Editorial
Opt. Eng. 42(12), (1 December 2003) doi:10.1117/1.1633571
OE Letters
Hao Li, Tong Liu, Changyun Wen, Yeng Chai Soh, Ying Zhang
Opt. Eng. 42(12), (1 December 2003) doi:10.1117/1.1625951
TOPICS: Acousto-optics, Acoustics, Tunable filters, Composites, Ferroelectric materials, Structured optical fibers, Metals, Optical filters, Lithium, Optical communications
Opt. Eng. 42(12), (1 December 2003) doi:10.1117/1.1625678
TOPICS: Sol-gels, Glasses, Ultraviolet radiation, Calibration, Photomasks, Visible radiation, Absorbance, Diffractive optical elements, Diffusion, Nonlinear response
Marios Kalyvas, K. Yiannopoulos, G. Theophilopoulos, Hercules Avramopoulos, George Guekos
Opt. Eng. 42(12), (1 December 2003) doi:10.1117/1.1624612
TOPICS: Clocks, Amplitude modulation, Optical filters, Polarization, Filtering (signal processing), Fabry–Perot interferometers, Optical amplifiers, Signal generators, Oscilloscopes, Semiconductor optical amplifiers
Thanassis Houbavlis, Kyriakos Zoiros
Opt. Eng. 42(12), (1 December 2003) doi:10.1117/1.1624851
TOPICS: Clocks, Switches, Semiconductors, Logic, Ultrafast phenomena, Optical semiconductors, Switching, Polarization, Optical amplifiers, Beam controllers
Opt. Eng. 42(12), (1 December 2003) doi:10.1117/1.1625680
TOPICS: Waveguides, Amorphous silicon, Optical switching, Thermal optics, Silicon, Infrared radiation, Refractive index, Switches, Wave propagation, Zinc oxide
Tomiyuki Arakawa, Yutaka Uno, Hideaki Ono, Hiromi Takahashi, Kentaro Harase, Hideaki Okayama
Opt. Eng. 42(12), (1 December 2003) doi:10.1117/1.1625679
TOPICS: Refractive index, Fiber Bragg gratings, Cladding, Waveguides, Silica, Reflectivity, Plasma enhanced chemical vapor deposition, Polarization, Reactive ion etching, Light sources
Chrisada Sookdhis, Ting Mei, Hery Susanto Djie, J. Arokiaraj
Opt. Eng. 42(12), (1 December 2003) doi:10.1117/1.1625681
TOPICS: Waveguides, Brain-machine interfaces, Mirrors, Beam propagation method, Multimode interference devices, Optical communications, Quantum wells, Cladding, Refractive index, Wave propagation interference
AUTOMATED VISUAL INSPECTION
Opt. Eng. 42(12), (1 December 2003) doi:10.1117/1.1622389
TOPICS: Image fusion, Forensic science, Image quality, Image processing, Image enhancement, Optical engineering, Image acquisition, Light sources, Image segmentation, Firearms
CRACK MEASUREMENT
Perng-Fei Luo, C.-K. Chuang, Yuh Chao
Opt. Eng. 42(12), (1 December 2003) doi:10.1117/1.1622706
TOPICS: Chaos, Optical engineering, Computed tomography, Stereo vision systems, 3D image processing, Image processing, Cameras, Mechanical engineering, Digital cameras, Resistance
DIGITAL HOLOGRAPHY
Cheng Liu
Opt. Eng. 42(12), (1 December 2003) doi:10.1117/1.1624077
TOPICS: Digital holography, Holograms, Holography, 3D image reconstruction, Wavefronts, Shearography, Charge-coupled devices, Optical engineering, CCD cameras, Numerical analysis
FIBER AMPLIFIERS
Opt. Eng. 42(12), (1 December 2003) doi:10.1117/1.1623499
TOPICS: Optical amplifiers, Fiber amplifiers, L band, S band, Raman spectroscopy, Signal attenuation, Optical filters, Computer simulations, Radiofrequency ablation, Erbium
FIBER BRAGG GRATINGS
Opt. Eng. 42(12), (1 December 2003) doi:10.1117/1.1621004
TOPICS: Mirrors, Interferometers, Diffraction gratings, Fiber Bragg gratings, Diffraction, Ultraviolet radiation, Commercial off the shelf technology, Information technology, Beam splitters, Diamond
FIBER DISPERSION
Juanjuan Yan, Minghua Chen, Shizhong Xie, Bingkun Zhou
Opt. Eng. 42(12), (1 December 2003) doi:10.1117/1.1622707
TOPICS: Forward error correction, Picosecond phenomena, Polarization, Tolerancing, Remote sensing, Systems modeling, Single mode fibers, Dispersion, Birefringence, Interference (communication)
IMAGE RECONSTRUCTION
Opt. Eng. 42(12), (1 December 2003) doi:10.1117/1.1621874
TOPICS: Sensors, Computed tomography, Modulation transfer functions, Scanners, X-ray computed tomography, Optical engineering, Lanthanum, Data acquisition, Collimation, Image filtering
IMAGE RESTORATION
Hanyu Hong, Tianxu Zhang
Opt. Eng. 42(12), (1 December 2003) doi:10.1117/1.1621409
TOPICS: Deconvolution, Image processing, Estimation theory
INFRARED BEAMSPLITTERS
Opt. Eng. 42(12), (1 December 2003) doi:10.1117/1.1625380
TOPICS: Polarization, Beam splitters, Polarization analysis, Germanium, Infrared radiation, Coating, Metals, Reflection, Refraction, Reflectors
INFRARED DETECTORS
Mohammad Alam, Joseph Predina
Opt. Eng. 42(12), (1 December 2003) doi:10.1117/1.1621875
TOPICS: Sensors, Resistance, Wheatstone bridges, Data processing, Computer simulations, Resistors, Signal detection, Interferometry, Optical engineering
Opt. Eng. 42(12), (1 December 2003) doi:10.1117/1.1625377
TOPICS: Sensors, Quantum well infrared photodetectors, Mercury cadmium telluride, Staring arrays, Long wavelength infrared, Photodiodes, Infrared radiation, Infrared imaging, Silicon, Infrared photography
INFRARED-TO-VISIBLE CONVERTERS
Opt. Eng. 42(12), (1 December 2003) doi:10.1117/1.1625376
TOPICS: Visible radiation, Infrared imaging, Infrared radiation, 3D modeling, Optical fibers, Silica, Spatial resolution, Thermography, Temporal resolution, Transducers
Interferometry
Saul Almazan-Cuellar, Daniel Malacara-Hernandez
Opt. Eng. 42(12), (1 December 2003) doi:10.1117/1.1625378
TOPICS: Phase shifts, Wavefronts, Visibility, Fourier transforms, Optical engineering, Error analysis, Monochromatic aberrations, Interferometry, Wavelets, Signal processing
Tae-Joon Hwang, Seung Kim
Opt. Eng. 42(12), (1 December 2003) doi:10.1117/1.1625382
TOPICS: Diffraction gratings, Interferometers, Phase shifts, Diffraction, Mirrors, Phase shifting, Confocal microscopy, Optical design, Wavefronts, Reflectivity
Kiyofumi Matsuda, Geoffrey Bold, Tomas Barnes, Tomoaki Eiju, Chander Grover, Colin Sheppard
Opt. Eng. 42(12), (1 December 2003) doi:10.1117/1.1623285
TOPICS: Interferometers, Mirrors, Fringe analysis, Interferometry, Phase shift keying, Phase interferometry, Phase modulation, Optically addressed spatial light modulators, Holograms, Diffraction
LASER HEAT TREATING
Junchang Li, Jacques Merlin, Yingxiong Qin, Qiguang Zheng, Yunchang Fu
Opt. Eng. 42(12), (1 December 2003) doi:10.1117/1.1623763
TOPICS: Heat treatments, Optical simulations, Laser-matter interactions, Temperature metrology, Diffraction, Laser processing, Laser applications, Laser therapeutics, Laser energy, Optical engineering
LIQUID CRYSTALS ON SILICON
Youri Meuret, Patrick De Visschere
Opt. Eng. 42(12), (1 December 2003) doi:10.1117/1.1622705
TOPICS: Liquid crystal on silicon, Projection systems, Optical coatings, Reflection, Polarizers, Glasses, Optical simulations, Reflectivity, Liquid crystals, Lamps
MOTION BLUR
Opt. Eng. 42(12), (1 December 2003) doi:10.1117/1.1621406
TOPICS: Point spread functions, Cameras, Motion estimation, Image restoration, Imaging systems, Distortion, Optical transfer functions, Linear filtering, Optical engineering, Modulation transfer functions
OPTICAL ENCRYPTION
Opt. Eng. 42(12), (1 December 2003) doi:10.1117/1.1624850
TOPICS: Image segmentation, Image encryption, Fractional fourier transform, Computer security, Optical image encryption, Fourier transforms, Diffractive optical elements, Holography, Optical engineering, Computer simulations
Optical Sensors
Tuck Wah Ng, C.W. Ng
Opt. Eng. 42(12), (1 December 2003) doi:10.1117/1.1625379
TOPICS: Optical sensors, Sensors, Optical semiconductors, Semiconductors, Optical design, Optical fabrication, Optics manufacturing, Semiconducting wafers, Manufacturing, Signal attenuation
Jean Robillard, C.D. Luna-Moreno
Opt. Eng. 42(12), (1 December 2003) doi:10.1117/1.1625383
TOPICS: Switching, Refraction, Modulation, Polymers, Fiber optics, Absorption, Sensors, Switches, Organic semiconductors, Refractive index
PLZT THIN FILMS
Opt. Eng. 42(12), (1 December 2003) doi:10.1117/1.1624274
TOPICS: Electro optics, Refractive index, Thin films, Electrodes, Prisms, Pulsed laser operation, Thin film deposition, Oxygen, Sapphire, Waveguides
POLARIZERS
Dawei Wang, Shiju Guo, Sheng Yin
Opt. Eng. 42(12), (1 December 2003) doi:10.1117/1.1623284
TOPICS: Glasses, Particles, Silver, Sol-gels, Heat treatments, Scanning electron microscopy, Absorption, X-ray diffraction, Crystals, Photomicroscopy
POSITION ESTIMATION
Opt. Eng. 42(12), (1 December 2003) doi:10.1117/1.1621005
TOPICS: Infrared sensors, Sensors, Error analysis, Aluminum, Foam, Reflection, Infrared radiation, Packaging, Optical engineering, Infrared detectors
PROFILOMETRY
Ming Chang, Wei-Che Chang, Kao-Hui Lin
Opt. Eng. 42(12), (1 December 2003) doi:10.1117/1.1621408
TOPICS: Charge-coupled devices, Semiconductor lasers, CCD image sensors, CCD cameras, Laser beam diagnostics, Optical scanning, Optical testing, Image acquisition, 3D scanning, 3D metrology
RADIOMETRIC CALIBRATION
Grégory Bazalgette Courrège-Lacoste, Jos Groote-Schaarsberg, Rudolf Sprik, Steven Delwart
Opt. Eng. 42(12), (1 December 2003) doi:10.1117/1.1622961
TOPICS: Diffusers, Bidirectional reflectance transmission function, Scattering, Calibration, Silicon, Ultraviolet radiation, Radiative transfer, Data modeling, Sensors, Telescopic pixel displays
TIME-OF-FLIGHT RANGE FINDERS
Qiansong Chen, Dalong Zhao, Chenwei Yang, Yujing Huo
Opt. Eng. 42(12), (1 December 2003) doi:10.1117/1.1621407
TOPICS: Pulsed laser operation, Receivers, Transmitters, Distance measurement, Picosecond phenomena, Laser range finders, Time metrology, Logic, Sensors, Measurement devices
ULTRAVIOLET LASERS
Brent Knecht, Richard Fraser, D. Wheeler, C. Zietkiewicz, Andrey Senin, Leonid Mikheev, Vitaly Zuev, J. Gary Eden
Opt. Eng. 42(12), (1 December 2003) doi:10.1117/1.1624849
TOPICS: Electrodes, Dielectrics, Capacitors, Optical pumping, Pulsed laser operation, Iodine, Ceramics, Argon, Absorption, Lasers
X-RAY OPTICS
Opt. Eng. 42(12), (1 December 2003) doi:10.1117/1.1625381
TOPICS: Mirrors, Coating, Gold, X-rays, Silicon, Polishing, Surface finishing, Metrology, Optical engineering, Spherical lenses
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