OE Letters
Opt. Eng. 43(4), (1 April 2004) https://doi.org/10.1117/1.1648652
TOPICS: Silicon, Waveguides, Wet etching, Semiconducting wafers, Thermal optics, Variable optical attenuators, Silica, Etching, Interferometers, Interfaces
Opt. Eng. 43(4), (1 April 2004) https://doi.org/10.1117/1.1649231
TOPICS: L band, Composites, Wavelength division multiplexing, Modulation, Single mode fibers, Optical amplifiers, Lutetium, Televisions, Transmitters, Electro optical systems
Beam Profiling
Opt. Eng. 43(4), (1 April 2004) https://doi.org/10.1117/1.1651557
TOPICS: Digital micromirror devices, Profiling, Micromirrors, Optical beam profilers, Photodetectors, Optical testing, Gaussian beams, Power meters, High power lasers, Attenuators
Opt. Eng. 43(4), (1 April 2004) https://doi.org/10.1117/1.1666856
Electro-Optical Modulators
Opt. Eng. 43(4), (1 April 2004) https://doi.org/10.1117/1.1666865
TOPICS: Electrodes, Modulators, Polymers, Waveguides, Directional couplers, Modulation, Cladding, Electro optic polymers, Electro optics, Electrooptic modulators
Fabry-Perot Lasers
Opt. Eng. 43(4), (1 April 2004) https://doi.org/10.1117/1.1668281
TOPICS: Tunable lasers, Wavelength tuning, Laser optics, Fabry–Perot interferometers, Modulation, Switching, Optical switching, Light sources, Wavelength division multiplexing, Electro-optical engineering
Opt. Eng. 43(4), (1 April 2004) https://doi.org/10.1117/1.1666855
TOPICS: Cladding, Polishing, Refractive index, Fiber lasers, Optical pumping, Interfaces, Numerical simulations, Adhesives, Geometrical optics, Index matching antireflective coatings
Fingerprint Recognition
Opt. Eng. 43(4), (1 April 2004) https://doi.org/10.1117/1.1668280
TOPICS: Detection and tracking algorithms, Fingerprint recognition, Optical engineering, Databases, Distortion, Optical character recognition, Algorithm development, Electronics, Communication engineering, Image acquisition
Opt. Eng. 43(4), (1 April 2004) https://doi.org/10.1117/1.1666804
TOPICS: Computer programming, Optical engineering, Quantization, Image compression, Distortion, Instrumentation engineering, Image quality, Computer simulations, Information technology, Photonics
Opt. Eng. 43(4), (1 April 2004) https://doi.org/10.1117/1.1666859
TOPICS: Image compression, Multispectral imaging, JPEG2000, Distortion, Image quality, Wavelets, Remote sensing, Discrete wavelet transforms, Interferometers, Signal to noise ratio
Image Processing
Opt. Eng. 43(4), (1 April 2004) https://doi.org/10.1117/1.1666862
TOPICS: Image filtering, Optical filters, Image processing, Finite impulse response filters, Gaussian filters, Fourier transforms, Linear filtering, Optical engineering, Filtering (signal processing), Image resolution
Opt. Eng. 43(4), (1 April 2004) https://doi.org/10.1117/1.1666863
TOPICS: Image processing, Image interpolation, Reconstruction algorithms, Digital image processing, Vector spaces, Optical engineering, Cameras, Evolutionary algorithms, Digital imaging, Computer programming
Opt. Eng. 43(4), (1 April 2004) https://doi.org/10.1117/1.1666622
TOPICS: Interferometry, Digital filtering, Spatial resolution, Image processing, Reliability, Convolution, Image filtering, Smoothing, Metrology, Sensors
Opt. Eng. 43(4), (1 April 2004) https://doi.org/10.1117/1.1666857
TOPICS: Interferometers, Phase shifts, Wavefront distortions, Adaptive optics, Rod lasers, Glasses, Optical components, Wavefronts, Collimation, Phase shifting
Opt. Eng. 43(4), (1 April 2004) https://doi.org/10.1117/1.1666858
TOPICS: Speckle pattern, Speckle, Mirrors, Fringe analysis, Interferometry, Vibrometry, Interferometers, Pulsed laser operation, Wavefronts, Laser Doppler velocimetry
Opt. Eng. 43(4), (1 April 2004) https://doi.org/10.1117/1.1666861
TOPICS: Diffraction, Wavefronts, Interferometry, Interferometers, Infrared radiation, Diffraction gratings, Visible radiation, Surface roughness, Reflectivity, Infrared lasers
Opt. Eng. 43(4), (1 April 2004) https://doi.org/10.1117/1.1666870
TOPICS: Fourier transforms, Fringe analysis, 3D metrology, Shape analysis, Signal analyzers, Error analysis, Gallium, Phase modulation, Modulation, Analytical research
Opt. Eng. 43(4), (1 April 2004) https://doi.org/10.1117/1.1666773
TOPICS: Laser development, Semiconductor lasers, Interferometers, Laser stabilization, Rubidium, Modulation, Absorption, Femtosecond phenomena, Light sources, Interferometry
Jitter Supression
Opt. Eng. 43(4), (1 April 2004) https://doi.org/10.1117/1.1666596
TOPICS: Feedback control, Control systems, Optical filters, Finite impulse response filters, Electro optical modeling, Digital filtering, Sensors, Mirrors, Photodiodes, Adaptive optics
Opt. Eng. 43(4), (1 April 2004) https://doi.org/10.1117/1.1666707
TOPICS: Receivers, Telecommunications, Computer programming, Fiber Bragg gratings, Error analysis, Signal detection, Signal processing, Optical engineering, Thermography, Signal to noise ratio
Opt. Eng. 43(4), (1 April 2004) https://doi.org/10.1117/1.1666653
TOPICS: Light emitting diodes, Transmitters, Receivers, Transceivers, Infrared radiation, Photodiodes, Wireless communications, Signal to noise ratio, Field effect transistors, Capacitance
Opt. Eng. 43(4), (1 April 2004) https://doi.org/10.1117/1.1666821
TOPICS: Liquid crystals, Electrodes, Diffraction, Electro optics, Phased array optics, Electro optical modeling, Molecules, Birefringence, Instrument modeling, Dielectrics
Optical Processing
Opt. Eng. 43(4), (1 April 2004) https://doi.org/10.1117/1.1668283
TOPICS: Holography, Bragg cells, Diffraction, Multiplexing, Diffraction gratings, Adaptive optics, Holograms, 3D image reconstruction, Image transmission, Phase modulation
Opt. Eng. 43(4), (1 April 2004) https://doi.org/10.1117/1.1666864
TOPICS: Switching, Phase shifts, Solitons, Raman scattering, Switches, Birefringence, Raman spectroscopy, Femtosecond phenomena, Ultrafast phenomena, Scattering
Opt. Eng. 43(4), (1 April 2004) https://doi.org/10.1117/1.1666867
TOPICS: Absorption, Analytical research, Diffusion, Crystals, Solids, Optical engineering, Dielectrophoresis, Device simulation, Instrumentation engineering, Imaging devices
Refractive Index of Air
Opt. Eng. 43(4), (1 April 2004) https://doi.org/10.1117/1.1666860
TOPICS: Refractive index, Interferometers, Environmental sensing, Mirrors, Laser optics, Beam splitters, Retroreflectors, Receivers, Reflectivity, Optical engineering
Remote Sensing
Opt. Eng. 43(4), (1 April 2004) https://doi.org/10.1117/1.1651556
TOPICS: Alternate lighting of surfaces, Sensors, Reflectivity, Principal component analysis, Earth observing sensors, Atmospheric corrections, Sun, Photometry, Ozone, Landsat
Opt. Eng. 43(4), (1 April 2004) https://doi.org/10.1117/1.1668284
TOPICS: Semiconducting wafers, Inspection, Standards development, Microscopes, CCD image sensors, Wafer-level optics, Silicon, Semiconductors, Interferometry, Optical engineering
Silver Coatings
Opt. Eng. 43(4), (1 April 2004) https://doi.org/10.1117/1.1646409
TOPICS: Silver, Chromium, Reflectivity, Sputter deposition, Glasses, Humidity, Optical coatings, Argon, Thin films, Metals
Spectral Matching
Opt. Eng. 43(4), (1 April 2004) https://doi.org/10.1117/1.1666679
TOPICS: Light emitting diodes, Imaging systems, Glasses, Light sources, Chromium, Amplitude modulation, LED lighting, Multispectral imaging, Copper indium disulfide, Signal to noise ratio
YAG Lasers
Opt. Eng. 43(4), (1 April 2004) https://doi.org/10.1117/1.1666868
TOPICS: Q switching, Diodes, Q switched lasers, Crystals, Pulsed laser operation, Semiconductor lasers, Reflectivity, Absorption, Mirrors, Q switch crystals
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