Modulation transfer function estimation from nonspecific images

Jean-Marc Delvit; Dominique Leger; Sylvie Roques; Christophe Valorge

doi:10.1117/1.1724838

1 June 2004 Modulation transfer function estimation from nonspecific images

Jean-Marc Delvit, Dominique Leger, Sylvie Roques, Christophe Valorge

Author Affiliations +

Optical Engineering, Vol. 43, Issue 6, (June 2004). https://doi.org/10.1117/1.1724838

Abstract

Measurement of the modulation transfer function (MTF) to quantify the quality of an imaging system proves to be very important in the context of Earth observation satellites. In particular, this measurement is essential to carry out the focusing of the telescope, or to implement a deconvolution filter whose goal is to enhance the image contrast or to reduce the noise. Its knowledge also allows us to compare the characteristics of different known and unknown satellites. We suggest an univariate MTF measurement method using nonspecific views. First of all, the landscape has to be characterized to discriminate ground structure information from MTF information. Once this separation is carried out, landscape structure information can be extracted, allowing a classification between very uniform scenes and more structured ones. Then the MTF, which is described by a bidimensional analytical physical model, can be assessed using an artificial neural network. The principle is to use the artificial neural network to learn the MTF of simulated or perfectly known images, and then use it to assess the MTF of totally unknown images. We show that this method is robust even if noise is taken into account. As a result, maximum MTF assessment errors are less than 10%. This enables us to suggest further developments, including a general scheme for assessment of image quality.

©(2004) Society of Photo-Optical Instrumentation Engineers (SPIE)

Citation Download Citation

Jean-Marc Delvit, Dominique Leger, Sylvie Roques, and Christophe Valorge "Modulation transfer function estimation from nonspecific images," Optical Engineering 43(6), (1 June 2004). https://doi.org/10.1117/1.1724838

Published: 1 June 2004

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available