Opt. Eng. 43(4), (1 April 2004)https://doi.org/10.1117/1.1703542
OE Letters
Opt. Eng. 43(4), (1 April 2004)https://doi.org/10.1117/1.1648652
TOPICS: Silicon, Waveguides, Wet etching, Semiconducting wafers, Thermal optics, Variable optical attenuators, Silica, Etching, Interferometers, Interfaces
Opt. Eng. 43(4), (1 April 2004)https://doi.org/10.1117/1.1649231
TOPICS: L band, Composites, Wavelength division multiplexing, Modulation, Single mode fibers, Optical amplifiers, Lutetium, Televisions, Transmitters, Electro optical systems
Beam Profiling
Opt. Eng. 43(4), (1 April 2004)https://doi.org/10.1117/1.1651557
TOPICS: Digital micromirror devices, Profiling, Micromirrors, Optical beam profilers, Photodetectors, Optical testing, Gaussian beams, Power meters, High power lasers, Attenuators
Electro-Optical Modulators
Opt. Eng. 43(4), (1 April 2004)https://doi.org/10.1117/1.1666865
TOPICS: Electrodes, Modulators, Polymers, Waveguides, Directional couplers, Modulation, Cladding, Electro optic polymers, Electro optics, Electrooptic modulators
Fabry-Perot Lasers
Opt. Eng. 43(4), (1 April 2004)https://doi.org/10.1117/1.1668281
TOPICS: Tunable lasers, Wavelength tuning, Laser optics, Fabry–Perot interferometers, Modulation, Switching, Optical switching, Light sources, Wavelength division multiplexing, Electro-optical engineering
Opt. Eng. 43(4), (1 April 2004)https://doi.org/10.1117/1.1666855
TOPICS: Cladding, Polishing, Refractive index, Fiber lasers, Optical pumping, Interfaces, Numerical simulations, Adhesives, Geometrical optics, Index matching antireflective coatings
Fingerprint Recognition
Opt. Eng. 43(4), (1 April 2004)https://doi.org/10.1117/1.1668280
TOPICS: Detection and tracking algorithms, Fingerprint recognition, Optical engineering, Databases, Distortion, Optical character recognition, Algorithm development, Electronics, Communication engineering, Image acquisition
Opt. Eng. 43(4), (1 April 2004)https://doi.org/10.1117/1.1666804
TOPICS: Computer programming, Optical engineering, Quantization, Image compression, Distortion, Instrumentation engineering, Image quality, Computer simulations, Information technology, Photonics
Opt. Eng. 43(4), (1 April 2004)https://doi.org/10.1117/1.1666859
TOPICS: Image compression, Multispectral imaging, JPEG2000, Distortion, Image quality, Wavelets, Remote sensing, Discrete wavelet transforms, Interferometers, Signal to noise ratio
Image Processing
Opt. Eng. 43(4), (1 April 2004)https://doi.org/10.1117/1.1666862
TOPICS: Image filtering, Optical filters, Image processing, Finite impulse response filters, Gaussian filters, Fourier transforms, Linear filtering, Optical engineering, Filtering (signal processing), Image resolution
Opt. Eng. 43(4), (1 April 2004)https://doi.org/10.1117/1.1666863
TOPICS: Image processing, Image interpolation, Reconstruction algorithms, Digital image processing, Vector spaces, Optical engineering, Cameras, Evolutionary algorithms, Digital imaging, Computer programming
Opt. Eng. 43(4), (1 April 2004)https://doi.org/10.1117/1.1666622
TOPICS: Interferometry, Digital filtering, Spatial resolution, Image processing, Reliability, Convolution, Image filtering, Smoothing, Metrology, Sensors
Opt. Eng. 43(4), (1 April 2004)https://doi.org/10.1117/1.1666857
TOPICS: Interferometers, Phase shifts, Wavefront distortions, Adaptive optics, Rod lasers, Glasses, Optical components, Wavefronts, Collimation, Phase shifting
Opt. Eng. 43(4), (1 April 2004)https://doi.org/10.1117/1.1666858
TOPICS: Speckle pattern, Speckle, Mirrors, Fringe analysis, Interferometry, Vibrometry, Interferometers, Pulsed laser operation, Wavefronts, Laser Doppler velocimetry
Opt. Eng. 43(4), (1 April 2004)https://doi.org/10.1117/1.1666861
TOPICS: Diffraction, Wavefronts, Interferometry, Interferometers, Infrared radiation, Diffraction gratings, Visible radiation, Surface roughness, Reflectivity, Infrared lasers
Opt. Eng. 43(4), (1 April 2004)https://doi.org/10.1117/1.1666870
TOPICS: Fourier transforms, Fringe analysis, 3D metrology, Shape analysis, Signal analyzers, Error analysis, Gallium, Phase modulation, Modulation, Analytical research
Opt. Eng. 43(4), (1 April 2004)https://doi.org/10.1117/1.1666773
TOPICS: Laser development, Semiconductor lasers, Interferometers, Laser stabilization, Rubidium, Modulation, Absorption, Femtosecond phenomena, Light sources, Interferometry
Jitter Supression
Opt. Eng. 43(4), (1 April 2004)https://doi.org/10.1117/1.1666596
TOPICS: Feedback control, Control systems, Optical filters, Finite impulse response filters, Electro optical modeling, Digital filtering, Sensors, Mirrors, Photodiodes, Adaptive optics
Opt. Eng. 43(4), (1 April 2004)https://doi.org/10.1117/1.1666707
TOPICS: Receivers, Telecommunications, Computer programming, Fiber Bragg gratings, Error analysis, Signal detection, Signal processing, Optical engineering, Thermography, Signal to noise ratio
Opt. Eng. 43(4), (1 April 2004)https://doi.org/10.1117/1.1666653
TOPICS: Light emitting diodes, Transmitters, Receivers, Transceivers, Infrared radiation, Photodiodes, Wireless communications, Signal to noise ratio, Field effect transistors, Capacitance
Opt. Eng. 43(4), (1 April 2004)https://doi.org/10.1117/1.1666821
TOPICS: Liquid crystals, Electrodes, Diffraction, Electro optics, Phased array optics, Electro optical modeling, Molecules, Birefringence, Instrument modeling, Dielectrics
Optical Processing
Opt. Eng. 43(4), (1 April 2004)https://doi.org/10.1117/1.1668283
TOPICS: Holography, Bragg cells, Diffraction, Multiplexing, Diffraction gratings, Adaptive optics, Holograms, 3D image reconstruction, Image transmission, Phase modulation
Opt. Eng. 43(4), (1 April 2004)https://doi.org/10.1117/1.1666864
TOPICS: Switching, Phase shifts, Solitons, Raman scattering, Switches, Birefringence, Raman spectroscopy, Femtosecond phenomena, Ultrafast phenomena, Scattering
Opt. Eng. 43(4), (1 April 2004)https://doi.org/10.1117/1.1666867
TOPICS: Absorption, Analytical research, Diffusion, Crystals, Solids, Optical engineering, Dielectrophoresis, Device simulation, Instrumentation engineering, Imaging devices
Refractive Index of Air
Opt. Eng. 43(4), (1 April 2004)https://doi.org/10.1117/1.1666860
TOPICS: Refractive index, Interferometers, Environmental sensing, Mirrors, Laser optics, Beam splitters, Retroreflectors, Receivers, Reflectivity, Optical engineering
Remote Sensing
Opt. Eng. 43(4), (1 April 2004)https://doi.org/10.1117/1.1651556
TOPICS: Alternate lighting of surfaces, Sensors, Reflectivity, Principal component analysis, Earth observing sensors, Atmospheric corrections, Sun, Photometry, Ozone, Landsat
Opt. Eng. 43(4), (1 April 2004)https://doi.org/10.1117/1.1668284
TOPICS: Semiconducting wafers, Inspection, Standards development, Microscopes, CCD image sensors, Wafer-level optics, Silicon, Semiconductors, Interferometry, Optical engineering
Silver Coatings
Opt. Eng. 43(4), (1 April 2004)https://doi.org/10.1117/1.1646409
TOPICS: Silver, Chromium, Reflectivity, Sputter deposition, Glasses, Humidity, Optical coatings, Argon, Thin films, Metals
Spectral Matching
Opt. Eng. 43(4), (1 April 2004)https://doi.org/10.1117/1.1666679
TOPICS: Light emitting diodes, Imaging systems, Glasses, Light sources, Chromium, Amplitude modulation, LED lighting, Multispectral imaging, Copper indium disulfide, Signal to noise ratio
YAG Lasers
Opt. Eng. 43(4), (1 April 2004)https://doi.org/10.1117/1.1666868
TOPICS: Q switching, Diodes, Q switched lasers, Crystals, Pulsed laser operation, Semiconductor lasers, Reflectivity, Absorption, Mirrors, Q switch crystals
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