1 February 2005 Single-axis combined shearography and digital speckle photography instrument for full surface strain characterization
Author Affiliations +
Abstract
Full characterization of the surface strain requires the measurement of six displacement gradient components of the surface strain tensor. The out-of-plane displacement gradient component may be directly measured using the full-field speckle interferometry technique of shearography, but to fully characterize the surface strain using shearography, a minimum of three illumination, or viewing, directions are required. The image processing technique of digital speckle photography (DSP) is sensitive to in-plane displacement for normal collinear illumination and viewing, with the displacement gradient components obtained by differentiation. A combination of shearography and digital speckle photography is used to perform full characterization of the surface strain using a single illumination and viewing direction. The increase in complexity compared with a standard single-channel shearography system lies predominantly in the additional image processing requirements. Digital speckle photography image processing is performed using the optical flow field technique and the advantages of this technique compared with correlation are discussed. The design of the instrument is described and full surface strain measurements made with the system are presented.
©(2005) Society of Photo-Optical Instrumentation Engineers (SPIE)
Roger M. Groves, Shan Fu, Stephen W. James, and Ralph P. Tatam "Single-axis combined shearography and digital speckle photography instrument for full surface strain characterization," Optical Engineering 44(2), 025602 (1 February 2005). https://doi.org/10.1117/1.1842779
Published: 1 February 2005
Lens.org Logo
CITATIONS
Cited by 18 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Digital photography

Shearography

Speckle

Digital signal processing

Photography

Speckle pattern

Image processing

RELATED CONTENT

Whole-field speckle strain sensor
Proceedings of SPIE (May 07 1999)
Advances in digital speckle radiography
Proceedings of SPIE (June 20 2002)
Algorithms of specklegram analysis
Proceedings of SPIE (November 30 1994)

Back to Top