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1 August 2005 Characterization of digital-micromirror device-based infrared scene projector
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Abstract
A test procedure is developed for an infrared laser scene projector, and applied to a projection system that we develop based on digital micromirror technology. The intended use will be for simulation and target training. Resolution and noise are significant parameters for target perception models of infrared imaging systems. System resolution is normally measured as the modulation transfer function (MTF), and its noise modeled through an appropriate signal standard deviation metric. We compare MTF measurements for both mid-wave (MWIR) and long-wave IR (LWIR) bands for an infrared laser scene projector based on the digital micromirror device (DMD). Moreover, we use two complimentary models to characterize imaging camera noise. This provides a quantitative image-quality criterion of system performance.
©(2005) Society of Photo-Optical Instrumentation Engineers (SPIE)
William Ray Folks, José Manuel López-Alonso, Brian Monacelli, Arthur Robert Weeks, Guy Zummo, Daniel Mullaly, and Glenn David Boreman "Characterization of digital-micromirror device-based infrared scene projector," Optical Engineering 44(8), 086402 (1 August 2005). https://doi.org/10.1117/1.2013249
Published: 1 August 2005
JOURNAL ARTICLE
7 PAGES


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