Multispectral infrared bidirectional reflectance distribution function forward-scatter measurements of common infrared black surface preparations and materials

John Lester Miller

doi:10.1117/1.2203635

1 May 2006 Multispectral infrared bidirectional reflectance distribution function forward-scatter measurements of common infrared black surface preparations and materials

John Lester Miller

Author Affiliations +

Optical Engineering, Vol. 45, Issue 5, 056401 (May 2006). https://doi.org/10.1117/1.2203635

Abstract

Fundamental to the design of an infrared sensor is controlling the stray light and internal radiation emission. A series of bidirectional reflectance distribution function (BRDF) measurements at two infrared bandpasses in the mid-wave infrared (MWIR) and long-wave infrared (LWIR) are acquired. Incident beams were oriented 10 and 60 deg from normal. Forward-scatter (key to baffles and cold shields) data are presented for infrared black surface preparations, including: anodizing, copper oxide, nickel oxide, black paints, and trademarked black surfaces. Comparison is also made between selected surfaces before and after exposure to 78 K (LN₂) thermal cycles. This work also includes scanning electron microscope (SEM) images and discrete Fourier transform (DFT) measurements for selected black surfaces, including comparisons of damaged and undamaged nickel oxide.

©(2006) Society of Photo-Optical Instrumentation Engineers (SPIE)

Citation Download Citation

John Lester Miller "Multispectral infrared bidirectional reflectance distribution function forward-scatter measurements of common infrared black surface preparations and materials," Optical Engineering 45(5), 056401 (1 May 2006). https://doi.org/10.1117/1.2203635

Published: 1 May 2006

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