1 September 2007 Improving signal processing performance on a conoscopic holography-based profilometer with phase-shifting interferometry algorithms
Jose María Enguita, Ignacio Alvarez, Cesar Fraga Bobis, Jorge Marina, Yolanda Fernández
Author Affiliations +
Abstract
One of the more challenging applications of optical metrology is real-time dimensional control and surface inspection in industrial applications, where strong requirements of cost, speed of operation, ease of setup and applicability in adverse environments greatly limit the number of applicable technologies. The design and uses of an optic profilometer, based on conoscopic holography, have been reported previously, but there are still some drawbacks that should be addressed. One of the most important is signal processing, which is a relatively expensive process and limits the acquisition rate at no more than 70 profiles per s. We present a new approach to the signal processing problem, deriving that the phase information contained in one fringe pattern, which corresponds to one profile, can be considered as a combination of multiple one-dimensional (1-D) patterns that carry the same information but for a phase difference in the carrier wave, making it possible to apply efficient phase-shifting interferometry (PSI) techniques and resulting in a reduction of more than two orders of magnitude in computational needs.
©(2007) Society of Photo-Optical Instrumentation Engineers (SPIE)
Jose María Enguita, Ignacio Alvarez, Cesar Fraga Bobis, Jorge Marina, and Yolanda Fernández "Improving signal processing performance on a conoscopic holography-based profilometer with phase-shifting interferometry algorithms," Optical Engineering 46(9), 093605 (1 September 2007). https://doi.org/10.1117/1.2786862
Published: 1 September 2007
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CITATIONS
Cited by 1 scholarly publication.
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KEYWORDS
Signal processing

Fringe analysis

Phase shifts

Sensors

Inspection

Holography

Profilometers

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