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1 October 2007 Metallic surface roughness mapping using a PC-interfaced optoelectronic sensor system
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We present the measurement and graphical representation of spatial differential values of the surface roughness factor for various steel samples. The measurements were made by a newly developed optoelectronic sensor system comprising a light emitting diode (LED) and two phototransistors. The light beam from the LED illuminated an area of 1 mm2 on the metallic surface. The reflected light and scattered light were captured by two different photo detectors. The sample surface was scanned using a computer numerical control (CNC) machine. The photocurrent signals acquired at each point on the surface were digitized, and a parameter was calculated to correspond to the degree of roughness of the surface at the given point. The measured roughness factor is compared with the readings of a standard instrument, and the instrument was calibrated to display the measurements in micrometers. The measured values processed by a personal computer provided a three-dimensional (3-D) mapping of the surface texture.
©(2007) Society of Photo-Optical Instrumentation Engineers (SPIE)
Kabilan Ponnusamy Arunachalam and Paulvanna Nayaki Marimuthu "Metallic surface roughness mapping using a PC-interfaced optoelectronic sensor system," Optical Engineering 46(10), 103602 (1 October 2007).
Published: 1 October 2007


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