Editorial
Opt. Eng. 47(5), 050101 (1 May 2008) doi:10.1117/1.2927530
OE Letters
Guo-Wei Lu, Tetsuya Miyazaki
Opt. Eng. 47(5), 050501 (1 May 2008) doi:10.1117/1.2931597
TOPICS: Phase shift keying, Transmitters, Phase modulation, Modulators, Multiplexing, Receivers, Modulation, Channel projecting optics, Complex systems, Signal detection
Opt. Eng. 47(5), 050502 (1 May 2008) doi:10.1117/1.2931575
TOPICS: CCD cameras, Mirrors, Optical coherence tomography, Wavefronts, Glasses, Fourier transforms, Spatial frequencies, Imaging systems, Image resolution, Range imaging
Victor Cheng, Rongqiang Yang, Chun Hui, Yazhu Chen
Opt. Eng. 47(5), 050503 (1 May 2008) doi:10.1117/1.2931577
TOPICS: Cameras, 3D image processing, Fringe analysis, 3D metrology, Calibration, Projection systems, 3D image reconstruction, Image resolution, LCDs, Optical engineering
Optical System Design
Baha Jassemnejad, A. Bohannan, John Lekki, Kenneth Weiland
Opt. Eng. 47(5), 053001 (1 May 2008) doi:10.1117/1.2931686
TOPICS: Computer generated holography, Mach-Zehnder interferometers, Interferometers, Spatial light modulators, Prisms, Fluctuations and noise, Sensors, Photodetectors, Telecommunications, CCD cameras
Yuan Shu, Ronald Chung, Zheng Tan, Jun Cheng, Edmund Lam, Kenneth Fung, Fan Wang
Opt. Eng. 47(5), 053002 (1 May 2008) doi:10.1117/1.2931457
TOPICS: Optical design, Inspection, Projection systems, Modulation transfer functions, Binary data, Lens design, Tolerancing, Optical engineering, Distortion, Semiconducting wafers
Imaging Systems
Yung-Ho Seo, Sang-Hoon Kim, Kyoung-Soo Doo, Jong-Soo Choi
Opt. Eng. 47(5), 053201 (1 May 2008) doi:10.1117/1.2919801
TOPICS: Reconstruction algorithms, Cameras, 3D image processing, 3D image reconstruction, Genetic algorithms, Error analysis, Calibration, 3D modeling, Optical engineering, Algorithm development
Optical Fabrication
Yuko Kizuka, Makoto Yamauchi, Yoshihiko Matsuoka
Opt. Eng. 47(5), 053401 (1 May 2008) doi:10.1117/1.2919739
TOPICS: Axicons, Binary data, Diffraction, Bessel beams, Optical engineering, Wave propagation, Laser beam propagation, Photography, Electron beams, Optical components
Instrumentation, Measurement, and Metrology
Kuang-Yuh Huang, Chen-Hsiu Yeh
Opt. Eng. 47(5), 053601 (1 May 2008) doi:10.1117/1.2919802
TOPICS: Motion measurement, Photodiodes, Signal processing, Clocks, Error analysis, Optical testing, Reflectivity, Digital signal processing, Sensors, Signal detection
Opt. Eng. 47(5), 053602 (1 May 2008) doi:10.1117/1.2919726
TOPICS: Cameras, Calibration, 3D metrology, Phase measurement, Projection systems, 3D image processing, Imaging systems, 3D modeling, Picosecond phenomena, Optical engineering
Opt. Eng. 47(5), 053603 (1 May 2008) doi:10.1117/1.2927460
TOPICS: Visibility, Video, Optical engineering, Holographic interferometry, Bessel functions, Iron, Holography, Modal analysis, Digital holography, Imaging systems
Zhongwei Li, Yusheng Shi, Congjun Wang, Yuanyuan Wang
Opt. Eng. 47(5), 053604 (1 May 2008) doi:10.1117/1.2931517
TOPICS: Calibration, Projection systems, Cameras, Digital micromirror devices, Imaging systems, 3D metrology, Fringe analysis, Error analysis, Phase shifts, Structured light
Opt. Eng. 47(5), 053605 (1 May 2008) doi:10.1117/1.2931592
TOPICS: Cameras, 3D modeling, Image processing, Visual process modeling, Optical engineering, Reverse modeling, Projection systems, Sensors, Image resolution, Charge-coupled devices
Chihhsiong Shih, Lester Gerhardt, William Cheng-Chung Chu, Chuhsing Lin, Chih-Hung Chang, Chieh-Hao Wan, Chorng-Shiuh Koong
Opt. Eng. 47(5), 053606 (1 May 2008) doi:10.1117/1.2911721
TOPICS: Inspection, Error analysis, Optical engineering, Manufacturing, 3D modeling, 3D vision, Computer science, Information science, 3D metrology, 3D applications
Optical Components, Detectors, and Displays
Xinyu Zhang, Changsheng Xie, An Ji, Qingle Tang, Wei Luo
Opt. Eng. 47(5), 054001 (1 May 2008) doi:10.1117/1.2931076
TOPICS: Photoresist materials, Microlens, Microlens array, Etching, Ion beams, Indium, Quartz, Optical lithography, Optical engineering, Ultraviolet radiation
Opt. Eng. 47(5), 054002 (1 May 2008) doi:10.1117/1.2923742
TOPICS: Liquid crystals, Wave plates, Polarization, Systems modeling, Data modeling, Molecules, Optical engineering, Glasses, Refraction, Power meters
Lasers and Laser Optics
Kejian Yang, Shengzhi Zhao, Guiqiu Li, Dechun Li, Jingliang He
Opt. Eng. 47(5), 054201 (1 May 2008) doi:10.1117/1.2919790
TOPICS: Q switched lasers, Gallium arsenide, Laser crystals, Mirrors, Crystals, Semiconducting wafers, Semiconductor lasers, Pulsed laser operation, Thermal effects, Transmission electron microscopy
Opt. Eng. 47(5), 054202 (1 May 2008) doi:10.1117/1.2919782
TOPICS: Collimation, GRIN lenses, Microlens, Diodes, High power lasers, Graded index fibers, Optical engineering, Fiber couplers, Microlens array, Semiconductor lasers
Laser Applications
Y. Huang, Siu Pang Ng, Long Liu, Y. Chen, Y.Y. Hung
Opt. Eng. 47(5), 054301 (1 May 2008) doi:10.1117/1.2927462
TOPICS: Phase retrieval, Phase shifts, Fringe analysis, Shearography, Speckle pattern, Optical engineering, Fourier transforms, Phase measurement, Modulation, Phase shifting
Jeremy Gulley, Sebastian Winkler, William Dennis
Opt. Eng. 47(5), 054302 (1 May 2008) doi:10.1117/1.2919721
TOPICS: Plasma, Silica, Plasma generation, Optical simulations, Ultrafast phenomena, Diffraction, Computer simulations, Beam propagation method, Optical engineering, Beam shaping
Optical Sensors
Lijun Hang, Cunfu He, Bin Wu
Opt. Eng. 47(5), 054401 (1 May 2008) doi:10.1117/1.2920390
TOPICS: Sensors, Sagnac interferometers, Acoustics, Optical fibers, Fiber optics sensors, Modulators, Signal processing, Optical engineering, Geometrical optics
Benjamin Buckner, Vladimir Markov, Li-Chung Lai, James Earthman
Opt. Eng. 47(5), 054402 (1 May 2008) doi:10.1117/1.2919793
TOPICS: Sensors, Bidirectional reflectance transmission function, Scattering, Mirrors, Structural health monitoring, Laser scattering, Calibration, Prototyping, Reflectivity, Light scattering
Opt. Eng. 47(5), 054403 (1 May 2008) doi:10.1117/1.2931527
TOPICS: Refractive index, Interferometers, Liquids, Visibility, Fiber Bragg gratings, Optical fibers, Heterodyning, Interferometry, Water, Sensors
Fiber Optics and Optical Communication
Po-Jen Hsieh, Der-Chin Su
Opt. Eng. 47(5), 055001 (1 May 2008) doi:10.1117/1.2931586
TOPICS: Polarization, Holography, Transmittance, Crystals, Polarizers, Diffraction, Optical engineering, Mirrors, Glasses, Prototyping
Opt. Eng. 47(5), 055002 (1 May 2008) doi:10.1117/1.2931469
TOPICS: Refractive index, Optical fibers, Step index fibers, Optical engineering, Solids, Graded index fibers, Helium neon lasers, Microscopes, Optical transfer functions, Imaging systems
Radiometry, Infrared Systems, Tracking
Opt. Eng. 47(5), 056401 (1 May 2008) doi:10.1117/1.2927454
TOPICS: Target detection, Sensors, Computing systems, Optical engineering, Infrared search and track, Signal to noise ratio, Mathematical modeling, Optimization (mathematics), Imaging systems, Cameras
Image Processing
Zhifei Xu, Irene Gu, Pengfei Shi
Opt. Eng. 47(5), 057001 (1 May 2008) doi:10.1117/1.2919787
TOPICS: Image processing, Video, Optical engineering, Fourier transforms, Visual process modeling, Motion models, Principal component analysis, Content addressable memory, Video processing, Video surveillance
Chishyan Liaw, Ching-Tsorng Tsai, Sheng-Ta Tsai
Opt. Eng. 47(5), 057002 (1 May 2008) doi:10.1117/1.2920354
TOPICS: Wavelets, Wavelet transforms, Silver, Optical engineering, Image processing, Image analysis, Databases, Image quality, Digital imaging, Biological research
Qing Guo, Zhengjun Liu, Shutian Liu
Opt. Eng. 47(5), 057003 (1 May 2008) doi:10.1117/1.2920339
TOPICS: Digital watermarking, Signal to noise ratio, Image analysis, Image filtering, Optical engineering, Fourier transforms, Gaussian filters, Numerical simulations, Fractional fourier transform, Image storage
Jian-Hua Hou, Xiang-Ming Liu, Cheng-Yi Xiong, Xiang He
Opt. Eng. 47(5), 057004 (1 May 2008) doi:10.1117/1.2923661
TOPICS: Speckle, Synthetic aperture radar, Wavelets, Image filtering, Electronic filtering, Visualization, Statistical modeling, Wavelet transforms, Optical engineering, Denoising
Opt. Eng. 47(5), 057005 (1 May 2008) doi:10.1117/1.2920429
TOPICS: Speckle, Image processing, Electronic filtering, Speckle pattern, Optical engineering, Receivers, Lanthanum, CCD cameras, Tissues, Diagnostics
Qihe Li, Yupin Luo, Deyun Xiao
Opt. Eng. 47(5), 057006 (1 May 2008) doi:10.1117/1.2931466
TOPICS: Image segmentation, Optical engineering, Lithium, Visual process modeling, Convolution, Performance modeling, 3D modeling, Machine vision, Computer vision technology, Image processing algorithms and systems
Yeol-Min Seong, HyunWook Park
Opt. Eng. 47(5), 057007 (1 May 2008) doi:10.1117/1.2931461
TOPICS: Super resolution, Video, Video surveillance, Image registration, Image processing, Optical engineering, Surveillance systems, Image resolution, Statistical analysis, Image enhancement
Xiaochen He, Nelson Yung
Opt. Eng. 47(5), 057008 (1 May 2008) doi:10.1117/1.2931681
TOPICS: Sensors, Corner detection, Detection and tracking algorithms, Optical engineering, Edge detection, Quantization, Sensor performance, Roads, Image segmentation, Feature extraction
Machine Vision, Pattern Recognition
Opt. Eng. 47(5), 057201 (1 May 2008) doi:10.1117/1.2927463
TOPICS: Fringe analysis, Inspection, Image classification, Image analysis, Light sources and illumination, Optical engineering, Nondestructive evaluation, Interferometry, Holographic interferometry, 3D image processing
Opt. Eng. 47(5), 057202 (1 May 2008) doi:10.1117/1.2931504
TOPICS: Sensors, Algorithm development, Optical engineering, Detection and tracking algorithms, Evolutionary algorithms, Machine vision, Computer vision technology, Image segmentation, Cameras, Object recognition
Ming Wen, Ying Li, Qing Zhuo, Wenyuan Wang
Opt. Eng. 47(5), 057203 (1 May 2008) doi:10.1117/1.2931520
TOPICS: Sensors, Visualization, Optical engineering, Object recognition, Sensor performance, Feature extraction, Multiscale representation, Image filtering, Visual process modeling, Convolution
Physical Optics, Diffractive Optics
Min Zhao, Xiaoli Zhu, Baoqin Chen, Changqing Xie, Min Liu, Jiebing Niu, Longyu Kuang, Leifeng Cao
Opt. Eng. 47(5), 058001 (1 May 2008) doi:10.1117/1.2919717
TOPICS: X-ray lithography, X-rays, Diffraction gratings, Diffraction, Lithography, Photomasks, Gold, X-ray diffraction, Spectroscopy, Spectrographs
Fourier Optics and Optical Signal Processing
Morgan Madec, Jean-Baptiste Fasquel, Wilfried Uhring, Pascal Joffre, Yannick Herve
Opt. Eng. 47(5), 058201 (1 May 2008) doi:10.1117/1.2931691
TOPICS: Digital signal processing, Reconstruction algorithms, Optoelectronics, Computed tomography, Distortion, Signal to noise ratio, Prototyping, Electro optical modeling, Optical engineering, Surgery
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