Spectral properties and surface uniformity of black glass gloss references

Mikko Juuti; Heikki Tuononen; Antti Penttila; Kari Myller; Kari Lumme; Kai Eri Peiponen

doi:10.1117/1.3095903

1 March 2009 Spectral properties and surface uniformity of black glass gloss references

Mikko Juuti, Heikki Tuononen, Antti Penttila, Kari Myller, Kari Lumme, Kai Eri Peiponen

Author Affiliations +

Optical Engineering, Vol. 48, Issue 3, 033603 (March 2009). https://doi.org/10.1117/1.3095903

Abstract

Commercial glossmeters are usually provided with a gloss reference. In some cases the reference is derived from black glass. Light reflection from the reference depends both on the complex refractive index and on the surface quality, such as the roughness and the cleanness of the reflecting surface, of the black glass. If we want to obtain accurate data on gloss or the minute gloss mottling of an object, we must be certain of the optical properties and surface quality of the reference in regard to reliable gloss analysis. In this study the complex refractive index of a gloss reference, as a function of wavelength, was measured with an ellipsometer, and the reflectance at standardized gloss measurement angles was calculated for the case of nonpolarized light. We show that the gloss reference has a substantial extinction coefficient, which must be considered in accurately describing the reflectance of the reference. Furthermore, the gloss variation of the reference was detected with a diffractive-optical-element-based glossmeter by scanning the reference surface at normal light incidence. We observed that the reference had rather high gloss mottling and consider the reasons for it.

©(2009) Society of Photo-Optical Instrumentation Engineers (SPIE)

Citation Download Citation

Mikko Juuti, Heikki Tuononen, Antti Penttila, Kari Myller, Kari Lumme, and Kai Eri Peiponen "Spectral properties and surface uniformity of black glass gloss references," Optical Engineering 48(3), 033603 (1 March 2009). https://doi.org/10.1117/1.3095903

Published: 1 March 2009

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available