1 May 2011 Three-dimensional particle position using continuous wavelet and circle Hough transforms
David Moreno-Hernandez, J. Andres Bueno-Garcia, Cornelio Alvarez-Herrera, J. Ascencion Guerrero-Viramontes, Fernando Mendoza Santoyo
Author Affiliations +
Abstract
An alternative method to determine particle position in 3D is herewith proposed. The procedure to be followed is simple since it avoids a complicated experimental set-up and several computation steps to obtain the final particle position. In order to compute the position and radius of a particle image, the continuous wavelet and Hough transforms are employed: the proposed method is based on the size and position calculation for a particle diffraction image central spot size. The size and centroid of the central spot size render the z and x-y position of a particle image, respectively. This approach has been applied to simulated and experimental particle images. Simulated particle images have been obtained using the near field Lorenz-Mie theory, and show between the actual and calculated central spot size. An average relative error of 0.4% and 1.7% for x-y and z directions, respectively, was found in the analysis. The extraction of the 3D particle position was done with experimental particle images obtained from particle motion provoked by heated water inside a channel. The quality of the particle images determines the accuracy of the calculation of its central spot size.
©(2011) Society of Photo-Optical Instrumentation Engineers (SPIE)
David Moreno-Hernandez, J. Andres Bueno-Garcia, Cornelio Alvarez-Herrera, J. Ascencion Guerrero-Viramontes, and Fernando Mendoza Santoyo "Three-dimensional particle position using continuous wavelet and circle Hough transforms," Optical Engineering 50(5), 053604 (1 May 2011). https://doi.org/10.1117/1.3575650
Published: 1 May 2011
Lens.org Logo
CITATIONS
Cited by 4 scholarly publications and 3 patents.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Particles

Wavelets

Image quality

Calibration

Continuous wavelet transforms

Diffraction

Holography

RELATED CONTENT


Back to Top