Quantifying wavefront measurement variation with standard deviation maps

Brian T. Hart

doi:10.1117/1.3577702

1 May 2011 Quantifying wavefront measurement variation with standard deviation maps

Brian T. Hart

Author Affiliations +

Optical Engineering, Vol. 50, Issue 5, 053607 (May 2011). https://doi.org/10.1117/1.3577702

Abstract

A choice of methods exists for determining the variability of an averaged wavefront measurement. Pixel-by-pixel standard deviation (SD) maps provide a spatial description of the variability as well as a scalar magnitude. An efficient algorithm for computing SD maps as measurements occur is given. Results for simulated and experimental wave-front maps are shown. Plots of the average SD as a measurement progresses can be used to characterize a test system and determine the minimum number of measurements required for acceptable results.

©(2011) Society of Photo-Optical Instrumentation Engineers (SPIE)

Citation Download Citation

Brian T. Hart "Quantifying wavefront measurement variation with standard deviation maps," Optical Engineering 50(5), 053607 (1 May 2011). https://doi.org/10.1117/1.3577702

Published: 1 May 2011

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