7 January 2013 Proton radiation damage effects on the response of high speed communication avalanche photodiodes (notice of removal)
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Abstract
Subsequent to its publication in Optical Engineering, SPIE learned that a significant portion of this paper was previously published as “Harmful Proton Radiation Damage and Induced Bit Error Effects on the Performance of Avalanche Photodiode Devices,” in International Journal of Multidisciplinary Sciences and Engineering, Vol. 2, No. 4 (July 2011). Double publication violates SPIE Code of Ethics and consequently the paper has been removed from Optical Engineering by the publisher. The Authors
Rashed and El-Halawany: Proton radiation damage effects on the response of high speed communication avalanche photodiodes (notice of removal)

Subsequent to its publication in Optical Engineering, SPIE learned that a significant portion of this paper was previously published as “Harmful Proton Radiation Damage and Induced Bit Error Effects on the Performance of Avalanche Photodiode Devices,” in International Journal of Multidisciplinary Sciences and Engineering, Vol. 2, No. 4 (July 2011). Double publication violates SPIE Code of Ethics and consequently the paper has been removed from Optical Engineering by the publisher.

© The Authors. Published by SPIE under a Creative Commons Attribution 3.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.
Ahmed Nabih Zaki Rashed, Mohamed M. E. El-Halawany, "Proton radiation damage effects on the response of high speed communication avalanche photodiodes (notice of removal)," Optical Engineering 52(1), 014003 (7 January 2013). https://doi.org/10.1117/1.OE.52.1.014003
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