Subsequent to its publication in Optical Engineering, SPIE learned that a significant portion of this paper was previously published as “Harmful Proton Radiation Damage and Induced Bit Error Effects on the Performance of Avalanche Photodiode Devices,” in International Journal of Multidisciplinary Sciences and Engineering, Vol. 2, No. 4 (July 2011). Double publication violates SPIE Code of Ethics and consequently the paper has been removed from Optical Engineering by the publisher.