24 June 2013 Spherical aberrations and manufacturing errors in eliminating the substrate errors of a computer-generated hologram (withdrawn)
Author Affiliations +
Optical Engineering, 52(9), 091723 (2013). doi:10.1117/1.OE.52.9.091723
Abstract

This paper [Opt. Eng. 52(9), 091723 (2013)] was removed from the SPIE Digital Library on 24 July 2013 by the publisher upon verifying that a significant portion of Section 4 of the paper was taken directly from the following previously published paper without attribution:

Ping Zhou and James H. Burge, “Optimal design of computer-generated holograms to minimize sensitivity to fabrication errors,” Optics Express 15(23), 15410 (2007).

The citation is provided here so that interested readers can access the information from the original source.

Feng, Deng, and Xing: Spherical aberrations and manufacturing errors in eliminating the substrate errors of a computer-generated hologram (withdrawn)

Withdrawal Notice

This paper [Opt. Eng. 52(9), 091723 (2013)] was removed from the SPIE Digital Library on 24 July 2013 by the publisher upon verifying that a significant portion of Section 4 of the paper was taken directly from the following previously published paper without attribution:

Ping Zhou and James H. Burge, “Optimal design of computer-generated holograms to minimize sensitivity to fabrication errors,” Optics Express 15(23), 15410 (2007).

The citation is provided here so that interested readers can access the information from the original source.

© The Authors. Published by SPIE under a Creative Commons Attribution 3.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.
Jie Feng, Chao Deng, Tingwen Xing, "Spherical aberrations and manufacturing errors in eliminating the substrate errors of a computer-generated hologram (withdrawn)," Optical Engineering 52(9), 091723 (24 June 2013). http://dx.doi.org/10.1117/1.OE.52.9.091723
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KEYWORDS
Computer generated holography

Monochromatic aberrations

Optics manufacturing

Error analysis

Manufacturing

Chaos

Electronics

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