Editorial
Opt. Eng. 53(12), 120101 (19 December 2014) doi:10.1117/1.OE.53.12.120101
TOPICS: Optical engineering, Polishing
Special Section on Advances of Precision Optical Measurements and Instrumentation for Geometrical and Mechanical Quantities
Opt. Eng. 53(12), 122401 (19 December 2014) doi:10.1117/1.OE.53.12.122401
TOPICS: Optical testing, Mechanical engineering, Distance measurement, Precision measurement, Metrology, Space operations, Optical sensors, Motion measurement, Optical engineering, Optoelectronics
Guang Shi, Fumin Zhang, Xing-Hua Qu, Xiangsong Meng
Opt. Eng. 53(12), 122402 (6 May 2014) doi:10.1117/1.OE.53.12.122402
TOPICS: Interferometers, Ranging, Tunable lasers, Continuous wave operation, Laser systems engineering, Spatial resolution, Laser metrology, Metrology, Laser sources, Laser applications
Yoon-Soo Jang, Keunwoo Lee, Seongheum Han, Joohyung Lee, Young-Jin Kim, Seung-Woo Kim
Opt. Eng. 53(12), 122403 (8 May 2014) doi:10.1117/1.OE.53.12.122403
TOPICS: Distance measurement, Femtosecond phenomena, Signal detection, Interferometry, Light sources, Phase measurement, Interferometers, Frequency combs, Optical engineering, Optical testing
Jens Flügge, Rainer Köning, Eugen Schötka, Christoph Weichert, Paul Köchert, Harald Bosse, Horst Kunzmann
Opt. Eng. 53(12), 122404 (22 May 2014) doi:10.1117/1.OE.53.12.122404
TOPICS: Interferometers, Zerodur, Computer programming, Photomasks, Calibration, Metrology, Mirrors, Manufacturing, Microscopes
Xinghui Li, Yuki Shimizu, Takeshi Ito, Yindi Cai, So Ito, Wei Gao
Opt. Eng. 53(12), 122405 (12 May 2014) doi:10.1117/1.OE.53.12.122405
TOPICS: Computer programming, Motion measurement, Optical sensors, Sensors, Ferroelectric materials, Head, Laser beam diagnostics, Diffraction gratings, Interferometers, Prototyping
Opt. Eng. 53(12), 122406 (16 June 2014) doi:10.1117/1.OE.53.12.122406
TOPICS: Precision measurement, Superconductors, Inspection, Assembly tolerances, Optical testing, Distance measurement, Optical engineering, Metrology, Lithium, Optical tracking
Lianqing Zhu, Weixian Li, Zhikang Pan, Yangkuan Guo, Qingshan Chen
Opt. Eng. 53(12), 122407 (25 June 2014) doi:10.1117/1.OE.53.12.122407
TOPICS: Calibration, Space operations, Mathematical modeling, Electromagnetism, Prototyping, Error analysis, Switches, Kinematics, Optical engineering, Numerical simulations
Chien-Sheng Liu, Kun-Wei Lin
Opt. Eng. 53(12), 122408 (23 June 2014) doi:10.1117/1.OE.53.12.122408
TOPICS: Diffusers, Particles, Laser optics, Optical sensors, Surface plasmons, Geometrical optics, Image sensors, CCD image sensors, Charge-coupled devices, Optics manufacturing
Opt. Eng. 53(12), 122409 (20 June 2014) doi:10.1117/1.OE.53.12.122409
TOPICS: Distance measurement, Wavelet transforms, Interferometry, Femtosecond frequency combs, Femtosecond phenomena, Wavelets, Frequency combs, Data analysis, Resistance, Charge-coupled devices
Opt. Eng. 53(12), 122410 (27 June 2014) doi:10.1117/1.OE.53.12.122410
TOPICS: Error analysis, Sensors, Electrons, Signal to noise ratio, Spatial frequencies, Optical engineering, Microscopes, Edge detection, Solids, Computer simulations
Ho-Ling Fu, Kuang-Chao Fan, Yu-Jan Huang, Ming-Kai Hu
Opt. Eng. 53(12), 122411 (10 July 2014) doi:10.1117/1.OE.53.12.122411
TOPICS: Calibration, Head, Cameras, Wind measurement, 3D scanning, Optical scanning, CCD cameras, Charge-coupled devices, Imaging systems, 3D metrology
Qiuhong Tian, Zhengrong Sun, Zhongping Le, Yanna Liu, Lijian Zhang, Sendong Xie
Opt. Eng. 53(12), 122412 (4 August 2014) doi:10.1117/1.OE.53.12.122412
TOPICS: Laser marking, Automatic tracking, Image segmentation, Servomechanisms, Digital image processing, Iron, Charge-coupled devices, Prisms, RGB color model, Detection and tracking algorithms
Opt. Eng. 53(12), 122413 (9 September 2014) doi:10.1117/1.OE.53.12.122413
TOPICS: Mirrors, Refractive index, Distance measurement, Interferometers, Optical fibers, Second-harmonic generation, Frequency combs, Temperature metrology, Humidity, Optical testing
Lei Yang, Li-qiao Lei
Opt. Eng. 53(12), 122414 (9 September 2014) doi:10.1117/1.OE.53.12.122414
TOPICS: Surface roughness, Wavelets, Speckle pattern, Feature extraction, Statistical modeling, Speckle, Statistical analysis, Analytical research, Wavelet transforms, Semiconductor lasers
Special Section on Laser Damage II
Opt. Eng. 53(12), 122501 (22 December 2014) doi:10.1117/1.OE.53.12.122501
TOPICS: Laser induced damage, Laser development, Optical engineering, Thin films, Absorption, Free electron lasers, Aerospace engineering, Continuous wave operation, Laser systems engineering, Laser applications
Hector Carreón, Sandra Barriuso, Juan Antonio Porro, Jose Luis González-Carrasco, José Luis Ocaña
Opt. Eng. 53(12), 122502 (11 June 2014) doi:10.1117/1.OE.53.12.122502
TOPICS: Thermoelectric materials, Magnetism, Biomedical optics, Titanium, Laser processing, Anisotropy, Metals, Heat treatments, Annealing, Signal detection
Opt. Eng. 53(12), 122503 (1 July 2014) doi:10.1117/1.OE.53.12.122503
TOPICS: Absorption, Sensors, Temperature metrology, Calibration, Aluminum, Coating, Silica, Calorimetry, Finite element methods, Error analysis
Semyon Papernov, Alexei Kozlov, James Oliver, Terrance Kessler, Alexander Shvydky, Brendan Marozas
Opt. Eng. 53(12), 122504 (25 June 2014) doi:10.1117/1.OE.53.12.122504
TOPICS: Absorption, Continuous wave operation, Hybrid fiber optics, Annealing, Near ultraviolet, Thin films, Pulsed laser operation, Hafnium, Oxides, Semiconductor lasers
Menglei Lu, Bin Ma, Guangda Zhan, Hongfei Jiao, Xinbin Cheng
Opt. Eng. 53(12), 122505 (1 July 2014) doi:10.1117/1.OE.53.12.122505
TOPICS: Etching, Laser induced damage, Nanoparticles, Gold, Metals, Laser irradiation, Wet etching, Particles, Optical components, Optical engineering
Alexander Rubenchik, Sheldon Wu, V. Keith Kanz, Mary LeBlanc, W. Howard Lowdermilk, Mark Rotter, Joel Stanley
Opt. Eng. 53(12), 122506 (17 July 2014) doi:10.1117/1.OE.53.12.122506
TOPICS: Aluminum, Absorption, Temperature metrology, Metals, Titanium, Oxides, Semiconductor lasers, Convection, Surface finishing, Oxidation
Robert Mitchell, Douglass Schumacher, Enam Chowdhury
Opt. Eng. 53(12), 122507 (23 July 2014) doi:10.1117/1.OE.53.12.122507
TOPICS: Photonic integrated circuits, Laser induced damage, Particles, Femtosecond phenomena, Optical simulations, Electrons, Ionization, Chemical species, Copper, Monte Carlo methods
Christian Mühlig, Simon Bublitz
Opt. Eng. 53(12), 122508 (11 August 2014) doi:10.1117/1.OE.53.12.122508
TOPICS: Absorption, Silica, Deep ultraviolet, Luminescence, Laser applications, Temperature metrology, Annealing, Laser irradiation, Manufacturing, Hydrogen
Opt. Eng. 53(12), 122509 (6 August 2014) doi:10.1117/1.OE.53.12.122509
TOPICS: Thin films, Laser induced damage, Silica, Hybrid fiber optics, Ultraviolet radiation, Laser optics, Laser damage threshold, Absorption, Optical engineering, Niobium
Opt. Eng. 53(12), 122510 (12 August 2014) doi:10.1117/1.OE.53.12.122510
TOPICS: Aluminum, Fiber lasers, Diffusion, Absorbance, Laser applications, Gas lasers, Optical engineering, Thermal effects, Laser development, Solids
Opt. Eng. 53(12), 122511 (21 August 2014) doi:10.1117/1.OE.53.12.122511
TOPICS: Optical parametric oscillators, Nonlinear crystals, Crystals, Laser induced damage, Laser damage threshold, Absorption, Mid-IR, Transparency, Laser crystals, Optical engineering
Opt. Eng. 53(12), 122512 (2 September 2014) doi:10.1117/1.OE.53.12.122512
TOPICS: Single mode fibers, Medium wave, Fiber lasers, Continuous wave operation, Silica, Spherical lenses, Structured optical fibers, Sensors, Particles, Semiconductor lasers
Opt. Eng. 53(12), 122513 (8 October 2014) doi:10.1117/1.OE.53.12.122513
TOPICS: Signal to noise ratio, Cameras, CCD cameras, Pulsed laser operation, Standards development, Beam analyzers, CCD image sensors, Charge-coupled devices, Optical engineering, Computer simulations
Tao Ding, Yujiang Xie, Zhenxiang Shen, Xinbing Cheng, Zhanshan Wang
Opt. Eng. 53(12), 122514 (6 October 2014) doi:10.1117/1.OE.53.12.122514
TOPICS: Ultrasonics, Optical spheres, Particles, Silica, Cavitation, Optical engineering, Ultrasonography, Microscopes, Optics manufacturing, Atomic force microscopy
Opt. Eng. 53(12), 122515 (27 October 2014) doi:10.1117/1.OE.53.12.122515
TOPICS: Ionization, Laser induced damage, Pulsed laser operation, Crystals, Dielectrics, Laser damage threshold, Optical simulations, Laser crystals, Solids, Absorption
Ella Field, John Bellum, Damon Kletecka
Opt. Eng. 53(12), 122516 (6 November 2014) doi:10.1117/1.OE.53.12.122516
TOPICS: Optical coatings, Antireflective coatings, Contamination, Laser induced damage, Laser damage threshold, Surface finishing, Polishing, Laser processing, Optical testing, Optical engineering
Opt. Eng. 53(12), 122517 (2 December 2014) doi:10.1117/1.OE.53.12.122517
TOPICS: Laser induced damage, Monte Carlo methods, Optical testing, Laser damage threshold, Analytical research, Optical engineering, Optical simulations, Data modeling, Data analysis, Statistical modeling
Special Section on Optical Frequency Combs
Opt. Eng. 53(12), 122601 (22 December 2014) doi:10.1117/1.OE.53.12.122601
TOPICS: Frequency combs, Radio optics, Optical fibers, Mode locking, Metrology, Nonlinear optics, Optical microcavities, Lithium, Pulsed laser operation, Measurement devices
Opt. Eng. 53(12), 122602 (14 July 2014) doi:10.1117/1.OE.53.12.122602
TOPICS: Resonators, Frequency combs, Kerr effect, Thermography, Microwave radiation, Magnesium fluoride, Terahertz radiation, Crystals, Silica, Thermal effects
Opt. Eng. 53(12), 122603 (14 July 2014) doi:10.1117/1.OE.53.12.122603
TOPICS: Telescopic pixel displays, Femtosecond phenomena, Frequency combs, Mirrors, Laser stabilization, Crystals, Ferroelectric materials, Nonlinear optics, Precision measurement, Nonlinear crystals
Opt. Eng. 53(12), 122604 (11 July 2014) doi:10.1117/1.OE.53.12.122604
TOPICS: Second-harmonic generation, Harmonic generation, Frequency combs, Femtosecond phenomena, Signal detection, Optical amplifiers, Polarization, Dielectric polarization, Optical engineering, Optical fibers
Richard McCracken, Zhaowei Zhang, Derryck Reid
Opt. Eng. 53(12), 122605 (14 August 2014) doi:10.1117/1.OE.53.12.122605
TOPICS: Optical parametric oscillators, Spectroscopy, Frequency combs, Mid-IR, Ultrafast phenomena, Absorption, Methane, Femtosecond phenomena, Pulsed laser operation, Visible radiation
Jianping Li, Xuebing Zhang, Zhaohui Li
Opt. Eng. 53(12), 122606 (27 August 2014) doi:10.1117/1.OE.53.12.122606
TOPICS: Frequency combs, Modulators, Waveguides, Single sideband modulation, Lithium, Interferometers, Optical amplifiers, Control systems, Optical engineering, Photonics
Opt. Eng. 53(12), 122607 (20 August 2014) doi:10.1117/1.OE.53.12.122607
TOPICS: Resonators, Frequency combs, Sapphire, Dispersion, Oscillators, Microresonators, Radio optics, Crystals, Prisms, Laser resonators
Jiachuan Lin, Lixia Xi, Jianping Li, Jianrui Li, Xianfeng Tang, Lu Sun, Xiaoguang Zhang
Opt. Eng. 53(12), 122608 (18 September 2014) doi:10.1117/1.OE.53.12.122608
TOPICS: Modulators, Frequency combs, Telecommunications, Optical communications, Polarization, Optical amplifiers, Linear filtering, Signal to noise ratio, Modulation, Interference (communication)
Opt. Eng. 53(12), 122609 (3 October 2014) doi:10.1117/1.OE.53.12.122609
TOPICS: Resonators, Dispersion, Raman spectroscopy, Frequency combs, Crystals, Finite element methods, Optical engineering, Solitons, Crystallography, Mode locking
Imaging Components, Systems, and Processing
Rongwu Wang, Jinfeng Zhou, Lingjie Yu, Bugao Xu
Opt. Eng. 53(12), 123101 (2 December 2014) doi:10.1117/1.OE.53.12.123101
TOPICS: Image fusion, Optical fibers, Image segmentation, Image processing, Microscopes, Algorithm development, Optical engineering, Image analysis, Image processing algorithms and systems, Imaging systems
Opt. Eng. 53(12), 123102 (5 December 2014) doi:10.1117/1.OE.53.12.123102
TOPICS: Digital holography, Holography, Holograms, Image compression, Wavelets, Microscopy, Fringe analysis, Discrete wavelet transforms, Computer programming, Optical engineering
Huihui Song, Guojie Wang, Kaihua Zhang
Opt. Eng. 53(12), 123103 (8 December 2014) doi:10.1117/1.OE.53.12.123103
TOPICS: Associative arrays, Multispectral imaging, Chemical species, Remote sensing, Landsat, Image classification, Vegetation, Optical engineering, Detection theory, Earth observing sensors
Eunjin Koh, Chanyong Lee, Dong Gil Jeong
Opt. Eng. 53(12), 123104 (8 December 2014) doi:10.1117/1.OE.53.12.123104
TOPICS: Advanced distributed simulations, Video, Image filtering, Motion estimation, Digital filtering, Optical filters, Pulmonary function tests, Field programmable gate arrays, Cameras, Optical engineering
Opt. Eng. 53(12), 123105 (9 December 2014) doi:10.1117/1.OE.53.12.123105
TOPICS: Prisms, Visualization, 3D displays, Brain-machine interfaces, Brain, Human-machine interfaces, Eye, LCDs, 3D image processing, 3D vision
Opt. Eng. 53(12), 123106 (9 December 2014) doi:10.1117/1.OE.53.12.123106
TOPICS: Camera shutters, Calibration, Cameras, Black bodies, Staring arrays, Temperature metrology, Imaging systems, Infrared radiation, Infrared imaging, Solids
Opt. Eng. 53(12), 123107 (9 December 2014) doi:10.1117/1.OE.53.12.123107
TOPICS: Calibration, Sensors, Error analysis, Light sources, Imaging systems, Cameras, Spectral calibration, Quantum efficiency, Transmittance, Optical engineering
Esmat Rafiee, Farzin Emami, Najmeh Nozhat
Opt. Eng. 53(12), 123108 (9 December 2014) doi:10.1117/1.OE.53.12.123108
TOPICS: Solitons, Waveguides, Resonators, Microrings, Wave propagation, Dispersion, Telecommunications, Optical engineering, Radio propagation, Nonlinear optics
Ali A. Al-Temeemy, Joseph Spencer
Opt. Eng. 53(12), 123109 (16 December 2014) doi:10.1117/1.OE.53.12.123109
TOPICS: LIDAR, Colorimetry, Image processing, 3D image processing, 3D modeling, Signal processing, Data modeling, 3D acquisition, Target recognition, Clouds
Instrumentation, Techniques, and Measurement
Yiyan Fan, Bin Zhao
Opt. Eng. 53(12), 124101 (2 December 2014) doi:10.1117/1.OE.53.12.124101
TOPICS: Sensors, Calibration, Nondiffracting beams, Distance measurement, Retroreflectors, Charge-coupled devices, Axicons, Optical engineering, Ranging, Semiconductor lasers
Feifei Zhang, Xiankang Dou, Dongsong Sun, Zhifeng Shu, Haiyun Xia, Yuanyuan Gao, Dongdong Hu, Mingjia Shangguan
Opt. Eng. 53(12), 124102 (2 December 2014) doi:10.1117/1.OE.53.12.124102
TOPICS: Error analysis, Receivers, Calibration, LIDAR, Doppler effect, Optical filters, Fiber lasers, Reflectivity, Fiber optics, Interferometers
Wei Huang, Chengfu Ma, Yuhang Chen
Opt. Eng. 53(12), 124103 (18 December 2014) doi:10.1117/1.OE.53.12.124103
TOPICS: Digital image correlation, Image resolution, Capacitance, Scanners, Chromium, Sensors, Image analysis, Atomic force microscopy, Optical engineering, Optical microscopes
Opt. Eng. 53(12), 124104 (22 December 2014) doi:10.1117/1.OE.53.12.124104
TOPICS: Phase shift keying, Modulation, Phase retrieval, Speckle interferometry, Speckle, Speckle pattern, Fourier transforms, Interferometry, Interferometers, Optical engineering
Guanxiu Liu, Dejun Feng, Maosen Zhang, Dongfang Jia
Opt. Eng. 53(12), 124105 (23 December 2014) doi:10.1117/1.OE.53.12.124105
TOPICS: Fiber Bragg gratings, Reflectivity, Sensors, Optical engineering, Optical simulations, Temperature metrology, Reflection, Picosecond phenomena, Information science, Optoelectronics
Opt. Eng. 53(12), 124106 (23 December 2014) doi:10.1117/1.OE.53.12.124106
TOPICS: Sensors, Nonuniformity corrections, Thermography, Calibration, Black bodies, Infrared detectors, Detection and tracking algorithms, Long wavelength infrared, Camera shutters, Infrared imaging
Biswajit Medhi, Gopalkrishna Hegde, Kalidevapura Polareddy Jagannath Reddy, Debasish Roy, Ram Mohan Vasu
Opt. Eng. 53(12), 124107 (23 December 2014) doi:10.1117/1.OE.53.12.124107
TOPICS: Wavefronts, Data modeling, Refractive index, Stochastic processes, Wavefront distortions, Tomography, Visualization, Optical engineering, Cameras, Signal processing
Yan Gao, Yanguang Yu, Jiangtao Xi, Qinghua Guo, Jun Tong, Sheng Tong
Opt. Eng. 53(12), 124108 (24 December 2014) doi:10.1117/1.OE.53.12.124108
TOPICS: Interference (communication), Interferometry, Signal detection, Signal processing, Stereolithography, Distortion, Semiconductor lasers, Modulation, Optical engineering, Detection and tracking algorithms
Tomoyuki Uehara, Kenichiro Tsuji, Kohei Hagiwara, Noriaki Onodera
Opt. Eng. 53(12), 124109 (29 December 2014) doi:10.1117/1.OE.53.12.124109
TOPICS: Laser stabilization, Radio optics, Interferometers, Oscilloscopes, Signal generators, Microwave radiation, Spectrum analysis, Semiconductor lasers, Servomechanisms, Optical engineering
Optical Design and Engineering
Opt. Eng. 53(12), 125101 (2 December 2014) doi:10.1117/1.OE.53.12.125101
TOPICS: Short wave infrared radiation, Zoom lenses, Polymers, Infrared imaging, Shortwaves, Fiber optic illuminators, Infrared radiation, Imaging systems, Adaptive optics, Sensors
Opt. Eng. 53(12), 125102 (17 December 2014) doi:10.1117/1.OE.53.12.125102
TOPICS: Manufacturing, Polymers, Microfluidics, Multiphoton lithography, Objectives, Spatial resolution, Additive manufacturing, Optical filters, Optical engineering, Photopolymers
Lasers, Fiber Optics, and Communications
Danyu Li, Jing He, Jin Tang, Ming Chen, Lin Chen
Opt. Eng. 53(12), 126101 (3 December 2014) doi:10.1117/1.OE.53.12.126101
TOPICS: Polarization, Telecommunications, Optical communications, Modulation, Digital signal processing, Particle filters, Receivers, Quadrature amplitude modulation, Multiplexing, Optical engineering
Opt. Eng. 53(12), 126102 (3 December 2014) doi:10.1117/1.OE.53.12.126102
TOPICS: Chaos, Modulation, Optical simulations, Analog electronics, Acousto-optics, Tolerancing, Receivers, Signal processing, Digital modulation, Data communications
Wei Cai, Yaqi Li, Hongtong Zhu, Shouzhen Jiang, Shicai Xu, Jie Liu, Lihe Zheng, Liang-Bi Su, Jun Xu
Opt. Eng. 53(12), 126103 (3 December 2014) doi:10.1117/1.OE.53.12.126103
TOPICS: Graphene, Mirrors, Mode locking, Chemical vapor deposition, Pulsed laser operation, Semiconductor lasers, Crystals, Laser crystals, Ytterbium, Fiber lasers
Fotios Sidiroglou, Ann Roberts, Greg Baxter
Opt. Eng. 53(12), 126104 (5 December 2014) doi:10.1117/1.OE.53.12.126104
TOPICS: Near field scanning optical microscopy, Ions, Erbium, Optical fibers, Luminescence, Silica, Optical filters, Near field optics, Optical amplifiers, Spatial resolution
Ger Folkersma, Gert-Willem Römer, Dannis Brouwer, Bert Huis in 't Veld
Opt. Eng. 53(12), 126105 (10 December 2014) doi:10.1117/1.OE.53.12.126105
TOPICS: Actuators, 3D modeling, Finite element methods, Temperature metrology, Pulsed laser operation, Thermal modeling, Electroluminescence, Optical alignment, Sensors
Ying Chen, Zhiyao Zhang, Xiaojun Zhou, Xiangning Chen, Yong Liu
Opt. Eng. 53(12), 126106 (10 December 2014) doi:10.1117/1.OE.53.12.126106
TOPICS: Single mode fibers, Dispersion, Quantization, Scanning probe microscopy, Solitons, Spectral resolution, Structured optical fibers, Wavelength tuning, Optical engineering, Modulation
Opt. Eng. 53(12), 126107 (11 December 2014) doi:10.1117/1.OE.53.12.126107
TOPICS: Turbulence, Radio propagation, Atmospheric propagation, Beam propagation method, Gaussian beams, 3D displays, Atmospheric turbulence, Wave propagation, Atmospheric propagation engineering, Optical engineering