26 February 2016 Dynamic specular surface measurement based on color-encoded fringe reflection technique
Yuxiang Wu, Huimin Yue, Jingya Yi, Mingyang Li, Yong Liu
Author Affiliations +
Abstract
A color-encoded fringe reflection technique is presented for dynamic specular surface measurement. Only one color-encoded fringe pattern is required in this method. In comparison with the reported dynamic specular surface measuring method (the composite fringe pattern method), the proposed color-encoded fringe technique has higher phase accuracy. The color intensity crosstalk problem between the three channels is discussed. As a result, this problem will seldom affect the phase accuracy of the proposed method. This turns out to be the main reason why the presented method can achieve a higher measuring accuracy than the existing dynamic measurement method. In addition, the proposed color-encoded fringe technique is proven to be more suitable than the existing method for the complex tested surface. The vibrating measuring experiment of a wafer proves the ability of the proposed method to achieve dynamic measurement.
© 2016 Society of Photo-Optical Instrumentation Engineers (SPIE) 0091-3286/2016/$25.00 © 2016 SPIE
Yuxiang Wu, Huimin Yue, Jingya Yi, Mingyang Li, and Yong Liu "Dynamic specular surface measurement based on color-encoded fringe reflection technique," Optical Engineering 55(2), 024104 (26 February 2016). https://doi.org/10.1117/1.OE.55.2.024104
Published: 26 February 2016
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CITATIONS
Cited by 14 scholarly publications and 1 patent.
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KEYWORDS
Fringe analysis

Reflection

Mirrors

Composites

Reflectometry

Semiconducting wafers

CCD cameras

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