Interferometer with bismuth silicon oxide crystal for vibration measurement

Bin Zhang; Qibo Feng; Yufeng Liang

doi:10.1117/1.OE.55.9.091406

28 March 2016 Interferometer with bismuth silicon oxide crystal for vibration measurement

Bin Zhang, Qibo Feng, Yufeng Liang

Author Affiliations +

Optical Engineering, Vol. 55, Issue 9, 091406 (March 2016). https://doi.org/10.1117/1.OE.55.9.091406

Abstract

We present a small-amplitude, high-frequency vibration measurement system. This system is based on the reflective holographic grating in a crystal of bismuth silicon oxide without applying an external electric field. A quarter-wave plate is applied in the reference beam path, with a polarizer after the crystal, to fulfill the quadrature condition when no electric field is applied to the crystal. A reflection configuration is used to obtain a good overlapping of the interference beams, which increases the beam coupling. The factors that affect the diffraction efficiency, including the signal-to-reference-beam intensity ratio and the recording angle, has been investigated. The experimental results coincide with the theoretical results, and the optimal conditions are obtained. The results of comparisons of our system with the vibrometer TEMPO show that the nanometer vibrations of a piezoelectric transducer can be reliably detected.

Citation Download Citation

Bin Zhang, Qibo Feng, and Yufeng Liang "Interferometer with bismuth silicon oxide crystal for vibration measurement," Optical Engineering 55(9), 091406 (28 March 2016). https://doi.org/10.1117/1.OE.55.9.091406

Published: 28 March 2016

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