Editorial
Opt. Eng. 55(12), 120101 (22 December 2016) doi:10.1117/1.OE.55.12.120101
TOPICS: Optical engineering, Lead, Video, Positive feedback
OE Letters
Junsu Kim, Siwoong Park, Yong-Kyu Choi, Chang-Soo Park
Opt. Eng. 55(12), 120501 (6 December 2016) doi:10.1117/1.OE.55.12.120501
TOPICS: Semiconductor lasers, Scattering, Laser scattering, Single mode fibers, Optical amplifiers, Refractive index, Optical fibers, Temperature metrology, High power lasers, Absorption
Special Section on Speckle-Based Metrology
Opt. Eng. 55(12), 121701 (7 December 2016) doi:10.1117/1.OE.55.12.121701
TOPICS: Speckle, Metrology, Optical metrology, Image processing, Physics, Speckle metrology, Laser metrology, Interferometry, Nondestructive evaluation, Electrical engineering
Opt. Eng. 55(12), 121702 (11 May 2016) doi:10.1117/1.OE.55.12.121702
TOPICS: Speckle, Speckle pattern, Biological research, Optical engineering, Laser applications, Error analysis, Electronic filtering, Dielectrophoresis, Cameras, Iris
Changmei Gong, Xiaopeng Shao, Tengfei Wu, Jietao Liu, Jianqi Zhang
Opt. Eng. 55(12), 121703 (11 May 2016) doi:10.1117/1.OE.55.12.121703
TOPICS: Signal to noise ratio, Image restoration, Sensors, Reconstruction algorithms, Detection and tracking algorithms, Speckle, Scattering, Image quality, Light scattering, Optical engineering
Fabian Languy, Jean-François Vandenrijt, Cédric Thizy, Jonathan Rochet, Christophe Loffet, Daniel Simon, Marc Georges
Opt. Eng. 55(12), 121704 (1 June 2016) doi:10.1117/1.OE.55.12.121704
TOPICS: Shearography, Long wavelength infrared, Visualization, Interferometry, Speckle, Speckle pattern, Gas lasers, Electrodynamics, Cameras, Vibrometry
José Manuel López-Alonso, Eduardo Grumel, Nelly Lucía Cap, Marcelo Trivi, Héctor Rabal, Javier Alda
Opt. Eng. 55(12), 121705 (7 June 2016) doi:10.1117/1.OE.55.12.121705
TOPICS: Principal component analysis, Speckle, Speckle pattern, Optical engineering, Biological research, Statistical analysis, Image filtering, Signal to noise ratio, Lanthanum, Speckle analysis
Pierre Slangen, Pierre Lauret, Frederic Heymes, Laurent Aprin, Nicolas Lecysyn
Opt. Eng. 55(12), 121706 (20 June 2016) doi:10.1117/1.OE.55.12.121706
TOPICS: High speed imaging, Cameras, Sensors, Liquids, Light emitting diodes, Particles, High speed cameras, Near field optics, Clouds, Speckle
Opt. Eng. 55(12), 121707 (22 June 2016) doi:10.1117/1.OE.55.12.121707
TOPICS: Fringe analysis, Shearography, Speckle, Interferometry, Optical engineering, Demodulation, Phase shift keying, Phase measurement, Phase retrieval, Digital holography
Abdulatef Ghlaifan, Yassine Tounsi, Sara Zada, Desire Muhire, Abdelkrim Nassim
Opt. Eng. 55(12), 121708 (28 June 2016) doi:10.1117/1.OE.55.12.121708
TOPICS: Speckle, Discrete wavelet transforms, Wavelets, Fringe analysis, Modulation, Phase shift keying, Denoising, Linear filtering, Speckle pattern, Computer simulations
Opt. Eng. 55(12), 121709 (30 June 2016) doi:10.1117/1.OE.55.12.121709
TOPICS: Digital holography, Holograms, Holographic interferometry, Fourier transforms, Cameras, Phase measurement, Optical engineering, Holography, 3D image reconstruction, Statistical analysis
Opt. Eng. 55(12), 121710 (6 July 2016) doi:10.1117/1.OE.55.12.121710
TOPICS: Speckle, Wavefront sensors, Sensors, Diffusers, Wavefronts, Speckle pattern, Error analysis, Correlation function, Optical engineering, Adaptive optics
Luis Felipe-Sesé, Elías López-Alba, Philip Siegmann, Francisco Díaz
Opt. Eng. 55(12), 121711 (6 July 2016) doi:10.1117/1.OE.55.12.121711
TOPICS: Digital image correlation, Cameras, 3D image processing, Image processing, RGB color model, Speckle, CCD cameras, Calibration, Optical engineering, Projection systems
Opt. Eng. 55(12), 121712 (12 July 2016) doi:10.1117/1.OE.55.12.121712
TOPICS: Speckle, Binary data, Diffusers, Spiral phase plates, Spatial light modulators, Speckle pattern, Optical vortices, Metrology, Picosecond phenomena, Interferometry
Andreas Stark, Eugene Wong, Daniel Weigel, Holger Babovsky, Thomas Schott, Richard Kowarschik
Opt. Eng. 55(12), 121713 (14 July 2016) doi:10.1117/1.OE.55.12.121713
TOPICS: Cameras, Photogrammetry, Speckle, Speckle pattern, Diffusers, 3D image processing, Optical engineering, 3D metrology, Objectives, Image processing
Opt. Eng. 55(12), 121714 (14 July 2016) doi:10.1117/1.OE.55.12.121714
TOPICS: Speckle, Digital holography, Holograms, Speckle pattern, Superposition, 3D image reconstruction, Holography, Denoising, Digital filtering, Digital recording
Opt. Eng. 55(12), 121715 (14 July 2016) doi:10.1117/1.OE.55.12.121715
TOPICS: Speckle pattern, Optical fibers, Multimode fibers, Image filtering, Image processing, Solar cells, Glasses, Optical engineering, Fiber lasers, Optical communications
Nicolas Budini, Nicolas Balducci, Cecilia Mulone, Andrea Monaldi
Opt. Eng. 55(12), 121716 (15 July 2016) doi:10.1117/1.OE.55.12.121716
TOPICS: Speckle, Holograms, Digital holography, Image processing, Holography, Holographic interferometry, Speckle pattern, Signal to noise ratio, Image filtering, Solids
Julien Poittevin, François Gautier, Charles Pézerat, Pascal Picart
Opt. Eng. 55(12), 121717 (19 July 2016) doi:10.1117/1.OE.55.12.121717
TOPICS: Acoustics, Holography, Digital holography, Spatial resolution, Sensors, Metrology, Wave propagation, Holograms, Speckle, Wavefronts
Opt. Eng. 55(12), 121718 (25 July 2016) doi:10.1117/1.OE.55.12.121718
TOPICS: Cadmium, National Ignition Facility, Interferometry, Metals, Speckle, Computed tomography, Optical engineering, Statistical analysis, CCD cameras, Speckle pattern
Opt. Eng. 55(12), 121719 (3 August 2016) doi:10.1117/1.OE.55.12.121719
TOPICS: Digital holography, Holograms, Holographic interferometers, Matrices, Holographic interferometry, Optical engineering, Opto mechatronics, Fourier transforms, LabVIEW, CCD image sensors
Opt. Eng. 55(12), 121720 (4 August 2016) doi:10.1117/1.OE.55.12.121720
TOPICS: Speckle, Wavefronts, Fringe analysis, Wave propagation, Spiral phase plates, Holograms, Error analysis, Digital holography, Reconstruction algorithms, Optical engineering
Chen Xiong, Wenxin Hu, Ming Zhang, Hong Miao
Opt. Eng. 55(12), 121721 (5 August 2016) doi:10.1117/1.OE.55.12.121721
TOPICS: Ferroelectric materials, Speckle pattern, Interferometry, Detection and tracking algorithms, Algorithm development, Speckle, Calibration, Michelson interferometers, Control systems, CCD cameras
Opt. Eng. 55(12), 121722 (8 August 2016) doi:10.1117/1.OE.55.12.121722
TOPICS: Digital holography, Digital image correlation, Sensors, Spiral phase plates, Wavefronts, Holograms, 3D metrology, Optical engineering, 3D image processing, Digital imaging
Opt. Eng. 55(12), 121723 (12 August 2016) doi:10.1117/1.OE.55.12.121723
TOPICS: Sensors, Long wavelength infrared, Digital holography, Holographic interferometry, Cryogenics, Holograms, Infrared radiation, Staring arrays, Diffusers, Temperature metrology
Opt. Eng. 55(12), 121724 (22 August 2016) doi:10.1117/1.OE.55.12.121724
TOPICS: Speckle, Image filtering, Digital filtering, 3D image reconstruction, Optical filters, Denoising, Holograms, Compressed sensing, Reconstruction algorithms, Holography
Yun Liu, Zhao Wang, Junhui Huang, Jianmin Gao, Jiansu Li, Yang Zhang, Xumeng Li
Opt. Eng. 55(12), 121725 (22 August 2016) doi:10.1117/1.OE.55.12.121725
TOPICS: Holograms, 3D image reconstruction, Digital holography, Denoising, Holography, Microscopy, Spatial resolution, Image processing, Molybdenum, Charge-coupled devices
Opt. Eng. 55(12), 121726 (25 August 2016) doi:10.1117/1.OE.55.12.121726
TOPICS: Digital holography, Holography, Bragg cells, Holograms, Vibrometry, Bessel functions, Phase shifts, Fringe analysis, Phase modulation, Modulation
Opt. Eng. 55(12), 121727 (16 September 2016) doi:10.1117/1.OE.55.12.121727
TOPICS: Scattering, Speckle, Speckle metrology, Optical engineering, Light scattering, Profilometers, Calibration, Metals, Optical resolution, Speckle pattern
Jorge Mauricio Flores-Moreno, Manuel De la Torre-Ibarra, María del Socorro Hernández-Montes, Carlos Perez Lopez, Fernando Mendoza-Santoyo
Opt. Eng. 55(12), 121728 (20 October 2016) doi:10.1117/1.OE.55.12.121728
TOPICS: Cameras, Sensors, CMOS sensors, Signal to noise ratio, Holograms, Holographic interferometry, Digital holography, Nondestructive evaluation, Image sensors, Interferometry
Opt. Eng. 55(12), 121729 (27 October 2016) doi:10.1117/1.OE.55.12.121729
TOPICS: Speckle, Modulation transfer functions, Staring arrays, Sensors, Spatial frequencies, Error analysis, Mid-IR, Infrared radiation, Active sensors, Image analysis
Carlos Guerrero-Mendez, Tonatiuh Saucedo Anaya, M. Araiza-Esquivel, Raúl Balderas-Navarro, Said Aranda-Espinoza, Alfonso López-Martínez, Carlos Olvera-Olvera
Opt. Eng. 55(12), 121730 (27 October 2016) doi:10.1117/1.OE.55.12.121730
TOPICS: Liquids, Temperature metrology, Holograms, Refractive index, Digital holography, Holographic interferometry, Wavefronts, Beam splitters, Charge-coupled devices, Phase measurement
Opt. Eng. 55(12), 121731 (14 November 2016) doi:10.1117/1.OE.55.12.121731
TOPICS: Digital holography, Crystals, Holograms, Holography, Adaptive optics, Wavefront distortions, Digital imaging, Microscopes, Electrodes, Refractive index
Imaging Components, Systems, and Processing
Zhenxian Huang, Zhiqiang Hao, Linwei Zhu
Opt. Eng. 55(12), 123101 (5 December 2016) doi:10.1117/1.OE.55.12.123101
TOPICS: Objectives, Zone plates, Diffractive optical elements, Modulation, Diffraction, Optimization (mathematics), Fourier transforms, Superposition, 3D image processing, Optical engineering
Opt. Eng. 55(12), 123102 (7 December 2016) doi:10.1117/1.OE.55.12.123102
TOPICS: Axicons, Point spread functions, Modulation transfer functions, Sensors, Wavefronts, Laser sources, Image restoration, Image sensors, Spatial frequencies, Imaging systems
Opt. Eng. 55(12), 123103 (8 December 2016) doi:10.1117/1.OE.55.12.123103
TOPICS: Scattering, Polarimetry, Bidirectional reflectance transmission function, Light scattering, Refractive index, Reflectivity, Copper, Gold, Polarization, Reflection
Shuo Liu, Yan Piao, Muhammad Tahir
Opt. Eng. 55(12), 123104 (8 December 2016) doi:10.1117/1.OE.55.12.123104
TOPICS: Image fusion, Infrared imaging, Infrared radiation, Visible radiation, Image quality, Image enhancement, Optical engineering, Neurons, Detection and tracking algorithms, Neural networks
Changmei Gong, Tengfei Wu, Jietao Liu, Huijuan Li, Xiaopeng Shao, Jianqi Zhang
Opt. Eng. 55(12), 123105 (10 December 2016) doi:10.1117/1.OE.55.12.123105
TOPICS: Signal to noise ratio, Modulation, Spatial light modulators, Wavefronts, Sensors, Phase shift keying, Feedback signals, Light scattering, Optimization (mathematics), Computer simulations
Huihui Xu, Mingyan Jiang, Fei Li
Opt. Eng. 55(12), 123106 (15 December 2016) doi:10.1117/1.OE.55.12.123106
TOPICS: Digital signal processing, Image restoration, 3D displays, Image segmentation, 3D image processing, Image fusion, Image processing, Lithium, Visualization, Image classification
Rui Gong, Qing Wang, Xiaopeng Shao, Conghao Zhou
Opt. Eng. 55(12), 123107 (20 December 2016) doi:10.1117/1.OE.55.12.123107
TOPICS: Light sources and illumination, Visualization, Image segmentation, Binary data, Image processing algorithms and systems, Algorithm development, Optical engineering, Image quality, Mathematical modeling, Performance modeling
Mohammad Pourmand, Arash Karimkhani, Mohammad Kazem Moravvej-Farshi
Opt. Eng. 55(12), 123108 (20 December 2016) doi:10.1117/1.OE.55.12.123108
TOPICS: Slow light, Dispersion, Waveguides, Photonic crystals, Optical engineering, Light wave propagation, Finite-difference time-domain method, Structural design, Integrated optics, Fabrication
Opt. Eng. 55(12), 123109 (21 December 2016) doi:10.1117/1.OE.55.12.123109
TOPICS: 3D image processing, Light emitting diodes, Mirrors, Reflection, Light sources, Image sensors, Image analysis, Cameras, 3D acquisition, Reflectors
Opt. Eng. 55(12), 123110 (22 December 2016) doi:10.1117/1.OE.55.12.123110
TOPICS: Associative arrays, High dynamic range imaging, Cameras, Reconstruction algorithms, Range imaging, Image compression, Sensors, Chemical species, Coded apertures, Optical engineering
Yujia Zuo, Jinghong Liu, Mingyu Yang, Xuan Wang, Mingchao Sun
Opt. Eng. 55(12), 123111 (22 December 2016) doi:10.1117/1.OE.55.12.123111
TOPICS: Detection and tracking algorithms, Visible radiation, Infrared imaging, Infrared radiation, Unmanned aerial vehicles, Infrared cameras, Image fusion, Cameras, Optical engineering, RGB color model
Seok-Hee Jeon, Sang-Keun Gil
Opt. Eng. 55(12), 123112 (23 December 2016) doi:10.1117/1.OE.55.12.123112
TOPICS: Digital holography, Image encryption, Binary data, Holograms, Phase shifts, 3D image reconstruction, Holography, Fourier transforms, Computer security, Polarization
Yanlu Lv, Jiulou Zhang, Dong Zhang, Lin Zhang, Jianwen Luo
Opt. Eng. 55(12), 123113 (23 December 2016) doi:10.1117/1.OE.55.12.123113
TOPICS: Luminescence, Spectroscopy, Holography, Imaging systems, Fluorescence tomography, Tomography, Molecular spectroscopy, Fluorescence spectroscopy, Multispectral imaging, Tissues
Yongjun Li, Yunsong Li, Juan Song, Weijia Liu, Jiaojiao Li
Opt. Eng. 55(12), 123114 (28 December 2016) doi:10.1117/1.OE.55.12.123114
TOPICS: Hyperspectral imaging, Image compression, Computer programming, Lithium, Error analysis, Optical engineering, Data compression, Algorithm development, Reconstruction algorithms, Software development
Instrumentation, Techniques, and Measurement
Opt. Eng. 55(12), 124101 (14 December 2016) doi:10.1117/1.OE.55.12.124101
TOPICS: Speckle interferometry, Speckle, Speckle pattern, Digital holography, Interference (communication), Error analysis, Ferroelectric materials, Optical engineering, Image sensors, Signal processing
Jinlong Chen, Jihua Liu, Cuiru Sun
Opt. Eng. 55(12), 124102 (15 December 2016) doi:10.1117/1.OE.55.12.124102
TOPICS: Digital image correlation, Sun, Aluminum, Optical engineering, Nondestructive evaluation, Data processing, Optical testing, CCD cameras, Image processing, Mechanics
Donghui Zheng, Lei Chen, Qinyuan Sun, Wenhua Zhu, Jinpeng Li, Jianxin Li
Opt. Eng. 55(12), 124103 (16 December 2016) doi:10.1117/1.OE.55.12.124103
TOPICS: Optical testing, Reflectivity, Phase interferometry, Wavefronts, Interferometers, Refractive index, Photovoltaics, Lithium, Optical engineering, Error analysis
Jian Zhao
Opt. Eng. 55(12), 124104 (16 December 2016) doi:10.1117/1.OE.55.12.124104
TOPICS: Digital image correlation, Image processing, Optical engineering, Speckle pattern, Speckle, Digital image processing, Scanning electron microscopy, Digital imaging, Experimental mechanics, Image registration
Opt. Eng. 55(12), 124105 (20 December 2016) doi:10.1117/1.OE.55.12.124105
TOPICS: Ultraviolet radiation, Polymers, Xenon, Reflectivity, Lamps, Absorbance, Sensors, Visible radiation, Optical engineering, Patents
Opt. Eng. 55(12), 124106 (22 December 2016) doi:10.1117/1.OE.55.12.124106
TOPICS: Bidirectional reflectance transmission function, Ultraviolet radiation, Spectroscopy, Light sources, Reflection, Sensors, Imaging systems, Light scattering, Calibration, Scattering
Opt. Eng. 55(12), 124107 (23 December 2016) doi:10.1117/1.OE.55.12.124107
TOPICS: Monochromatic aberrations, Mirrors, Actinium, Astatine, Optical engineering, Aspheric lenses, Distance measurement, MATLAB, Tolerancing, Zernike polynomials
Optical Design and Engineering
Jian Zhang, Yalin Ding, Linghua Zhang, Haiying Tian, Guoqin Yuan
Opt. Eng. 55(12), 125101 (8 December 2016) doi:10.1117/1.OE.55.12.125101
TOPICS: Optical engineering, Charge-coupled devices, Cameras, Panoramic photography, Mirrors, Head, CCD cameras, Optical alignment, Modulation transfer functions, Image quality
Opt. Eng. 55(12), 125102 (16 December 2016) doi:10.1117/1.OE.55.12.125102
TOPICS: Destructive interference, Spiral phase plates, Spatial light modulators, Beam shaping, Phase contrast, Phase shift keying, Binary data, Photonics, Optical tweezers, Microscopy
Yuan Yao, Anbing Geng, Jian Bai, Haitao Wang, Jie Guo, Tao Xiong, Yujie Luo, Zhi Huang, Xiyun Hou
Opt. Eng. 55(12), 125103 (20 December 2016) doi:10.1117/1.OE.55.12.125103
TOPICS: Panoramic photography, Infrared radiation, Infrared imaging, Imaging systems, Modulation transfer functions, Long wavelength infrared, Thermography, Sensors, Infrared sensors, Distortion
Opt. Eng. 55(12), 125104 (20 December 2016) doi:10.1117/1.OE.55.12.125104
TOPICS: Waveguides, Beam propagation method, Binary data, MATLAB, Optical engineering, Mach-Zehnder interferometer, Optical switching, Computing systems, Signal processing, Wave propagation
Opt. Eng. 55(12), 125105 (21 December 2016) doi:10.1117/1.OE.55.12.125105
TOPICS: Switches, Beam propagation method, Electro optics, Optical engineering, Mach-Zehnder interferometer, Logic, Logic devices, MATLAB, Clocks, Optical design
Tzong-Daw Wu, Jiun-Shen Chen, Ching-Pei Tseng, Cheng-Chang Hsieh
Opt. Eng. 55(12), 125106 (22 December 2016) doi:10.1117/1.OE.55.12.125106
TOPICS: Transmittance, Thin films, Silver, Refractive index, Sputter deposition, Artificial neural networks, Error analysis, Positron emission tomography, Statistical analysis, Optical engineering
Opt. Eng. 55(12), 125107 (28 December 2016) doi:10.1117/1.OE.55.12.125107
TOPICS: Monochromatic aberrations, Optical design, Wavefront aberrations, Extreme ultraviolet lithography, Wavefronts, Zernike polynomials, Reflectivity, Cameras, Optical engineering, Aberration theory