25 March 2017 Uniaxial three-dimensional shape measurement with multioperation modes for different modulation algorithms
Hailong Jing, Xianyu Su, Zhisheng You
Author Affiliations +
Abstract
A uniaxial three-dimensional shape measurement system with multioperation modes for different modulation algorithms is proposed. To provide a general measurement platform that satisfies the specific measurement requirements in different application scenarios, a measuring system with multioperation modes based on modulation measuring profilometry (MMP) is presented. Unlike the previous solutions, vertical scanning by focusing control of an electronic focus (EF) lens is implemented. The projection of a grating pattern is based on a digital micromirror device, which means fast phase-shifting with high precision. A field programmable gate array-based master control center board acts as the coordinator of the MMP system; it harmonizes the workflows, such as grating projection, focusing control of the EF lens, and fringe pattern capture. Fourier transform, phase-shifting technique, and temporary Fourier transform are used for modulation analysis in different operation modes. The proposed system features focusing control, speed, programmability, compactness, and availability. This paper details the principle of MMP for multioperation modes and the design of the proposed system. The performances of different operation modes are analyzed and compared, and a work piece with steep holes is measured to verify this multimode MMP system.
© 2017 Society of Photo-Optical Instrumentation Engineers (SPIE) 0091-3286/2017/$25.00 © 2017 SPIE
Hailong Jing, Xianyu Su, and Zhisheng You "Uniaxial three-dimensional shape measurement with multioperation modes for different modulation algorithms," Optical Engineering 56(3), 034115 (25 March 2017). https://doi.org/10.1117/1.OE.56.3.034115
Received: 1 February 2017; Accepted: 14 March 2017; Published: 25 March 2017
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CITATIONS
Cited by 6 scholarly publications.
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KEYWORDS
Modulation

Fourier transforms

Projection systems

Cameras

Fringe analysis

Picosecond phenomena

Calibration

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