Analysis and reduction of phase errors caused by nonuniform surface reflectivity in a phase-shifting measurement system

Songlin Chen; Renbo Xia; Jibin Zhao; Hongyao Zhang; Maobang Hu

doi:10.1117/1.OE.56.3.033102

3 March 2017 Analysis and reduction of phase errors caused by nonuniform surface reflectivity in a phase-shifting measurement system

Songlin Chen, Renbo Xia, Jibin Zhao, Hongyao Zhang, Maobang Hu

Author Affiliations +

Optical Engineering, Vol. 56, Issue 3, 033102 (March 2017). https://doi.org/10.1117/1.OE.56.3.033102

Abstract

The measurement accuracy of a phase-shifting measurement system is adversely affected by phase errors. This paper presents a theoretical analysis of phase errors caused by nonuniform surface reflectivity, such as varying reflectivity and a sharp change in reflectivity. Based on the analysis, a method to adaptively adjust the maximum input gray level of each pixel in projected fringe patterns to the local reflectivity was proposed to reduce phase errors. Experimental results for a planar checkerboard show that the measurement error can be reduced by 56.6% by using the proposed method.

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Songlin Chen, Renbo Xia, Jibin Zhao, Hongyao Zhang, and Maobang Hu "Analysis and reduction of phase errors caused by nonuniform surface reflectivity in a phase-shifting measurement system," Optical Engineering 56(3), 033102 (3 March 2017). https://doi.org/10.1117/1.OE.56.3.033102

Received: 27 October 2016; Accepted: 9 February 2017; Published: 3 March 2017

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