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14 February 2019 Surface plasmon resonance sensor based on cross-linked chitosan immobilized onto the surface of optimization AgAu composite film for trace copper(II) ions detection
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Abstract
We propose an intensity-modulated surface plasmon resonance (SPR) sensor based on a four-layer Kretschmann structural model. To achieve high-sensitivity intensity detection for the measured sample, a silver/gold (Ag/Au) composite film structure is proposed and optimized by a numerical simulation method, and then the chitosan thin film modified by glutaraldehyde cross-linked as an active layer for adsorbing measured sample is applied and immobilized onto the surface of the Ag/Au composite film by spin-coating technique. In addition, a reference beam is introduced into the system to raise its resolution and stability. Measurements are taken while varying the trace copper(II) ion (Cu2  +  ) concentration from 0 to 5 ppm, and the SPR sensor is found to possess sensitivities of 0.9147 and 0.4466  ppm  −  1 at Cu2  +   concentrations of 0 to 3 and 3 to 5 ppm, respectively. The concentration resolution is 0.015 and 0.030 ppm for the trace Cu2  +   concentration of 0 to 3 and 3 to 5 ppm, respectively.
© 2019 Society of Photo-Optical Instrumentation Engineers (SPIE) 0091-3286/2019/$25.00 © 2019 SPIE
Wenhua Wang, Xinlei Zhou, Shengxu Wu, Sidong Li, Weina Wu, Zhengye Xiong, Wenqing Shi, Jiang Huang, and Qingxu Yu "Surface plasmon resonance sensor based on cross-linked chitosan immobilized onto the surface of optimization AgAu composite film for trace copper(II) ions detection," Optical Engineering 58(2), 027111 (14 February 2019). https://doi.org/10.1117/1.OE.58.2.027111
Received: 25 October 2018; Accepted: 31 January 2019; Published: 14 February 2019
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