6 June 2022 Photon Doppler velocimetry surface return study for common surface preparations
William P. Mullins, Nazila Soleimani, Natalie Prince, Zachary A. Fussell, Michael R. Armstrong
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Abstract

Photon Doppler velocimetry (PDV) is a ubiquitous diagnostic method in dynamic compression experiments. It typically requires the roughening of the test surface to ensure scattering of the probe light back into the PDV probe at non-normal angles of incidence. Although surface scattering plays an essential role in the quality of PDV data, surface scattering properties for common materials and preparations have not previously been studied with specific relevance to PDV. Here, we present detailed measurements of the bidirectional reflectance distribution function for four different surface preparations (Scotch-Brite hand and drill roughened, ball-rolled, and grit blasted) and four different materials (copper, aluminum, stainless steel, and tantalum). These measurements employ a conventional PDV probe and obtain a diffraction limited angular resolution with 10 pW accuracy and 2.6% repeatability. In addition to scattering data, we employ scattering theory and simulations to accurately emulate the measured data. We also present a straightforward method to derive the average scattering distribution from surface profilometry and observe several qualitative aspects of the scattering data that may help to optimize PDV signals.

© 2022 Society of Photo-Optical Instrumentation Engineers (SPIE) 0091-3286/2022/$28.00 © 2022 SPIE
William P. Mullins, Nazila Soleimani, Natalie Prince, Zachary A. Fussell, and Michael R. Armstrong "Photon Doppler velocimetry surface return study for common surface preparations," Optical Engineering 61(6), 065102 (6 June 2022). https://doi.org/10.1117/1.OE.61.6.065102
Received: 21 December 2021; Accepted: 18 May 2022; Published: 6 June 2022
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KEYWORDS
Scattering

Specular reflections

Velocimetry

Doppler effect

Light scattering

Speckle

Scatter measurement

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